IP Library Granted Patent US 10,141,084
Granted Patent B2
US 10,141,084 · App. 13/834,349 · Granted Nov 27, 2018

Electronic device

Inventors: Kyoung Soo Park (Uiwang-si, KR); Woo Suk Lee (Uiwang-si, KR); Woo Jun Lim (Uiwang-si, KR); Kyung Jin Lee (Uiwang-si, KR); Bong Yong Kim (Uiwang-si, KR); Jin Seong Park (Uiwang-si, KR); Dong Seon Uh (Uiwang-si, KR); Youn Jo Ko (Uiwang-si, KR); Jang Hyun Cho (Uiwang-si, KR); Sang Sik Bae (Uiwang-si, KR); Jin Kyu Kim (Uiwang-si, KR)
Assignee: Cheil Industries, Inc.
H01B3/082C09J7/10C09J133/068H01B7/00H01B13/00H01L24/26H01L24/27H01L24/29H01L24/83C08K3/08C09J2201/36C09J2201/602C09J2201/606C09J2203/326C09J2205/102H01L24/32H01L2224/13099H01L2224/2711H01L2224/27436H01L2224/294H01L2224/2919H01L2224/2929H01L2224/2939H01L2224/29083H01L2224/29316H01L2224/29339H01L2224/29344H01L2224/29347H01L2224/29355H01L2224/29499H01L2224/32225H01L2224/83191H01L2224/83851H01L2224/83862H01L2924/07802H01L2924/12044
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Quick Facts
Patent No.
US 10,141,084
App. No.
13/834,349
Granted
Nov 27, 2018
Kind
B2
Abstract

An anisotropic conductive film, the anisotropic conductive film including an insulating layer and a conductive layer laminated on the insulating layer, the conductive layer containing conductive particles, wherein after glass substrates are positioned to face each other on the upper and lower surface of the anisotropic conductive film and are pressed against the anisotropic conductive film at 3 MPa (based on the sample area) and 160° C. (based on the detection temperature of the anisotropic conductive film) for 5 sec, a ratio of the area of the insulating layer to that of the conductive layer is from about 1.3:1 to about 3.0:1.

Claims (17)

1. An electronic device, comprising:

an anisotropic conductive film, the anisotropic conductive film including an insulating layer and a conductive layer laminated on the insulating layer, the conductive layer containing insulating particles and conductive particles, wherein,

the lowest melt viscosity of the insulating layer is in the range of about 2,000 Pa·s to about 10,000 Pa·s and the lowest melt viscosity of the conductive layer is in the range of about 5,000 to about 50,000 Pa·s, provided that the lowest melt viscosity of the conductive layer is at least about 3,000 Pa·s greater than that of the insulating layer,

the insulating layer is from greater than 1 to about 4 times thicker than the conductive layer,

the insulating layer is formed from a first composition that comprises a first polymer resin, a first radically polymerizable material, and a first radical initiator, wherein the first polymer resin includes one or more of an olefinic resin, a butadiene resin, an acrylonitrile-butadiene copolymer, a carboxyl-terminated acrylonitrile-butadiene copolymer, a polyimide resin, a polyamide resin, a polyester resin, a polyvinyl butyral resin, an ethylene-vinyl acetate copolymer, a styrene-butylene-styrene (SBS) resin, a styrene-ethylene-butylene-styrene (SEBS) resin, an acrylonitrile-butadiene rubbers (NBRs), a urethane resin, a (meth)acrylic resin, or a phenoxy resin, and the first radically polymerizable material includes a first epoxy (meth)acrylate oligomer, the first epoxy (meth)acrylate oligomer being present in an amount of 20 to 40 wt %, based on a total weight of the first composition,

the conductive layer is formed from a second composition that comprises a second polymer resin, a second radically polymerizable material, and a second radical initiator, wherein the second polymer resin includes one or more of an olefinic resin, a butadiene resin, an acrylonitrile-butadiene copolymer, a carboxyl-terminated acrylonitrile-butadiene copolymer, a polyimide resin, a polyamide resin, a polyester resin, a polyvinyl butyral resin, an ethylene-vinyl acetate copolymer, a styrene-butylene-styrene (SBS) resin, a styrene-ethylene-butylene-styrene (SEBS) resin, an acrylonitrile-butadiene rubbers (NBRs), a urethane resin, a (meth)acrylic resin, or a phenoxy resin, and the second radically polymerizable material includes a second epoxy (meth)acrylate oligomer, the second epoxy (meth)acrylate oligomer being present in an amount of 20 to 30 wt %, based on a total weight of the second composition,

a size of the conductive particles is in the range of about 1 to about 30 μm, the conductive particles being present in an amount of about 1 to about 30% by weight, based on the total weight of the second composition,

a size of the insulating particles is in the range of about 0.1 to about 20 μm, the insulating particles being present in an amount of about 2 to about 20% by weight, based on the total weight of the second composition.

2. The electronic device as claimed in claim 1 , wherein the lowest melt viscosity of the conductive layer is about 3,000 to about 48,000 Pa·s greater than that of the insulating layer.

3. The electronic device as claimed in claim 1 , wherein the insulating layer includes insulating particles.

4. The electronic device as claimed in claim 3 , wherein the insulating particles are present in an amount of about 0.1 to about 20% by weight, based on the total weight of a composition for the insulating layer.

5. The electronic device as claimed in claim 4 , wherein the amount (% by weight) of the insulating particles in the conductive layer with respect to the total weight of the composition for the conductive layer is higher than that of the insulating particles in the insulating layer with respect to the total weight of the composition for the insulating layer.

6. The electronic device as claimed in claim 3 , wherein the insulating particles are present in an amount of about 0.1 to about 10% by weight, based on the total weight of a composition for the insulating layer.

7. The electronic device as claimed in claim 1 , wherein:

the first radically polymerizable material is present in the first composition in an amount of about 20 to about 60% by weight, based on the total weight of the first composition, and

the second radically polymerizable material is present in the second composition in an amount of about 20 to about 60% by weight, based on the total weight of the second composition.

8. The electronic device as claimed in claim 1 , wherein the first composition further includes a silane coupling agent, and the silane coupling agent is present in an amount of about 0.1 to about 5% by weight, based on the total weight of the first composition.

Assignments (5)
MERGER Recorded Mar 26, 2025
From: KUKDO ADVANCED MATERIALS CO., LTD.
To: KUKDO CHEMICAL CO., LTD.
Reel/Frame 070646/0572 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2022
From: KUKDO CHEMICAL CO., LTD.
To: KUKDO ADVANCED MATERIALS CO., LTD.
Reel/Frame 060940/0414 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 7, 2019
From: SAMSUNG SDI CO., LTD.
To: KUDKO CHEMICAL CO., LTD.
Reel/Frame 050640/0740 →
MERGER AND CHANGE OF NAME Recorded Oct 7, 2019
From: CHEIL INDUSTRIES INC.; SAMSUNG SDI CO., LTD.; SAMSUNG SDI CO., LTD.
To: SAMSUNG SDI CO., LTD.
Reel/Frame 050646/0718 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 15, 2013
From: PARK, KYOUNG SOO; LEE, WOO SUK; LIM, WOO JUN; LEE, KYUNG JIN; KIM, BONG YONG; PARK, JIN SEONG; UH, DONG SEON; KO, YOUN JO; CHO, JANG HYUN; BAE, SANG SIK; KIM, JIN KYU
To: CHEIL INDUSTRIES, INC.
Reel/Frame 030012/0332 →
Priority Claims (2)
KR 10-2010-0098506 · Oct 8, 2010 · national
KR 10-2010-0140773 · Dec 31, 2010 · national
Continuity (3)
Continuation In Part PCTKR2010009587 · Dec 30, 2010
Continuation In Part PCTKR2011004887 · Jul 4, 2011
Related Publication 20130213691A1 · Aug 22, 2013