IP Library Granted Patent US 8,860,212
Granted Patent B1
US 8,860,212 · App. 13/862,473 · Granted Oct 14, 2014

Fluid cooled semiconductor die package

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Quick Facts
Patent No.
US 8,860,212
App. No.
13/862,473
Granted
Oct 14, 2014
Kind
B1
Abstract

A fluid cooled semiconductor die package includes a package support substrate with a die mounting surface and an opposite package mounting surface. The package support substrate has external connector solder deposits on respective external connector pads of the package mounting surface, and a package fluid inlet duct and a package fluid outlet duct each providing fluid communication between the die mounting surface and package mounting surface. A semiconductor die is mounted on the die mounting surface. The die has external terminals electrically connected to the external connector pads. An inlet solder deposit is soldered to an inlet pad of the package mounting surface. The inlet pad surrounds an entrance of the fluid inlet duct. An outlet solder deposit is soldered to an outlet pad of the package mounting surface. The outlet pad surrounds an exit of the package fluid inlet duct.

Claims (31)

1. A fluid cooled semiconductor die package, comprising:

a package support substrate with a die mounting surface and an opposite package mounting surface, the package support substrate having external connector solder deposits on respective external connector pads of the package mounting surface, wherein the package support substrate has at least one package fluid inlet duct and at least one package fluid outlet duct each providing fluid communication between the die mounting surface and the package mounting surface;

a semiconductor die mounted on the die mounting surface of the package support substrate, the semiconductor die having external terminals selectively electrically connected to the external connector pads;

an inlet solder deposit soldered to an inlet pad of the package mounting surface, wherein the inlet pad surrounds an entrance of the package fluid inlet duct; and

an outlet solder deposit soldered to an outlet pad of the package mounting surface, wherein the outlet pad surrounds an exit of the package fluid inlet duct, wherein each of the external connector solder deposits is formed from a single solder ball, and the inlet solder deposit is formed from at least one solder ball that is the same size as the single solder ball.

2. The fluid cooled semiconductor die package of claim 1 , further comprising a lid mounted to the die mounting surface, wherein the lid has at least one heat transfer chamber therein that is hermetically coupled to the package fluid inlet duct and the package fluid outlet duct.

3. The fluid cooled semiconductor die package of claim 2 , wherein the heat transfer chamber is formed from a surface of the semiconductor die and a wall of the lid.

4. The fluid cooled semiconductor die package of claim 3 , wherein a wall of the heat transfer chamber abuts a surface of the semiconductor die.

5. The fluid cooled semiconductor die package of claim 2 , wherein the lid has at least one lid inlet passage in fluid communication, through the heat transfer chamber, with at least one lid outlet passage, the lid inlet passage having a passage entrance hermetically coupled to the package fluid inlet duct and the lid outlet passage having a passage exit hermetically coupled to the package fluid outlet duct.

6. The fluid cooled semiconductor die package of claim 1 , wherein the inlet pad is a metal-based annulus.

7. The fluid cooled semiconductor die package of claim 6 , further including an annular inlet pad in the die mounting surface.

8. The fluid cooled semiconductor die package of claim 7 , further including a metal based deposit on an inner surface of the package fluid inlet duct, the metal based deposit forming a tube coupling the inlet pad of the package mounting surface to the annular inlet pad.

9. The fluid cooled semiconductor die package of claim 6 , wherein the inlet solder deposit is a solder globule that covers the entrance to the package fluid inlet duct.

10. The fluid cooled semiconductor die package of claim 1 , wherein the external connector solder deposits form a ball grid array external connector arrangement.

11. A fluid cooled circuit board system, comprising:

a circuit board with mounting pads thereon, the circuit board having a board inlet duct and a board outlet duct;

a package support substrate with a die mounting surface and an opposite package mounting surface, the package support substrate having external connector solder deposits coupling between respective external connector pads of the package mounting surface and the mounting pads of the circuit board, wherein the package support substrate has at least one package fluid inlet duct and at least one package fluid outlet duct each providing fluid communication between the die mounting surface and package mounting surface;

a semiconductor die mounted on the die mounting surface of the package support substrate, the semiconductor die having external terminals selectively electrically connected to the external connector pads;

an inlet solder deposit coupling an inlet pad of the package mounting surface to an inlet pad of the circuit board, wherein the inlet pad of the package mounting surface surrounds an entrance of the package fluid inlet duct and the inlet pad of the circuit board surrounds an exit of the board inlet duct, and the inlet solder deposit has an inlet deposit aperture therein that provides a hermetic coupling between the board inlet duct and package fluid inlet duct; and

an outlet solder deposit coupling an outlet pad of the package mounting surface to an outlet pad of the circuit board, wherein the outlet pad of the package mounting surface surrounds an exit of the package fluid outlet duct and an outlet pad of the circuit board surrounds an entrance of the board outlet duct, and the outlet solder deposit has an outlet deposit aperture therein that provides a hermetic coupling between the board outlet duct and package fluid outlet duct,

wherein the circuit board is mounted on an additional substrate with an additional semiconductor die mounted thereon, the additional substrate being mounted on an additional circuit board that has an additional board inlet fluid duct and an additional board fluid outlet duct, the additional substrate having at least one intermediate inlet fluid duct with an associated solder deposit with an aperture therein that provides a hermetic coupling between the intermediate inlet fluid duct and the additional board inlet fluid duct.

12. The fluid cooled circuit board system of claim 11 , further comprising is a lid mounted to the die mounting surface, the lid having at least one heat transfer chamber therein that is hermetically coupled to the package fluid inlet duct and package fluid outlet duct.

13. The fluid cooled circuit board system of claim 12 , wherein the lid has at least one lid inlet passage in fluid communication, through the heat transfer chamber, with at least one lid outlet passage, the lid inlet passage having an passage entrance hermetically coupled to the package fluid inlet duct and the lid outlet passage having an passage exit hermetically coupled to the package fluid outlet duct.

14. The fluid cooled circuit board system of claim 11 , further comprising a coupling solder deposit with a coupling aperture therein that provides a hermetic coupling between the intermediate inlet fluid duct and the board inlet duct of the circuit board.

15. A method for assembling a fluid cooled semiconductor die package, the method including:

providing a package support substrate with a die mounting surface with external connector pads and an opposite package mounting surface, the package support substrate having at least one package fluid inlet duct and at least one package fluid outlet duct each providing fluid communication between the die mounting surface and package mounting surface;

mounting a semiconductor die on the die mounting surface, the semiconductor die having external terminals that are selectively electrically connected to the external connector pads; and

soldering external connector solder deposits to the external connector pads, an inlet solder deposit to an inlet pad that surrounds an entrance of the package fluid inlet duct, and an outlet solder deposit to an outlet pad that surrounds an exit of the package fluid inlet duct, wherein each of the external connector solder deposits is formed from a single solder ball, and the inlet solder deposit is formed from at least one solder ball that is the same size as the single solder ball.

16. The method of claim 15 , further including mounting a lid to the die mounting surface, the lid having at least one heat transfer chamber therein that is hermetically coupled to the package fluid inlet duct and the package fluid outlet duct.

17. The method of claim 15 , wherein the inlet solder deposit is a solder globule that covers the entrance to the package fluid inlet duct.

18. The method of claim 15 , wherein the external connector solder deposits form a ball grid array external connector arrangement.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0844 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0819 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0804 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031248/0627 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 031248/0750 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031248/0510 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2013
From: FOONG, CHEE SENG; PHAM, TIM V.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 030211/0353 →