IP Library Granted Patent US 9,000,807
Granted Patent B2
US 9,000,807 · App. 13/933,332 · Granted Apr 7, 2015

On-chip probe circuit for detecting faults in an FPGA

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Quick Facts
Patent No.
US 9,000,807
App. No.
13/933,332
Filed
Jul 2, 2013
Granted
Apr 7, 2015
Kind
B2
Art Unit
2844
USPC
326/93
Abstract

An integrated circuit includes a clock input, a first output, and a second output. A programmable pulse generator has a programmable pulse counter coupled to the clock input at least one control input for receiving count information. A fixed delay element is coupled to the programmable pulse counter. A programmable delay element is coupled to the programmable pulse counter and has at least one control input for receiving delay information. A first multiplexer is coupled to the fixed delay element, the programmable delay element and to the first output. A second multiplexer is coupled to the programmable delay element, the output of the fixed delay element and the second output.

Claims (27)

1. An integrated circuit including:

a clock input;

a first output;

a second output;

a fixed delay element having an input coupled to the clock input and an output;

a programmable delay element having an input coupled to the clock input, an output, and at least one control input for receiving delay information;

a first multiplexer having a first data input coupled to the output of the fixed delay element, a second data input coupled to the output of the programmable delay element, an output coupled to the first output, and a control input; and

a second multiplexer having a first data input coupled to the output of the programmable delay element, a second data input coupled to the output of the fixed delay element, an output coupled to the second output, and a control input.

2. The integrated circuit of claim 1 , wherein:

the fixed delay element is coupled to the clock input through a programmable pulse counter having an input coupled to the clock input, an output, and at least one control input for receiving count information; and

the programmable delay element is coupled to the clock input through the programmable pulse counter.

3. The integrated circuit of claim 1 , further including an arrival order detector circuit coupled between the first output and the second output.

4. The integrated circuit of claim 3 , wherein the arrival order detector circuit includes:

a first flip-flop having a clock input coupled to the programmable delay element and a data input coupled to the fixed delay element; and

a second flip-flop having a clock input coupled to the fixed delay element and a data input coupled to the programmable delay element.

5. The integrated circuit of claim 4 further including a CLEAR signal line connected to a CLEAR input of the first flip-flop and a CLEAR input of the second flip-flop.

6. The integrated circuit of claim 4 further including a SET signal line connected to a SET input of the first flip-flop and a SET input of the second flip-flop.

7. The integrated circuit of claim 1 , further including:

a multicycle control input:

a down counter coupled to the clock input and having at least one control input to receive a control input specifying clock N pulses; and wherein:

the fixed delay element is coupled to the clock input through a first timing circuit responsive to signals from the down counter and the multicycle control input; and

the programmable delay element is coupled to the clock input through a second timing circuit responsive to signals from the down counter and the multicycle control input.

8. The integrated circuit of claim 7 wherein:

the first and second timing circuits simultaneously pass N clock pulses from the clock input to the fixed delay element and the programmable delay element when the multicycle control input is in a first logic state; and

the first timing circuit passes a first of N clock pulses from the clock input to the fixed delay element and the second timing circuit passes an (N+1)th clock pulse to the programmable delay element when the multicycle control input is in a second logic state opposite the first logic state.

9. The integrated circuit of claim 8 , further including:

an OR gate having a first input coupled to the fixed delay element, a second input coupled to the programmable delay element, and an output coupled to a third data input of the first multiplexer and a third data input of the second multiplexer.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
SECURITY AGREEMENT Recorded Apr 22, 2015
From: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP; MICROSEMI SEMICONDUCTOR (U.S.) INC.; MICROSEMI SOC CORP.; MICROSEMI FREQUENCY AND TIME CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 035477/0057 →
CHANGE OF NAME Recorded Aug 29, 2013
From: ACTEL CORPORATION
To: MICROSEMI SOC CORP.
Reel/Frame 031123/0764 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2013
From: GREENE, JONATHAN W.; KANNEMACHER, DIRK; HECHT, VOLKER; SPEERS, THEODORE
To: ACTEL CORPORATION
Reel/Frame 030726/0452 →