IP Library Patent Application 13924633
Patent Application
App. No. 13/924,633

PRESSURE SENSOR AND METHOD OF PACKAGING SAME

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Quick Facts
Patent No.
US None
App. No.
13/924,633
Abstract

A method of packaging a pressure sensor die begins with patterning and etching a metal strip and forming metal traces on the strip. Further build-up is performed to transform the metal strip into a layered substrate. Cavity walls are formed on one side of the strip with a molding process and then the metal on the back side of the strip is removed. Next semiconductor dies are attached to the strip within the cavities and electrically connected to pads formed on the surface of the strip and/or to pads on other ones of the dies. A gel coating is deposited over the dies and then a metal lid is secured over the cavity. The strip is then singulated along ones of the cavity walls to form multiple sensor devices.

Claims (41)

1 . A method of packaging a pressure sensor die, comprising the steps of:

forming a coreless substrate on a sheet of metal foil, wherein the forming includes forming one or more die attach areas and a plurality of electrical contacts on an upper surface of the substrate;

forming side walls at predetermined locations on the upper substrate upper surface;

attaching a first die to a first one of the die attach areas;

attaching a pressure sensor die to a second one of the die attach areas;

electrically connecting the first die to the plurality of electrical contacts on the substrate upper surface;

electrically connecting the pressure sensor die to the first die;

dispensing a gel material onto a top surface of at least the pressure sensor die; and

attaching a lid over the first die and the pressure sensor die, wherein the lid is supported by the side walls.

2 . The method of packaging a pressure sensor die of claim 1 , further comprising removing the metal foil from the substrate to expose a bottom surface of the substrate.

3 . The method of packaging a pressure sensor die of claim 2 , wherein removing the metal foil is performed before the side walls are formed on the upper surface of the substrate.

4 . The method of packaging a pressure sensor die of claim 2 , wherein removing the metal foil is performed after the side walls are formed on the upper surface of the substrate.

5 . The method of packaging a pressure sensor die of claim 1 , wherein the electrical connection steps comprise performing a wire bonding process to connect the first die to the substrate with first bond wires and to connect the pressure sensor die to the first die with second bond wires.

6 . The method of packaging a pressure sensor die of claim 1 , wherein forming the side walls comprises performing a molding process and forming the side walls with a mold compound.

7 . The method of packaging a pressure sensor die of claim 1 , further comprising attaching a third die to a third die attach area and electrically connecting the third die to the first die.

8 . The method of packaging a pressure sensor die of claim 7 , wherein the third die comprises an accelerometer.

9 . The method of packaging a pressure sensor die of claim 1 , wherein the dispensing step includes covering the first die with the gel material.

10 . The method of packaging a pressure sensor die of claim 1 , wherein the lid is formed of metal and includes a through hole.

11 . The method of packaging a pressure sensor die of claim 1 , further comprising the step of curing the gel material.

12 . A packaged pressure sensor die, comprising:

a coreless substrate having a lower surface with exposed electrical contacts and an upper surface with exposed substrate contact pads and one or more die attach areas;

a first semiconductor die attached to a first one of the die attach areas and electrically connected to the substrate contact pads;

a pressure sensor die attached to a second one of the die attach areas and electrically coupled to the first semiconductor die;

a sidewall formed on the upper surface of the substrate;

a gel covering at least the pressure sensor die; and

a lid covering the first semiconductor die and the pressure sensor die, wherein the lid is supported by the side walls.

13 . The packaged pressure sensor die of claim 12 , further comprising first bond wires that electrically connect the first semiconductor die to the substrate contact pads and second bond wires that electrically connect the pressure sensor die to the first semiconductor die.

14 . The packaged pressure sensor die of claim 12 , wherein the sidewalls are formed of a mold compound and include notches that receive ends of the lid.

15 . The packaged pressure sensor die of claim 15 , wherein the lid is formed of metal and includes a through-hole.

16 . The packaged pressure sensor die of claim 12 , further comprising an accelerometer die attached to a third die attach area on the surface of the substrate and electrically connected to the first semiconductor die with third bond wires.

17 . The packaged pressure sensor die of claim 12 , wherein the packaged pressure sensor die comprises a quad flat no-leads (QFN) package.

18 . A packaged pressure sensor die, comprising:

a coreless substrate having a lower surface with exposed electrical contacts and an upper surface with exposed substrate contact pads and one or more die attach areas;

a control die attached to a first die attach area and electrically connected to the substrate contact pads;

a pressure sensor die attached to a second die attach area and electrically connected to the control die;

an accelerometer die attached to a third die attach area and electrically connected to the control die;

a sidewall formed on the upper surface of the substrate;

a gel covering at least the pressure sensor die; and

a lid covering at least the pressure sensor die, wherein the lid is supported by the side walls.

19 . The packaged pressure sensor die of claim 18 , further comprising first bond wires that electrically connect the control die to the substrate contact pads, second bond wires that electrically connect the pressure sensor die to the control die, and third bond wires that electrically connect the accelerometer die to the control die.

20 . The packaged pressure sensor die of claim 18 , wherein the sidewalls are formed of a mold compound and include notches that receive ends of the lid, the lid is formed of metal and includes a through hole, and the lid covers the control die, the pressure sensor die and the accelerometer.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 6, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037445/0592 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0844 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0804 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0819 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031248/0698 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 031248/0750 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031248/0627 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Sep 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031248/0510 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2013
From: LO, WAI YEW
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 030667/0393 →