IP Library Granted Patent US 9,218,955
Granted Patent B2
US 9,218,955 · App. 14/027,799 · Granted Dec 22, 2015

Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium

Inventors: Ryota Sasajima (Toyama, JP); Yoshinobu Nakamura (Toyama, JP); Kazuyuki Okuda (Toyama, JP)
Assignee: HITACHI KOKUSAI ELECTRIC INC.
H01L21/02126C23C16/30C23C16/45538H01L21/0228H01L21/02211H01L21/02274H01L21/67
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Quick Facts
Patent No.
US 9,218,955
App. No.
14/027,799
Granted
Dec 22, 2015
Kind
B2
Abstract

A method of manufacturing a semiconductor device includes forming a thin film containing a predetermined element, oxygen, carbon, and nitrogen on a substrate by performing a cycle a predetermined number of times. The cycle includes supplying a predetermined element-containing gas to the substrate; supplying a carbon-containing gas and a plasma-excited inert gas to the substrate; supplying an oxidizing gas to the substrate; and supplying a nitriding gas to the substrate.

Claims (48)

1. A method of manufacturing a semiconductor device, comprising forming a thin film containing a predetermined element, oxygen, carbon, and nitrogen on a substrate by performing a cycle a predetermined number of times, the cycle comprising:

(a) supplying a predetermined element-containing gas to the substrate;

(b) supplying a carbon-containing gas and a plasma-excited inert gas to the substrate, wherein the carbon-containing gas is supplied to the substrate from a first supply part in a first direction parallel to a surface of the substrate and the plasma-excited inert gas is supplied to the substrate from a second supply part in a second direction parallel to the surface of the substrate;

(c) supplying an oxidizing gas to the substrate;

(d) supplying a nitriding gas to the substrate; and

(e) supplying a carbon-containing gas to the substrate,

wherein, the cycle includes performing in the order of the (e), the (a), the (b), the (c) and the (d).

2. The method of claim 1 ,

wherein the act of forming the thin film is performed while the substrate is accommodated in a process chamber, and

in the (b), the carbon-containing gas is supplied into the process chamber from the first supply part, and the plasma-excited inert gas is supplied into the process chamber from the second supply part.

3. The method of claim 2 , wherein in the (b), the carbon-containing gas and the plasma-excited inert gas are mixed in the process chamber.

4. The method of claim 3 , wherein in the (b), the carbon-containing gas and the plasma-excited inert gas are mixed in the process chamber and then supplied to the substrate.

5. The method of claim 1 , wherein at least a portion of the carbon-containing gas is activated by the plasma-excited inert gas.

6. The method of claim 1 , wherein the carbon-containing gas is excited by heat and supplied from the first supply part, and

at least a portion of the carbon-containing gas excited by heat is activated by the plasma-excited inert gas.

7. The method of claim 1 , wherein the predetermined element comprises a semiconductor element or a metal element.

8. The method of claim 1 , wherein the predetermined element comprises silicon.

9. The method of claim 1 , wherein the carbon-containing gas is excited by heat and supplied from the first supply part and mixed with the plasma-excited inert gas such that there is an exchange of energy between the heat-excited carbon-containing gas and the plasma-excited inert gas.

10. The method of claim 1 , wherein the carbon-containing gas is excited by heat and supplied from the first supply part and at least a portion of the heat-excited carbon-containing gas is further activated to a second level by the plasma-excited inert gas.

11. A substrate processing apparatus, comprising:

a process chamber configured to accommodate a substrate;

a predetermined element-containing gas supply system configured to supply a predetermined element-containing gas to the substrate in the process chamber;

a carbon-containing gas supply system configured to supply a carbon-containing gas to the substrate in the process chamber;

an oxidizing gas supply system configured to supply an oxidizing gas to the substrate in the process chamber;

a nitriding gas supply system configured to supply a nitriding gas to the substrate in the process chamber;

an inert gas supply system configured to supply an inert gas to the substrate in the process chamber;

an exciting unit configured to plasma-excite a gas; and

a control unit configured to control the predetermined element-containing gas supply system, the carbon-containing gas supply system, the oxidizing gas supply system, the nitriding gas supply system, the inert gas supply system and the exciting unit such that a thin film containing the predetermined element, oxygen, carbon and nitrogen is formed on the substrate in the process chamber by performing a cycle a predetermined number of times, the cycle comprising:

(a) supplying the predetermined element-containing gas to the substrate in the process chamber;

(b) supplying the carbon-containing gas and the plasma-excited inert gas to the substrate in the process chamber, wherein the carbon-containing gas is supplied to the substrate from a first supply part in a first direction parallel to a surface of the substrate and the plasma-excited inert gas is supplied to the substrate from a second supply part in a second direction parallel to the surface of the substrate;

(c) supplying the oxidizing gas to the substrate in the process chamber;

(d) supplying the nitriding gas to the substrate in the process chamber; and

(e) supplying a carbon-containing gas to the substrate,

wherein, the cycle includes performing in the order of the (e), the (a), the (b), the (c) and the (d).

12. A non-transitory computer-readable recording medium storing a program that causes a computer to perform a process of forming a thin film containing a predetermined element, oxygen, carbon and nitrogen on a substrate in a process chamber by performing a cycle a predetermined number of times, the cycle comprising:

(a) supplying a predetermined element-containing gas to the substrate in the process chamber;

(b) supplying a carbon-containing gas and a plasma-excited inert gas to the substrate in the process chamber, wherein the carbon-containing gas is supplied to the substrate from a first supply part in a first direction parallel to a surface of the substrate and the plasma-excited inert gas is supplied to the substrate from a second supply part in a second direction parallel to the surface of the substrate;

(c) supplying an oxidizing gas to the substrate in the process chamber;

(d) supplying a nitriding gas to the substrate in the process chamber; and

(e) supplying a carbon-containing gas to the substrate,

wherein, the cycle includes performing in the order of: the (e), the (a), the (b), the (c) and the (d).

13. A method of manufacturing a semiconductor device, comprising forming a thin film containing a predetermined element, oxygen, carbon, and nitrogen on a substrate by performing a cycle a predetermined number of times, the cycle comprising:

(a) supplying a predetermined element-containing gas to the substrate;

(b) supplying a carbon-containing gas and a plasma-excited inert gas to the substrate, wherein the carbon-containing gas is supplied to the substrate from a first supply part in a first direction parallel to a surface of the substrate and the plasma-excited inert gas is supplied to the substrate from a second supply part in a second direction parallel to the surface of the substrate;

(c) supplying an oxidizing gas to the substrate;

(d) supplying a nitriding gas to the substrate; and

(e) supplying a carbon-containing gas to the substrate,

wherein the cycle includes performing in the order of: the (e), the (a), the (c), the (b) and the (d).

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2018
From: HITACHI KOKUSAI ELECTRIC INC.
To: KOKUSAI ELECTRIC CORPORATION
Reel/Frame 047995/0490 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2013
From: SASAJIMA, RYOTA; NAKAMURA, YOSHINOBU; OKUDA, KAZUYUKI
To: HITACHI KOKUSAI ELECTRIC INC.
Reel/Frame 031810/0151 →
Priority Claims (1)
JP 2012-207602 · Sep 20, 2012 · national
Continuity (1)
Related Publication 20140080319A1 · Mar 20, 2014