Imaging systems with crosstalk calibration pixels
View Patent ↗An image sensor may include crosstalk calibration pixels. Crosstalk calibration pixels may include exposed pixels and shielded pixels. Exposed pixels may be partially or completely surrounded by shielded pixels. Calibration pixels may be formed in a checkerboard pattern of alternating shielded and exposed pixels or a double checkerboard pattern of alternating pairs of shielded and exposed pixels. Exposed pixels may have apertures of various size in a shielding layer that shields the shielded pixels from light. Signals generated by exposed and shielded pixels may be used in assessing pixel optical and electrical crosstalk and indirectly deducing the spectral composition of incoming light for particular locations in a pixel array. Information about local crosstalk across the array may be used in coordinate dependent color correction matrices, white balance algorithms, luminance and chroma noise cancellation, edge sharpening, assessment of pixel implantation depth, and measuring a modulation transfer function.
1. An image sensor, comprising:
an array of image sensor pixels, wherein the array of image sensor pixels includes a calibration region having crosstalk calibration pixels, wherein the crosstalk calibration pixels comprise:
a plurality of shielded crosstalk calibration pixels; and
two exposed crosstalk calibration pixels that share an edge, wherein all other edges of the two exposed crosstalk calibration pixels are shared with the plurality of shielded crosstalk calibration pixels.
2. The image sensor defined in claim 1 wherein the crosstalk calibration pixels in the calibration region include a double checkerboard pattern of alternating pairs of exposed crosstalk calibration pixels and pairs of shielded crosstalk calibration pixels.
3. The image sensor defined in claim 1 wherein the crosstalk calibration pixels in the calibration region further comprise:
at least one single exposed crosstalk calibration pixel that is completely surrounded by shielded crosstalk calibration pixels.
4. The image sensor defined in claim 1 , further comprising:
a substrate, wherein the crosstalk calibration pixels each include a photodiode formed in the substrate; and
a metal layer that blocks incoming light from reaching the photodiodes of the plurality of shielded crosstalk calibration pixels, wherein the metal layer includes openings over the photodiode of each of the exposed crosstalk calibration pixels.
5. The image sensor defined in claim 4 wherein each of the exposed crosstalk calibration pixels has a lateral size and wherein the opening has a width that is equal to the lateral size.
6. The image sensor defined in claim 4 wherein each of the exposed crosstalk calibration pixels has a lateral size and wherein the opening has a width that is smaller than the lateral size.
7. The image sensor defined in claim 4 wherein the metal layer includes an additional opening over the photodiode of at least one additional exposed crosstalk calibration pixel, wherein each of the exposed crosstalk calibration pixels and the at least one additional exposed crosstalk calibration pixel have a common lateral size, wherein the opening has a width that is equal to the lateral size, and wherein the additional opening has a width that is smaller than the lateral size.
8. The image sensor defined in claim 1 , further comprising:
an additional calibration region having additional crosstalk calibration pixels, wherein the additional crosstalk calibration pixels include at least one additional exposed crosstalk calibration pixel and at least one additional shielded crosstalk calibration pixel.
9. The image sensor defined in claim 8 wherein the calibration region is located at a first location in the array of image sensor pixels and wherein the additional calibration region is located at a second location in the array of image sensor pixels that is separate from the first location.
10. An imaging system, comprising:
an image sensor having crosstalk calibration pixels that include two exposed crosstalk calibration pixels that share an edge, wherein all other edges of the two exposed crosstalk calibration pixels are shared with associated shielded crosstalk calibration pixels; and
processing circuitry configured to process signals from the two exposed crosstalk calibration pixels and the associated shielded crosstalk calibration pixels to deduce a spectral content of incoming light.
11. The imaging system defined in claim 10 wherein the processing circuitry is configured to process the signals from the two exposed crosstalk calibration pixels and the associated shielded crosstalk calibration pixels to determine an amount of crosstalk between the two exposed crosstalk calibration pixels and the associated shielded crosstalk calibration pixels.
12. The imaging system defined in claim 10 wherein the processing circuitry is configured to adjust system operations based on the processed signals and wherein the system operations include image edge sharpening operations and color correction operations.
13. The imaging system defined in claim 10 wherein the processing circuitry is configured to process the signals from the two exposed crosstalk calibration pixels and the associated shielded crosstalk calibration pixels to determine a modulation transfer function.
14. A system, comprising:
a central processing unit;
memory;
a lens;
input-output circuitry; and
an imaging device, wherein the imaging device comprises:
an array of image sensor pixels, wherein the array of image sensor pixels includes a calibration region having crosstalk calibration pixels, wherein the crosstalk calibration pixels comprise:
shielded crosstalk calibration pixels; and
a pair of directly adjacent unshielded crosstalk calibration pixels, wherein all exterior sides of the pair are shared with the shielded crosstalk calibration pixels;
processing circuitry configured to process signals from the pair of directly adjacent unshielded crosstalk calibration pixels and the shielded crosstalk calibration pixels to determine an amount of crosstalk between the pair of directly adjacent unshielded crosstalk calibration pixels and the shielded crosstalk calibration pixels.
15. The system defined in claim 14 wherein the shielded crosstalk calibration pixels are covered by a metal layer in a dielectric stack.
16. The imaging system defined in claim 10 , wherein the processing circuitry is further configured to apply color correction matrices to image data based on the deduced spectral content of incoming light.