IP Library Granted Patent US 9,870,104
Granted Patent B2
US 9,870,104 · App. 13/955,352 · Granted Jan 16, 2018

Dynamic clustering of touch sensor electrodes

Inventors: Samuel Brunet (Cowes, GB); Richard Paul Collins (Southampton, GB); Luben Hristov (Sofia, BG); Steinar Myren (Vikhammer, NO); Trond Jarle Pedersen (Trondheim, NO); Paul Stavely (Southampton, GB)
Assignee: Atmel Corporation
G06F3/044G06F3/0416G06F3/0418G06F2203/04101G06F2203/04108
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Quick Facts
Patent No.
US 9,870,104
App. No.
13/955,352
Filed
Jul 31, 2013
Granted
Jan 16, 2018
Kind
B2
Examiner
ADAMS, CARL
Art Unit
2627
USPC
345/173
Abstract

In one embodiment, an apparatus includes a sensor having a plurality of electrodes and a controller having a processor and a memory. The memory includes logic operable, when executed by the processor, to connect each electrode of a first subset of the plurality of electrodes, apply voltage to the first subset, and determine a first value associated with a capacitance of the first subset. Based at least on the first value, the logic is further operable to connect each electrode of a second subset of the plurality of electrodes, the second subset having fewer electrodes than the first subset, apply voltage to the second subset, and determine a second value associated with a capacitance of the second subset.

Claims (98)

1. An apparatus comprising:

a sensor comprising a plurality of electrodes;

a controller comprising:

a processor; and

a memory comprising logic operable, when executed by the processor, to:

connect each electrode of a first subset of the plurality of electrodes;

apply voltage to the first subset after connecting each electrode of the first subset;

determine a first value associated with a capacitance of the first subset after applying voltage to the first subset;

determine, based at least on the first value, whether to alter the first subset of the plurality of electrodes to a second subset of the plurality of electrodes;

connect, in response to determining to alter the first subset of the plurality of electrodes to the second subset of the plurality of electrodes, each electrode of the second subset of the plurality of electrodes, the second subset having fewer electrodes than the first subset;

apply voltage to the second subset after connecting each electrode of the second subset; and

determine a second value associated with a capacitance of the second subset after applying voltage to the second subset.

2. The apparatus of claim 1 , wherein the logic is further operable, when executed by the processor, to:

based at least on the second value, connect a third subset of the plurality of electrodes, the third subset having fewer electrodes than the second subset;

apply voltage to the third subset after connecting each electrode of the third subset; and

determine a third value associated with a capacitance of the third subset after applying voltage to the third subset.

3. The apparatus of claim 1 , wherein:

determining the first value comprises measuring a first voltage associated with the first subset after the application of voltage to the first subset; and

determining the second value comprises measuring a second voltage associated with the second subset after the application of voltage to the second subset.

4. The apparatus of claim 1 , wherein the determination of the first and second values utilizes self-capacitance measurements.

5. The apparatus of claim 1 , wherein the first subset comprises a first electrode and a second electrode adjacent and substantially parallel to the first electrode.

6. The apparatus of claim 1 , wherein:

the logic is further operable, when executed by the processor, to:

connect each electrode of a third subset of the plurality of electrodes, the third subset having the same number of electrodes as the first subset;

apply voltage to the third subset after connecting each electrode of the third subset; and

determine a third value associated with a capacitance of the third subset after applying voltage to the third subset; and

the connection of each electrode of a second subset is based at least on the first and third values.

7. The apparatus of claim 1 , wherein the first subset includes one or more electrodes that are not included in the second subset and includes one or more electrodes that are included in the second subset.

8. A method comprising:

connecting each electrode of a first subset of a plurality of electrodes of a sensor;

applying voltage to the first subset after connecting each electrode of the first subset;

determining a first value associated with a capacitance of the first subset after applying voltage to the first subset;

determining, based at least on the first value, to alter the first subset of the plurality of electrodes to a second subset of the plurality of electrodes;

connecting, in response to determining to alter the first subset of the plurality of electrodes to the second subset of the plurality of electrodes, each electrode of the second subset of the plurality of electrodes, the second subset having fewer electrodes than the first subset;

applying voltage to the second subset after connecting each electrode of the second subset; and

determining a second value associated with a capacitance of the second subset after applying voltage to the second subset.

9. The method of claim 8 , further comprising:

based at least on the second value, connecting each electrode of a third subset of the plurality of electrodes, the third subset having fewer electrodes than the second subset;

applying voltage to the third subset after connecting each electrode of the third subset; and

determining a third value associated with a capacitance of the third subset after applying voltage to the third subset.

10. The method of claim 8 , wherein:

determining the first value comprises measuring a first voltage associated with the first subset after the application of voltage to the first subset; and

determining the second value comprises measuring a second voltage associated with the second subset after the application of voltage to the second subset.

11. The method of claim 8 , wherein the determination of the first and second values utilizes self-capacitance measurements.

12. The method of claim 8 , further comprising:

connecting each electrode of a third subset of the plurality of electrodes, the third subset having the same number of electrodes as the first subset;

applying voltage to the third subset after connecting each electrode of the third subset; and

determining a third value associated with a capacitance of the third subset after applying voltage to the third subset;

wherein the connection of each electrode of a second subset is based at least on the first and third values.

13. The method of claim 8 , wherein the application of voltage to the first and third subsets is substantially simultaneous.

14. An apparatus comprising:

one or more processors; and

a non-transitory computer-readable storage medium comprising logic, the logic configured to, when executed by the one or more processors, cause the one or more processors to perform operations comprising:

connecting each electrode of a first subset of a plurality of electrodes;

applying voltage to the first subset after connecting each electrode of the first subset;

determining a first value associated with a capacitance of the first subset after applying voltage to the first subset;

determining, based at least on the first value, whether to alter the first subset of the plurality of electrodes to a second subset of the plurality of electrodes;

connecting, in response to determining to alter the first subset of the plurality of electrodes to the second subset of the plurality of electrodes, each electrode of the second subset of the plurality of electrodes, wherein the second subset includes one or more electrodes included in the first subset, includes one or more electrodes not included in the first subset, and does not include one or more electrodes included in the first subset;

applying voltage to the second subset after connecting each electrode of the second subset;

determining a second value associated with a capacitance of the second subset after applying voltage to the second subset; and

determining a position of an object based at least on the first and second values, the position indicating a projection of a portion of the object over a surface of the sensor.

15. The apparatus of claim 14 , wherein the operations further comprise:

connecting each electrode of a third subset of the plurality of electrodes, wherein the third subset includes one or more electrodes included in the first and second subsets, includes one or more electrodes not included in the first and second subsets, and does not include one or more electrodes included in the first and second subsets;

applying voltage to the third subset after connecting each electrode of the third subset; and

determining a third value associated with a capacitance of the third subset after applying voltage to the third subset;

wherein the determination of the position of the object is based further on the third value.

16. The apparatus of claim 15 , wherein:

the plurality of electrodes comprises first, second, third, fourth, and fifth electrodes;

the first subset comprises the first, second, and third electrodes;

the second subset comprises the second, third, and fourth electrodes; and

the third subset comprises the third, fourth, and fifth electrodes.

17. The apparatus of claim 14 , wherein:

determining the first value comprises measuring a first voltage associated with the first subset after the application of voltage to the first subset; and

determining the second value comprises measuring a second voltage associated with the second subset after the application of voltage to the second subset.

18. The apparatus of claim 14 , wherein the determination of the first and second values utilizes self-capacitance measurements.

19. A method comprising:

connecting each electrode of a first subset of a plurality of electrodes of a sensor;

applying voltage to the first subset after connecting each electrode of the first subset;

determining a first value associated with a capacitance of the first subset after applying voltage to the first subset;

determining, based at least on the first value, to alter the first subset of the plurality of electrodes to a second subset of the plurality of electrodes;

connecting, in response to determining to alter the first subset of the plurality of electrodes to the second subset of the plurality of electrodes, each electrode of the second subset of the plurality of electrodes, wherein the second subset includes one or more electrodes included in the first subset, includes one or more electrodes not included in the first subset, and does not include one or more electrodes included in the first subset;

applying voltage to the second subset after connecting each electrode of the second subset;

determining a second value associated with a capacitance of the second subset after applying voltage to the second subset; and

determining a position of an object based at least on the first and second values, the position indicating a projection of a portion of the object over a surface of the sensor.

20. The method of claim 19 , wherein:

the plurality of electrodes comprises first, second, third, fourth, and fifth electrodes;

the first subset comprises the first, second, and third electrodes;

the second subset comprises the second, third, and fourth electrodes; and

the third subset comprises the third, fourth, and fifth electrodes.

21. The method of claim 19 , further comprising:

connecting each electrode of a third subset of the plurality of electrodes, wherein the third subset includes one or more electrodes included in the first and second subsets, includes one or more electrodes not included in the first and second subsets, and does not include one or more electrodes included in the first and second subsets;

applying voltage to the third subset after connecting each electrode of the third subset; and

determining a third value associated with a capacitance of the third subset after applying voltage to the third subset;

wherein the determination of the position of the object is based further on the third value.

22. The method of claim 19 , wherein:

determining the first value comprises measuring a first voltage associated with the first subset after the application of voltage to the first subset; and

determining the second value comprises measuring a second voltage associated with the second subset after the application of voltage to the second subset.

23. The method of claim 19 , wherein the determination of the first and second values utilizes self-capacitance measurements.

Assignments (14)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2019
From: MICROCHIP TECHNOLOGY INC.; ATMEL CORPORATION; MICROCHIP TECHNOLOGY GERMANY GMBH
To: NEODRÓN LIMITED
Reel/Frame 048259/0840 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0884 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0937 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2013
From: ATMEL TECHNOLOGIES U.K. LIMITED
To: ATMEL CORPORATION
Reel/Frame 031112/0251 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2013
From: BRUNET, SAMUEL; COLLINS, RICHARD PAUL; HRISTOV, LUBEN; STAVELY, PAUL
To: ATMEL TECHNOLOGIES U.K. LIMITED
Reel/Frame 030914/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2013
From: MYREN, STEINAR; PEDERSEN, TROND JARLE
To: ATMEL CORPORATION
Reel/Frame 030913/0796 →
Continuity (1)
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