IP Library Granted Patent US 9,040,335
Granted Patent B2
US 9,040,335 · App. 14/029,783 · Granted May 26, 2015

Side vented pressure sensor device

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Quick Facts
Patent No.
US 9,040,335
App. No.
14/029,783
Granted
May 26, 2015
Kind
B2
Abstract

A semiconductor sensor device has a pressure sensing die and at least one other die mounted on a substrate, and electrical interconnections that interconnect the pressure sensing die and the at least one other die. An active region of the pressure sensing die is covered with a pressure sensitive gel material, and a cap having a cavity is mounted over the pressure sensing die such that the pressure sensing die is positioned within the cavity. The cap has a side vent hole that exposes the gel covered active region of the pressure sensing die to ambient atmospheric pressure outside the sensor device. Molding compound on an upper surface of the substrate encapsulates the at least one other die and at least a portion of the cap.

Claims (33)

1. A method of assembling a semiconductor sensor device, the method comprising:

mounting a pressure sensing die and at least one other die on a substrate;

electrically interconnecting the pressure sensing die and the at least one other die;

covering an active region of the pressure sensing die with pressure sensitive gel material;

mounting a cap having a cavity formed therein over the pressure sensing die, wherein:

the pressure sensing die is positioned within the cavity; and

the cap has a side vent stack formed thereon;

encapsulating the at least one other die and at least a portion of the cap with a molding compound on an upper surface of the substrate; and

singulating through the substrate and the molding compound such that at least a portion of the side vent stack is severed from the cap, thereby forming a vent opening in the cap that exposes the gel-covered active region of the pressure sensing die to ambient atmospheric pressure outside the sensor device.

2. The method of claim 1 , wherein the encapsulating step comprises encapsulating all of the cap with the molding compound.

3. The method of claim 1 , wherein the encapsulating step comprises encapsulating all but a top of the cap with the molding compound.

4. The method of claim 1 , wherein:

the at least one other die comprises a micro-control unit (MCU) and an acceleration sensor die;

mounting the at least one other die on the substrate comprises mounting the MCU on the substrate and mounting the acceleration-sensing die on the MCU; and

the method further comprises electrically connecting the acceleration-sensing die to the MCU.

5. The method of claim 1 , further comprising assembling an other sensor device on the substrate adjacent to the sensor device, wherein performing the singulation through the substrate and the molding compound separates the sensor device from the other sensor device.

6. The method of claim 5 , wherein performing the singulation through the substrate and the molding compound leaves a portion of the side vent stack in molding compound of the other sensor device.

7. A semiconductor sensor device comprising:

a substrate;

a pressure sensing die and at least one other die mounted on a top side of the substrate;

electrical interconnections between the pressure sensing die and the at least one other die;

pressure sensitive gel material covering an active region of the pressure sensing die;

a cap having a cavity formed therein mounted over the pressure sensing die, wherein:

the pressure sensing die is positioned within the cavity such that the pressure sensing die is enclosed inside the cap and the substrate; and

the cap has a side vent hole formed thereon that exposes the gel covered active region of the pressure sensing die to ambient atmospheric pressure outside the sensor device, wherein the side vent hole is located between a top side of the cap and the top side of the substrate and extends in a plane parallel to said top sides; and

molding compound on an upper surface of the substrate encapsulating the at least one other die and at least a portion of the cap.

8. The sensor device of claim 7 , further comprising a vent stack formed on a side of the cap, wherein the side vent hole is formed in the vent stack.

9. The sensor device of claim 7 , further comprising at least a portion of a vent stack encapsulated in the molding compound, wherein the portion of the vent stack corresponds to a side vent hole of another sensor device that was separated from the sensor device during assembly by sawing through the vent stack of the other sensor device.

10. The sensor device of claim 7 , wherein the sensor device implements one of (i) a land grid array (LGA) and (ii) a ball grid array (BGA) type surface-mount package.

11. The sensor device of claim 7 , wherein the molding compound encapsulates all but the side vent hole of the cap.

12. The sensor device of claim 7 , wherein the molding compound encapsulates all but the side vent hole and a top of the cap.

13. The sensor device of claim 7 , wherein the at least one other die comprises a micro-control unit (MCU).

14. The sensor device of claim 13 , further comprising an acceleration-sensing die mounted on the MCU, wherein the acceleration-sensing die is electrically connected to the MCU.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PCT NUMBERS IB2013000664, US2013051970, US201305935 PREVIOUSLY RECORDED AT REEL: 037444 FRAME: 0787. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Oct 17, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 040450/0715 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0787 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0874 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 13, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 13, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2013
From: LOW, BOON YEW; FOONG, CHEE SENG; BENG, LAU TECK
To: FREESCALE SEMICONDUCTOR, INC.
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