Characterization of nanoscale structures using an ultrafast electron microscope
The present invention relates to methods and systems for 4 D ultrafast electron microscopy (UEM)—in situ imaging with ultrafast time resolution in TEM. Single electron imaging is used as a component of the 4 D UEM technique to provide high spatial and temporal resolution unavailable using conventional techniques. Other embodiments of the present invention relate to methods and systems for convergent beam UEM, focusing the electron beams onto the specimen to measure structural characteristics in three dimensions as a function of time. Additionally, embodiments provide not only 4 D imaging of specimens, but characterization of electron energy, performing time resolved electron energy loss spectroscopy (EELS).
1. A method of constructing a 4D tilt series of images of a moving object, the method comprising:
(a) irradiating the moving object with an optical pulse;
(b) directing an electron pulse to impinge on the moving object;
(c) detecting the electron pulse;
(d) processing the detected electron pulse to form an image of the moving object;
(e) capturing the image of the moving object associated with a time step; and
(f) repeating (a)-(e) to construct the 4D tilt series of images of the moving object.
2. The method of claim 1 wherein the time step is on a scale of nanoseconds.
3. The method of claim 1 wherein the electron pulse consists of a single electron.
4. The method of claim 1 wherein the electron pulse comprises a plurality of electrons.
5. The method of claim 1 wherein the moving object comprises a nanomechanical cantilever.
6. The method of claim 1 wherein the moving object comprises a biological entity selected from at least one of a cell, a protein, a nucleic acid, a virus, or a complex thereof.
7. The method of claim 1 wherein the 4D tilt series of images is a tomographic tilt series of images capturing a portion of the moving object.
8. The method of claim 1 further comprising measuring a difference between each image in the 4D tilt series of images at a microscale level.
9. The method of claim 1 , further comprising measuring a difference between each image in the 4D tilt series of images at a nanoscale level.