IP Library Granted Patent US 9,918,029
Granted Patent B2
US 9,918,029 · App. 13/926,657 · Granted Mar 13, 2018

Imaging systems with switchable column power control

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,918,029
App. No.
13/926,657
Granted
Mar 13, 2018
Kind
B2
Abstract

Electronic devices may include image sensors having image pixel arrays with image pixels arranged in pixel rows and pixel columns. Each pixel column may be coupled to a column line having column readout circuitry and column power control circuitry that selectively enables or disables the column readout circuitry for various column lines. The column power control circuitry and the column readout circuitry may be coupled to column decoder circuitry. The column decoder circuitry may provide a column address signals to the power control and the readout circuitry. The power control circuitry may enable only column lines for which column addresses have been received.

Claims (37)

1. An image sensor, comprising:

an array of image pixels arranged in pixel rows and pixel columns;

a plurality of column lines, wherein each one of the plurality of column lines is coupled to a corresponding pixel column;

column readout circuitry including analog-to-digital conversion circuitry and memory, wherein each one of the plurality of column lines is coupled to the column readout circuitry; and

column power control circuitry having at least one flip-flop with an input terminal configured to receive a power update clock signal, wherein the column power control circuitry is configured to selectively power on and power off the analog-to-digital conversion circuitry and the memory based on received column addresses and wherein the received column addresses indicate which portions of the analog-to-digital conversion circuitry and the memory are powered on and which portions of the analog-to-digital conversion circuitry and the memory are powered off.

2. The image sensor defined in claim 1 wherein the column power control circuitry further comprises a set-reset latch coupled to the at least one flip-flop.

3. The image sensor defined in claim 2 wherein the column power control circuitry further comprises an OR gate coupled to the set-reset latch.

4. The image sensor defined in claim 3 wherein the OR gate is coupled to a set input of the set-reset latch.

5. The image sensor defined in claim 4 wherein the column power control circuitry further comprises an NOR gate coupled to the at least one flip-flop.

6. The image sensor defined in claim 5 wherein the column control circuitry further comprises an additional OR gate coupled to the NOR gate.

7. The image sensor defined in claim 6 wherein the flip-flop comprises an output terminal and wherein the output terminal of the flip-flop is connected to an input terminal of the NOR gate.

8. The image sensor defined in claim 7 wherein the NOR gate comprises an output terminal and wherein the output terminal of the NOR gate is connected to an input terminal of the additional OR gate.

9. The image sensor defined in claim 8 wherein the column readout circuitry comprises:

multiplexing circuitry.

10. The image sensor defined in claim 1 , wherein the column power control circuitry is configured to alternately power on and power off alternating columns of the analog-to-digital conversion circuitry and the memory in a horizontal skip mode.

11. An image sensor, comprising:

an array of image pixels arranged in pixel rows and pixel columns;

a plurality of column lines, wherein each one of the plurality of column lines is coupled to a corresponding pixel column;

column readout circuitry, wherein each one of the plurality of column lines is coupled to the column readout circuitry; and

column power control circuitry having a flip-flop, a latch coupled to an input terminal of the flip-flop, an OR gate coupled to the latch, a NOR gate coupled to an output terminal of the flip-flop, and an additional OR gate that receives an output from the NOR gate and a horizontal skip mode signal, wherein the column power control circuitry is configured to alternately power on and power off alternating columns of the column readout circuitry in a horizontal skip mode when the horizontal skip mode signal is asserted.

12. The image sensor defined in claim 11 , further comprising:

additional column circuitry, wherein the column power control circuitry is configured to receive column addresses from the additional column circuitry.

13. The image sensor defined in claim 12 wherein the column readout circuitry comprises analog-to-digital conversion circuitry coupled to each of the plurality of column lines.

14. The image sensor defined in claim 13 wherein the column readout circuitry further comprises amplifiers coupled to each of the plurality of column lines.

15. The image sensor defined in claim 14 wherein the column readout circuitry further comprises memory for storing pixel signals from the array of image pixels.

16. The image sensor defined in claim 15 wherein the column readout circuitry further comprises multiplexing and demultiplexing circuitry coupled to the plurality of column lines.

17. The image sensor defined in claim 16 , further comprising row control circuitry configured to provide row control signals to the pixel rows.

18. A system, comprising:

a central processing unit;

input-output circuitry; and

an imaging device, wherein the imaging device comprises:

an array of image pixels arranged in pixel rows and pixel columns;

a plurality of column lines, wherein each one of the plurality of column lines is coupled to a corresponding pixel column;

column readout circuitry including analog-to-digital conversion circuitry and memory, wherein each one of the plurality of column lines is coupled to the column readout circuitry;

column power control circuitry having at least one flip-flop with an input terminal configured to receive a power update clock signal, wherein the column power control circuitry is configured to selectively power-on and power-off the column readout circuitry based on column addresses and wherein the column addresses indicate which portions of the analog-to-digital conversion circuitry and the memory are powered on and which portions of the analog-to-digital conversion circuitry and the memory are powered off; and

processing circuitry, wherein the column power control circuitry receives the column addresses from the processing circuitry.

19. The system defined in claim 18 wherein the column power control circuitry further comprises a latch and an OR gate coupled to an additional input terminal of the at least one flip-flop and a NOR gate and an additional OR gate coupled to an output terminal of the at least one flip-flop.

Assignments (5)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2014
From: APTINA IMAGING CORPORATION
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 034673/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2013
From: KIM, DONGSOO
To: APTINA IMAGING CORPORATION
Reel/Frame 030683/0752 →