IP Library Granted Patent US 9,093,515
Granted Patent B2
US 9,093,515 · App. 13/944,445 · Granted Jul 28, 2015

Wire bonding capillary with working tip protrusion

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Quick Facts
Patent No.
US 9,093,515
App. No.
13/944,445
Granted
Jul 28, 2015
Kind
B2
Abstract

A method for bonding a wire to a substrate includes forming a wire ball at a working tip of a capillary and contacting the wire ball to a substrate via the capillary. The method also includes driving a protrusion at the working tip of the capillary into contact with a region of the substrate surrounding the wire ball. A capillary for wire bonding includes a working face, an annular chamfer section, and a cylindrical bore offsetting the annular chamfer section from the working face. A capillary for wire bonding includes a capillary body comprising a working tip having a working face. The capillary body defines an axial passage extending from the working face along a longitudinal axis of the capillary. The axial passage includes a cylindrical bore extending internally from the working face, and a first annular chamfer having a major diameter defined by the cylindrical bore.

Claims (64)

1. A method for bonding a wire to a substrate, the method comprising:

forming a wire ball at a wire at a working tip of a capillary;

contacting the wire ball to a substrate via the capillary;

driving a protrusion at the working tip of the capillary into contact with a region of the substrate surrounding the wire ball;

forming a stitch bond with the wire at a substrate using the capillary; and

cleaving at least a portion of the wire at the stitch bond by penetrating the wire with the protrusion.

2. The method of claim 1 , wherein:

driving the protrusion at the working tip of the capillary into contact with the region of the substrate surrounding the wire ball comprises driving the protrusion of the working tip into the region of the substrate so that substrate material within the region is contained within a chamber formed by the working tip.

3. The method of claim 1 , wherein:

driving the protrusion into contact with the region of the substrate surrounding the wire ball comprises penetrating a surface of the substrate with the protrusion so that substrate material at the region is pressed against a sidewall of the wire ball.

4. The method of claim 1 , wherein:

the wire is composed of copper (Cu); and

the substrate comprises a pad composed of aluminum (Al).

5. The method of claim 1 , wherein the protrusion comprises at least one of: a protruding annular lip circumscribing an opening of an axial passage at a working face of the working tip; a perimeter edge of an opening of an axial passage at a flat working face of the working tip, the flat working face at a non-zero acute angle relative to a longitudinal axis of the axial passage; a protruding annular lip defines a portion of a cylindrical bore at the working face; and a protruding annular lip that is offset from an opening defined by a cylindrical bore at the working face.

6. A capillary for wire bonding a wire to a substrate, the capillary comprising:

a working face;

a first annular chamfer section;

a cylindrical bore offsetting the annular chamfer section from the working face; and

wherein the first annular chamfer section comprises:

a first annular chamfer; and

a second annular chamfer disposed between the first annular chamfer and the cylindrical bore and having an inside chamfer angle greater than an inside chamfer angle of the first annular chamfer.

7. The capillary of claim 6 , wherein:

the working face comprises a protruding annular lip that defines a portion of the cylindrical bore at the working face.

8. The capillary of claim 7 , wherein:

the working face further comprises a flat annular surface extending from the protruding annular lip.

9. The capillary of claim 6 , wherein:

the working face comprises a flat annular surface extending from a perimeter of the cylindrical bore.

10. The capillary of claim 6 , further comprising:

a capillary body comprising a working tip comprising the working face, the capillary body defining an axial passage extending from the working face along a longitudinal axis of the capillary, the axial passage comprising:

the cylindrical bore, wherein the cylindrical bore extends internally from the working face; and

the first annular chamfer having a major diameter defined by the cylindrical bore.

11. The capillary of claim 10 , wherein the

second annular chamfer has a major diameter defined by a minor diameter of the first annular chamfer.

12. The capillary of claim 10 , wherein a length of the cylindrical bore is at least one-fourth of a diameter of the cylindrical bore.

13. The capillary of claim 10 , wherein the working tip comprises a protruding annular lip.

14. The capillary of claim 10 , wherein the working face comprises a flat annular surface circumscribing an opening of the cylindrical bore.

15. A bonding tool comprising the capillary of claim 6 , the bonding tool further comprising:

a servo system to drive a protrusion at the working face of the capillary into contact with a surface of the substrate during formation of a wire bond at the substrate.

16. A method for bonding a wire to a substrate, the method comprising:

forming a wire ball at a wire at a working tip of a capillary;

contacting the wire ball to a substrate via the capillary;

performing an ultrasonic scrub process to initiate plastic deformation of the wire ball subsequent to contacting the wire ball to the substrate; and

after performing the ultrasonic scrub process, driving a protrusion at the working tip of the capillary into contact with a region of the substrate surrounding the wire ball.

17. The method of claim 16 , wherein:

driving the protrusion at the working tip of the capillary into contact with the region of the substrate surrounding the wire ball comprises driving the protrusion of the working tip into the region of the substrate so that substrate material within the region is contained within a chamber formed by the working tip.

18. The method of claim 16 , wherein:

driving the protrusion into contact with the region of the substrate surrounding the wire ball comprises penetrating a surface of the substrate with the protrusion so that substrate material at the region is pressed against a sidewall of the wire ball.

19. The method of claim 16 , wherein the protrusion comprises at least one of: a protruding annular lip circumscribing an opening of an axial passage at a working face of the working tip; a perimeter edge of an opening of an axial passage at a flat working face of the working tip, the flat working face at a non-zero acute angle relative to a longitudinal axis of the axial passage; a protruding annular lip that defines a portion of a cylindrical bore at the working face; and a protruding annular lip that is offset from an opening defined by a cylindrical bore at the working face.

20. A capillary for wire bonding a wire to a substrate, the capillary comprising:

a working face;

a first annular chamfer section;

a cylindrical bore offsetting the annular chamfer section from the working face; and

wherein the working face comprises:

a protruding annular lip that defines a portion of the cylindrical bore at the working face the protruding annular lip having a wedge profile formed by a parallel walled portion that forms a segment of the cylindrical bore and an angled wall portion at a non-zero angle relative to the parallel walled portion; and

a flat annular surface extending from the protruding annular lip at a non-zero acute angle relative to a longitudinal axis of the cylindrical bore.

21. The capillary of claim 20 , wherein:

the protruding annular lip is one of: a protruding annular lip that defines a portion of the cylindrical bore at the working face; and a protruding annular lip that is offset from an opening defined by a cylindrical bore at the working face.

22. A bonding tool comprising the capillary of claim 20 , the bonding tool further comprising:

a servo system to drive the protruding annular lip of the capillary into contact with a surface of the substrate during formation of a wire bond at the substrate.

23. The bonding tool of claim 22 , wherein the servo system further is to:

manipulate the capillary to form a stitch bond with the wire at a substrate; and

drive the protruding annular lip of the capillary into the wire to cleave at least a portion of the wire at the stitch bond.

24. The bonding tool of claim 22 , further comprising:

an ultrasonic transducer to perform an ultrasonic scrub process to initiate plastic deformation of a wire ball subsequent to contacting the wire ball to the substrate and prior to the servo system driving the protruding annular lip of the capillary into contact with the surface of the substrate.

Assignments (26)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PCT NUMBERS IB2013000664, US2013051970, US201305935 PREVIOUSLY RECORDED AT REEL: 037444 FRAME: 0787. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Oct 17, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 040450/0715 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0787 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0874 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 13, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 13, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2013
From: UEHLING, TRENT; SCHMADLAK, ILKO
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 030821/0250 →