IP Library Patent Application 13975359
Patent Application
App. No. 13/975,359

PRESSURE SENSOR DEVICE AND ASSEMBLY METHOD

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Quick Facts
Patent No.
US None
App. No.
13/975,359
Abstract

A semiconductor sensor device is assembled using a pre-molded lead frame having first and second die flags. The first die flag includes a cavity. A pressure sensor die (P-cell) is mounted within the cavity and a master control unit die (MCU) is mounted to the second flag. The P-cell and MCU are electrically connected to leads of the lead frame with bond wires. The die attach and wire bonding steps are each done in a single pass. A mold pin is placed over the P-cell and then the MCU is encapsulated with a mold compound. The mold pin is removed leaving a recess that is next filled with a gel material. Finally a lid is placed over the P-cell and gel material. The lid includes a hole that that exposes the gel-covered active region of the pressure sensor die to ambient atmospheric pressure outside the sensor device.

Claims (28)

1 . A semiconductor sensor device comprising:

a pre-molded lead frame having a plurality of leads and at least first and second die flags, wherein the first die flag has a cavity formed therein;

a pressure sensor die attached within the cavity of the first die flag, and at least one other die mounted to second die flag;

first bond wires electrically interconnecting the pressure sensor die with first ones of the leads of the lead frame, and second bond wires electrically interconnecting the at least one other die with second ones of the leads of the lead frame;

mold compound encapsulating the at least one other die and the second bond wires;

pressure sensitive gel covering an active region of the pressure sensor die and the first bond wires; and

a lid mounted over the pressure sensor die, wherein the lid has a hole that exposes the gel covered active region of the pressure sensor die to ambient atmospheric pressure outside the sensor device.

2 . The sensor device of claim 1 , wherein at least one lead of the lead frame is wire bonded to both the pressure sensor die and the at least one other die.

3 . The sensor device of claim 1 , wherein the lid fits into a seat formed in the mold compound.

4 . The sensor device of claim 1 , wherein the at least one other die comprises a master control unit (MCU).

5 . The sensor device of claim 4 , further comprising an acceleration sensor die mounted to the ASIC die, wherein the acceleration sensor die is electrically connected to the MCU with third bond wires.

6 . A method for assembling a semiconductor sensor device, the method comprising:

providing a pre-molded lead frame having a first die flag and a second die flag, wherein the first die flag has cavity formed therein;

die bonding a pressure sensor die within the cavity of the first die flag and a master control unit die (MCU) to a surface of the second die flag, wherein die bonding of the pressure sensor die and the MCU is done in a single pass;

electrically connecting the pressure sensor die to first leads of the lead frame with first bond wires, and electrically connecting the MCU to second leads of the lead frame with second bond wires;

placing a mold pin over the pressure sensor die and the first bond wires;

encapsulating the MCU and the second bond wires with a mold compound;

removing the mold pin whereby a recess in the mold compound surrounding the pressure sensor die is formed; and

applying pressure sensitive gel in the recess to cover an active region of the pressure sensor die.

7 . The method of claim 6 , further comprising:

mounting a lid over the gel-covered pressure sensor die, wherein the lid has a hole that exposes the gel-covered active region of the pressure sensor die to ambient atmospheric pressure outside the sensor device.

8 . The method of claim 7 , wherein the lid is mounted within recesses in the mold compound such that a top surface of the lid is flush with a top surface of the mold compound.

9 . The method of claim 6 , further comprising mounting an accelerometer die on a surface of the MCU and electrically connecting the accelerometer die with the MCU with third bond wires.

10 . The method of claim 6 , wherein the mold pin comprises a lower portion having an outer dimension and defining a cavity and an upper portion having an outer dimension larger than the outer dimension of the lower portion; and

the encapsulating step includes applying the mold compound to a level higher than the lower portion of the mold pin, such that the upper portion forms a seat in the mold compound configured to snugly receive the lid.

11 . The method of claim 6 , wherein at least one of the first leads is a same lead as one of the second leads.

12 . The method of claim 6 , further comprising:

separating the sensor device from one or more other instances of the sensor device assembled simultaneously with the sensor device.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PCT NUMBERS IB2013000664, US2013051970, US201305935 PREVIOUSLY RECORDED AT REEL: 037444 FRAME: 0787. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Oct 17, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 040450/0715 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0787 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0874 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 13, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 031627/0158 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 13, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031627/0201 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2013
From: YOW, KAI YUN; EU, POH LENG; FOONG, CHEE SENG; KALANDAR, NAVAS KHAN ORATTI; TAN, LAN CHU
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 031076/0929 →