IP Library Assignment 031248/0510
Patent Assignment
Reel/Frame 031248/0510

Supplement to Ip Security Agreement

Recorded: 2013-09-20 Pages: 17
Assignor
FREESCALE SEMICONDUCTOR, INC.
Executed: 2013-07-31
Assignee
CITIBANK, N.A., AS NOTES COLLATERAL AGENT
390 GREENWICH STREET, NEW YORK, NEW YORK, 10013
Covered Properties (127)
Semiconductor Device and Method of Assembling Same
Patent: 8,878,348 →
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Publication: US US20140070388A1
Semiconductor Device and Method of Assembling Same
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Publication: US US20130249071A1
Stiffened Semiconductor Die Package
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Application: 13/857,131 →
Method of Forming Stacked Die Package Using Redistributed Chip Packaging
Patent: 8,669,140 →
Application: 13/857,143 →
Methods and Apparatus for Calibrating Transducer-Including Devices
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Application: 13/859,490 →
Publication: US US20140303926A1
Double Patterning Aware Routing Without Stitching
Patent: 8,762,898 →
Application: 13/861,509 →
Fluid Cooled Semiconductor Die Package
Patent: 8,860,212 →
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Publication: US US20140306336A1
Integrated Circuit Chip with Discontinuous Guard Ring
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Publication: US US20140312457A1
Wire Bonding Machine and Method for Testing Wire Bond Connections
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Publication: US US20140103096A1
Startup Circuits with Native Transistors
Patent: 9,092,045 →
Application: 13/865,794 →
Publication: US US20140312875A1
Mixed Signal Ip Core Prototyping System
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Publication: US US20140109029A1
Mems Device with Stress Isolation and Method of Fabrication
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Publication: US US20140312435A1
Estimation of Sidewall Skew Angles of a Structure
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Publication: US US20140311243A1
Method of Fabricating Mems Device Having Release Etch Stop Layer
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Publication: US US20140312436A1
Amplifier Using Nonlinear Drivers
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Methods and Systems for Gate Dimension Control in Multi-Gate Structures for Semiconductor Devices
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Selective Gate Oxide Properties Adjustment Using Fluorine
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Standard Cell for Semiconductor Device
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Amplifiers and Related Receiver Systems
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Method and Apparatus for Accelerating Sparse Matrix Operations in Full Accuracy Circuit Simulation
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Publication: US US20140324398A1
Integrated Circuit Design Verification Through Forced Clock Glitches
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Publication: US US20140325463A1
Self-Defining, Low Capacitance Wire Bond Pad
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Publication: US US20140319703A1
Scalable Split Gate Memory Cell Array
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Publication: US US20140319593A1
Synchronous Multiple Port Memory with Asynchronous Ports
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Four Port Memory with Multiple Cores
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Publication: US US20140321185A1
Non-Volatile Memory (Nvm) with Variable Verify Operations
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Publication: US US20140321211A1
Biasing Split Gate Memory Cell During Power-Off Mode
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Publication: US US20140321213A1
Method and Apparatus for Generating Gate-Level Activity Data for Use in Clock Gating Efficiency Analysis
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Publication: US US20140325461A1
Electrostatic Discharge (ESD) Clamp Circuit with High Effective Holding Voltage
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Decoder for Determining a Substance or Material Structure of a Detected Object Based on Signals of a Capacitive Sensor and Method for Determining a Substance or Material Structure of a Detected Object Based on Signals of a Capacitive Sensor
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Method for Setting Breakpoints, and an Integrated Circuit and Debug Tool Therefor
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Publication: US US20130227256A1
Method for Bit Rate Control Within a Scalable Video Coding System and System Therefor
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Integrated Circuit Device and Method for Detecting an Excessive Voltage State
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Publication: US US20130229737A1
Method of Debugging Software and Corresponding Computer Program Product
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Publication: US US20130254750A1
Tactile Input Device, Microprocessor System and Method for Controlling a Tactile Input Device
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Publication: US US20130229273A1
Apparatus and Method for Monitoring Operation of an Insulated Gate Bipolar Transistor
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Testing an Electrical Connection of a Device Cap
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Metal-Oxide-Semiconductor (Mos) Voltage Divider with Dynamic Impedance Control
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Publication: US US20140333367A1
Semiconductor Device with Notched Gate
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Publication: US US20140332901A1
System for Measuring Power Consumption of Integrated Circuit
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Publication: US US20140333287A1
Integrated Circuit Power Management Module
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Publication: US US20140333133A1
Semiconductor Device with Bond and Probe Pads
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Publication: US US20140332811A1
Semiconductor Devices with Different Dielectric Thicknesses
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Publication: US US20130249015A1
Surface Mount Semiconductor Device with Solder Ball Reinforcement Frame
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Power Plane for Multi-Layered Substrate
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Publication: US US20140339687A1
System for Generating Clock Signal
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System and Method for Creating Logical Radio Link Control (Rlc) and Medium Access Control (Mac) Protocol Data Units (Pdus) in Mobile Communication System
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Semiconductor Structure with Sacrificial Anode and Passivation Layer and Method for Forming
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Publication: US US20140346663A1
Protection Device and Related Fabrication Methods
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Publication: US US20140347771A1
Protection Device and Related Fabrication Methods
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Publication: US US20140346560A1
Systems and Methods for Direct Memory Access Coherency Among Multiple Processing Cores
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Publication: US US20140351825A1
Active Lateral Force Stiction Self-Recovery for Microelectromechanical Systems Devices
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Publication: US US20140345380A1
Flexible Substrate with Crimping Interconnection
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Method and Apparatus for Self-Test of Successive Approximation Register (Sar) a/D Converter
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Integrated Circuit Wake-Up Control System
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Publication: US US20140351615A1
System and Method for Determining Power Leakage of Electronic Circuit Design
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Data Retention Flip-Flop
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Application: 13/902,974 →
Semiconductor Devices with Multilayer Flex Interconnect Structures
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Publication: US US20140353830A1
Method of Forming a High Thermal Conducting Semiconductor Device Package
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Application: 13/903,308 →
Publication: US US20140353816A1
System for Preventing Tampering with Integrated Circuit
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Publication: US US20140353849A1
I/O Cell Esd System
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Application: 13/905,275 →
Publication: US US20140353727A1
Self Adjusting Reference for Input Buffer
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Microelectronic Packages Including Patterned Die Attach Material and Methods for the Fabrication Thereof
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Publication: US US20140353772A1
Stacked Microelectronic Packages Having Sidewall Conductors and Methods for the Fabrication Thereof
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Publication: US US20140353840A1
Oscillator with Startup Circuitry
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Publication: US US20140354364A1
Method for Forming an Electrical Connection Between Metal Layers
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Publication: US US20140353841A1
Multi-Core System Performing Packet Processing with Context Switching
Patent: 9,588,808 →
Application: 13/907,480 →
Publication: US US20140359636A1
Multiple Data Rate Memory with Read Timing Information
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Application: 13/907,484 →
Publication: US US20140355366A1
Logic Transistor and Non-Volatile Memory Cell Integration
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Publication: US US20130264634A1
Fuse/Resistor Utilizing Interconnect and Vias and Method of Making
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Publication: US US20140353797A1
Methods and Structures for Split Gate Memory
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Publication: US US20140357072A1
Method for Low Power Boot for Microcontroller
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Publication: US US20140359264A1
Clock Multiplexer
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Optical Wafer and Die Probe Testing
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Publication: US US20140363905A1
Die Stack with Optical Tsvs
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Publication: US US20140363172A1
Communication System Die Stack
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Application: 13/914,049 →
Publication: US US20140362425A1
Integration of a Mems Beam with Optical Waveguide and Deflection in Two Dimensions
Patent: 9,435,952 →
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Publication: US US20140363119A1
Method and Apparatus for Beam Control with Optical Mems Beam Waveguide
Patent: 9,442,254 →
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Publication: US US20150253511A1
Optical Redundancy
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Publication: US US20140363124A1
Optical Backplane Mirror
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Application: 13/914,178 →
Publication: US US20140363120A1
Optical Die Test Interface
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Publication: US US20140363153A1
System and Method for Demodulating an Incoming Signal
Patent: 9,143,190 →
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Publication: US US20140254636A1
Esd Protection Device
Patent: 9,659,922 →
Application: 13/917,580 →
Publication: US US20140367830A1
Semiconductor Device with Redistributed Contacts
Patent: 8,765,527 →
Application: 13/917,639 →
Mold Cap for Semiconductor Device
Patent: 9,030,000 →
Application: 13/917,641 →
Publication: US US20140367840A1
Inertial Sensor with Trim Capacitance and Method of Trimming Offset
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Publication: US US20150268268A1
Scaled Sigma Sampling
Patent: 8,806,418 →
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Die Fracture Detection and Humidity Protection with Double Guard Ring Arrangement
Patent: 9,070,683 →
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Publication: US US20140375341A1
Lead Frame and Semiconductor Device Using Same
Application: 13/924,623 →
Publication: US US20140374892A1
Capillary Bonding Tool and Method of Forming Wire Bonds
Application: 13/924,625 →
Publication: US US20140374467A1
Wire Bonding Method for Flexible Substrates
Application: 13/924,626 →
Publication: US US20140374151A1
Semiconductor Device with Heat Spreader and Thermal Sheet
Application: 13/924,627 →
Publication: US US20140374891A1
Semiconductor Sensor Device with Metal Lid
Application: 13/924,628 →
Publication: US US20140374848A1
Pressure Sensor and Method of Packaging Same
Application: 13/924,633 →
Publication: US US20140374855A1
Frequency-Domain Amplitude Normalization For Symbol Correlation In Multi-Carrier Systems
Patent: 9,100,261 →
Application: 13/924,792 →
Publication: US US20140376648A1
Angular Rate Sensor with Quadrature Error Compensation
Patent: 9,476,711 →
Application: 13/924,880 →
Publication: US US20140374849A1
Frequency-Domain Carrier Blanking For Multi-Carrier Systems
Application: 13/924,940 →
Publication: US US20140376667A1
Frequency-Domain Frame Synchronization In Multi-Carrier Systems
Patent: 9,106,499 →
Application: 13/924,996 →
Publication: US US20140376674A1
Frequency-Domain Symbol And Frame Synchronization In Multi-Carrier Systems
Patent: 9,282,525 →
Application: 13/925,023 →
Publication: US US20140376540A1
System and Method for Low-Latency Addressing in Flash Memory
Patent: 8,886,874 →
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Wireless Communication Apparatus and Method
Patent: 9,220,042 →
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Publication: US US20140376510A1
Method for Fabricating Multiple Types of Mems Devices
Patent: 9,034,679 →
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Publication: US US20140374851A1
Reconfigurable Flip-Flop
Patent: 9,124,262 →
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Publication: US US20140062560A1
Non-Volatile Memory (Nvm) and High Voltage Transistor Integration
Patent: 9,006,093 →
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Publication: US US20150001612A1
System with Feature of Saving Dynamic Power of Flip-Flop Banks
Patent: 9,310,829 →
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Packaged Semiconductor Device
Patent: 9,287,200 →
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Optimizing Error Parsing in an Integrated Development Environment
Patent: 9,710,360 →
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Method and System for Recovering from Transistor Aging Using Heating
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Publication: US US20150002211A1
Multi-Layer Process-Induced Damage Tracking and Remediation
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Semiconductor Package Having Wire Bond Wall to Reduce Coupling
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Methods and Structures for a Split Gate Memory Cell Structure
Patent: 9,590,058 →
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Publication: US US20150001606A1
Die-To-Die Inductive Communication Devices and Methods
Patent: 9,466,413 →
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Publication: US US20150001948A1
Die-To-Die Inductive Communication Devices and Methods
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Publication: US US20150004902A1
Integrated Circuits and Methods for Monitoring Forward and Reverse Back Biasing
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Publication: US US20150002215A1
Method for Detecting Bank Collision at a Memory and Device Therefor
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Method, System, and Computer Program Product
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Integrated Circuit Device and Method for Calculating a Predicate Value
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Phased-Array Receiver, Radar System and Vehicle
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Integrated Circuit Device, Signal Processing System and Method for Prefetching Lines of Data Therefor
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Method for Enabling Calibration During Start-Up of a Micro Controller Unit and Integrated Circuit Therefor
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Integrated Circuit and a Method of Power Management of an Integrated Circuit
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Error Correcting Device, Method for Monitoring an Error Correcting Device and Data Processing System
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Method and Apparatus for Managing Power in a Multi-Core Processor
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Switching Arrangement, Integrated Circuit Comprising Same, Method of Controlling a Switching Arrangement, and Related Computer Program Product
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Integrated Circuit Device and Method for Performing Conditional Negation of Data
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Tin-Based Wirebond Structures
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Related Assignments (24)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 12, 2013
From: MAZIASZ, ROBERT L.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 030203/0285 →
Assignment of Assignor's Interest Apr 30, 2013
From: JAIN, ANKIT; TRIPATHI, VIKAS
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 030311/0829 →
Supplement to Ip Security Agreement Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031248/0627 →
Supplement to Ip Security Agreement Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 031248/0750 →
Patent Release Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0804 →
Patent Release Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0844 →
Patent Release Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0819 →
Release of Security Interest Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
Release of Security Interest Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
Change of Name Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
Merger Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
Merger Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
Corrective Assignment to Correct the Nature of Conveyance Previously Recorded at Reel: 040652 Frame: 0241. Assignor(S) Hereby Confirms the Merger and Change of Name. Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
Corrective Assignment to Correct the Nature of Conveyance Previously Recorded at Reel: 040632 Frame: 0001. Assignor(S) Hereby Confirms the Merger and Change of Name. Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
Corrective Assignment to Correct the to Correct the Application No. from 13,883,290 to 13,833,290 Previously Recorded on Reel 041703 Frame 0536. Assignor(S) Hereby Confirms the the Assignment and Assumption of Security Interest in Patents.. Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
Release of Security Interest Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
Release of Security Interest Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
Corrective Assignment to Correct the Remove Application 12298143 Previously Recorded on Reel 042985 Frame 0001. Assignor(S) Hereby Confirms the Security Agreement Supplement. Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
Corrective Assignment to Correct the Remove Application 12298143 Previously Recorded on Reel 042762 Frame 0145. Assignor(S) Hereby Confirms the Security Agreement Supplement. Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
Corrective Assignment to Correct the Remove Application 12298143 Previously Recorded on Reel 038017 Frame 0058. Assignor(S) Hereby Confirms the Security Agreement Supplement. Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
Corrective Assignment to Correct the Remove Application 12298143 Previously Recorded on Reel 039361 Frame 0212. Assignor(S) Hereby Confirms the Security Agreement Supplement. Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
Corrective Assignment to Correct the Remove Application 11759915 and Replace It with Application 11759935 Previously Recorded on Reel 037486 Frame 0517. Assignor(S) Hereby Confirms the Assignment and Assumption of Security Interest in Patents. Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
Corrective Assignment to Correct the Remove Application 11759915 and Replace It with Application 11759935 Previously Recorded on Reel 040928 Frame 0001. Assignor(S) Hereby Confirms the Release of Security Interest. Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
Corrective Assignment to Correct the Remove Application 11759915 and Replace It with Application 11759935 Previously Recorded on Reel 040925 Frame 0001. Assignor(S) Hereby Confirms the Release of Security Interest. Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →