IP Library Granted Patent US 8,829,964
Granted Patent B1
US 8,829,964 · App. 13/836,882 · Granted Sep 9, 2014

Compensated hysteresis circuit

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Quick Facts
Patent No.
US 8,829,964
App. No.
13/836,882
Granted
Sep 9, 2014
Kind
B1
Abstract

A compensated hysteresis circuit comprises a hysteresis circuit including an output node and a first control transistor. The first control transistor provides feedback to the hysteresis circuit. A temperature and voltage compensation circuit includes a self-biasing threshold control circuit including an input coupled to the output node of the hysteresis circuit, and a first trim transistor coupled between the first control transistor of the hysteresis circuit and the self-biasing threshold control circuit.

Claims (57)

1. A compensated hysteresis circuit comprising:

a hysteresis circuit including an output node and a first control transistor, the first control transistor provides feedback to the hysteresis circuit;

a temperature and voltage compensation circuit including:

a self-biasing threshold control circuit including an input coupled to the output node of the hysteresis circuit, and

a first trim transistor coupled between the first control transistor of the hysteresis circuit and the self-biasing threshold control circuit.

2. The compensated hysteresis circuit of claim 1 , wherein the temperature and voltage compensation circuit includes an inverter coupled between the output of the hysteresis circuit (Vo) and the input of the self-biasing threshold control circuit.

3. The compensated hysteresis circuit of claim 2 , wherein the self-biasing threshold control circuit includes a source follower circuit, the source follower circuit including

an N-channel transistor having a gate electrode, a drain electrode and a source electrode, and

a P-channel transistor having a gate electrode, a drain electrode and a source electrode, the source electrode of the N-channel transistor is coupled to the source electrode of the P-channel transistor and the gate electrodes of the N and P-channel transistors are coupled to an output of the inverter.

4. The compensated hysteresis circuit of claim 1 , wherein the self-biasing threshold control circuit includes

an N-channel transistor having a gate electrode, a drain electrode and a source electrode, and

a P-channel transistor having a gate electrode, a drain electrode and a source electrode, further wherein

the drain electrode of the N-channel transistor is coupled to the drain electrode of the P-channel transistor,

the gate electrodes of the N and P-channel transistors are coupled to the output node of the hysteresis circuit,

the source electrode of the P-channel transistor is coupled to one of a group consisting of a diode and the gate electrode of the P-channel transistor, and

the source electrode of the N-channel transistor is coupled to one of a group consisting of a diode and the gate electrode of the N-channel transistor.

5. The compensated hysteresis circuit of claim 1 , wherein the first control transistor is a P-channel transistor and the first trim transistor is an N-channel transistor having a drain electrode coupled to a drain electrode of the first control transistor.

6. The compensated hysteresis circuit of claim 5 , wherein a source electrode of the first trim transistor is coupled to ground and a source electrode of the first control transistor is coupled to an output of a low threshold section of the hysteresis circuit.

7. The compensated hysteresis circuit of claim 1 wherein:

the hysteresis circuit further includes a second control transistor coupled to provide feedback to the hysteresis circuit;

the temperature and voltage compensation circuit further includes:

a second trim transistor coupled between the second control transistor of the hysteresis circuit and the self-biasing threshold control circuit.

8. The compensated hysteresis circuit of claim 7 , wherein the second control transistor is an N-channel transistor and the second trim transistor is a P-channel transistor having a drain electrode coupled to a drain electrode of the second control transistor.

9. The compensated hysteresis circuit of claim 8 , wherein a source electrode of the second trim transistor is coupled to a supply voltage and a source electrode of the second control transistor is coupled to an output of a high threshold section of the hysteresis circuit.

10. A compensated hysteresis circuit comprising:

a hysteresis circuit including

a first threshold section,

an output node (Vo) coupled to an output of the first threshold section,

a first control transistor coupled to provide feedback to the first threshold section, and

a temperature and voltage compensation circuit including

a self-biasing threshold control circuit including an input coupled to the output node of the hysteresis circuit,

a first trim transistor coupled between the first control transistor of the hysteresis circuit and the self-biasing threshold control circuit.

11. The compensated hysteresis circuit of claim 10 further comprising:

a second threshold section of the hysteresis circuit,

a second control transistor coupled to provide feedback to the second threshold section;

a second trim transistor coupled between the second control transistor of the hysteresis circuit and the self-biasing threshold control circuit.

12. The compensated hysteresis circuit of claim 10 further comprising:

an inverter having an input coupled to the output node of the hysteresis circuit and an input coupled to gate electrodes of transistors at the input of the self-biasing threshold control circuit.

13. The compensated hysteresis circuit of claim 11 , wherein the self-biasing threshold control circuit includes a source follower circuit, the source follower circuit including

an N-channel transistor having a gate electrode, a drain electrode and a source electrode, and

a P-channel transistor having a gate electrode, a drain electrode and a source electrode, the source electrode of the N-channel transistor is coupled to the source electrode of the P-channel transistor and the gate electrodes of the N and P-channel transistors are coupled to the output node of the hysteresis circuit.

14. The compensated hysteresis circuit of claim 10 , wherein the self-biasing threshold control circuit includes

an N-channel transistor having a gate electrode, a drain electrode and a source electrode, and

a P-channel transistor having a gate electrode, a drain electrode and a source electrode, further wherein

the drain electrode of the N-channel transistor is coupled to the drain electrode of the P-channel transistor,

the gate electrodes of the N and P-channel transistors are coupled to the output node of the hysteresis circuit,

the source electrode of the P-channel transistor is coupled to one of a group consisting of a diode and the gate electrode of the P-channel transistor, and

the source electrode of the N-channel transistor is coupled to one of a group consisting of a diode and the gate electrode of the N-channel transistor.

15. The compensated hysteresis circuit of claim 10 , wherein the first control transistor is a P-channel transistor and the first trim transistor is an N-channel transistor having a drain electrode coupled to a drain electrode of the first control transistor.

16. The compensated hysteresis circuit of claim 15 , wherein a source electrode of the first trim transistor is coupled to ground and a source electrode of the first control transistor is coupled to an output of the first threshold section of the hysteresis circuit.

17. A method of compensating temperature and voltage variations in a hysteresis circuit comprising:

modulating a first threshold voltage of the hysteresis circuit by coupling a bias voltage to a control transistor in the hysteresis circuit, wherein the bias is generated using a self-biasing threshold control circuit that has an input coupled to the output of the hysteresis circuit and an output that is the bias voltage.

18. The method of claim 17 further comprising:

applying the bias voltage to a gate of a trim transistor that is coupled to bias the control transistor in the hysteresis circuit.

19. The method of claim 17 further comprising:

using variation in threshold voltage over temperature of transistors in the self-biasing threshold control circuit to modulate voltage output by a first threshold section of the hysteresis circuit.

20. The method of claim 17 wherein a combination of a trim transistor in the self-biasing threshold control circuit being coupled to the control transistor in the hysteresis circuit decreases an effective sizing ratio of the control transistor relative to transistors in the first threshold section thereby decreasing threshold voltage variation of the transistors in the first threshold section over supply voltage variation.

Assignments (30)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
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