IP Library Granted Patent US 9,166,106
Granted Patent B2
US 9,166,106 · App. 14/059,950 · Granted Oct 20, 2015

Nanowire sized opto-electronic structure and method for modifying selected portions of same

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Quick Facts
Patent No.
US 9,166,106
App. No.
14/059,950
Granted
Oct 20, 2015
Kind
B2
Abstract

A LED structure includes a support and a plurality of nanowires located on the support, where each nanowire includes a tip and a sidewall. A method of making the LED structure includes reducing or eliminating the conductivity of the tips of the nanowires compared to the conductivity of the sidewalls during or after creation of the nanowires.

Claims (30)

1. A method of making a LED structure that comprises a support and a plurality of nanowires located on the support, wherein each nanowire comprises a tip and a sidewall, wherein the method comprises reducing or eliminating the conductivity of the tips of the nanowires compared to the conductivity of the sidewalls during or after creation of the nanowires;

further comprising controlling nanowire growth conditions such that conductivity of the tips is reduced by at least one order of magnitude compared to the conductivity of the tips without the controlling of nanowire growth conditions;

wherein reducing or eliminating the conductivity of the tips comprises forming an insulating layer over the nanowires after the creation of the nanowires, wherein the insulating layer is formed over an array of nanowires so that the insulating layer is layered on the tips and the sidewalls, then the array is subjected to etching under conditions that removes all or part of the insulating layer on the sidewalls but that leaves at least a larger thickness part of the insulating layer on the tips, and the insulating layer comprises SiOx.

2. The method of claim 1 wherein at least one of:

(a) the SiOx comprises SiO2;

(b) the formed insulating layer has a larger thickness on the tips than on the sidewalls; and

(c) the etching comprises anisotropic etching.

3. A method of making a LED structure that comprises a support and a plurality of nanowires located on the support, wherein each nanowire comprises a tip and a sidewall, wherein the method comprises reducing or eliminating the conductivity of the tips of the nanowires compared to the conductivity of the sidewalls during or after creation of the nanowires;

further comprising controlling nanowire growth conditions such that conductivity of the tips is reduced by at least one order of magnitude compared to the conductivity of the tips without the controlling of nanowire growth conditions;

wherein the nanowires comprise a first conductivity type semiconductor core and a second conductivity type semiconductor shell, and the sidewalls and tips comprise the second conductivity type semiconductor shell formed as successive layers of lower conductivity material and higher conductivity material, wherein the higher conductivity material preferentially forms on the sidewalls compared to the tips.

4. The method of claim 3 further comprising forming a highly resistive material on the tips but not on the sidewalls of the nanowires.

5. The method of claim 4 wherein the highly resistive material is selectively formed on the tips after the shell is completed.

6. The method of claim 4 wherein the highly resistive material is selectively formed on the tips before the shell is completed.

7. The method of claim 6 wherein the highly resistive material comprises pGaN that comprises 2-5% Mg and is grown by MOCVD using a V/III ratio of 10-50.

8. The method of claim 3 wherein the first conductivity type semiconductor nanowire core is enclosed by the second conductivity type semiconductor shell for forming a pn or pin junction that in operation provides an active region for light generation, wherein the first conductivity type comprises n-type, the second conductivity type comprises p-type.

9. The method of claim 3 wherein the nanowire core is grown during production of the array of nanowires from a support that comprises an n-type buffer layer, wherein the support further comprises a dielectric masking layer, such that cores protrude from the buffer layer through openings in the masking layer, and the shells are located on the masking layer.

10. The method of claim 9 wherein at least one of:

(a) the support further comprises a substrate layer beneath the buffer layer and the substrate layer comprises Al 2 O 3 ; and

(b) the support further comprises a reflective layer and the reflective layer comprises Ag.

11. A method of making a LED structure that comprises a support and a plurality of nanowires located on the support, wherein each nanowire comprises a tip and a sidewall, wherein the method comprises reducing or eliminating the conductivity of the tips of the nanowires compared to the conductivity of the sidewalls during or after creation of the nanowires, the nanowires comprise a first conductivity type semiconductor core and a second conductivity type semiconductor shell, and the sidewalls and tips comprise the second conductivity type semiconductor shell formed as successive layers of lower conductivity material and higher conductivity material, wherein the higher conductivity material preferentially forms on the sidewalls compared to the tips wherein at least one of:

(a) the lower conductivity material comprises p-AlGaN and the higher conductivity material comprises p-GaN;

(b) the shell is formed to provide a plurality of the lower conductivity layers and a plurality of the higher conductivity layers on the sidewalls;

(c) the shell is formed to provide only a combined lower conductivity layer comprised of multiple films of the lower conductivity material on the tips;

(d) the shell is formed to provide a plurality of the lower conductivity layers and a plurality of the higher conductivity layers on the tips, wherein the thickness of the higher conductivity layers on the tips is less than that on the sidewalls, such that the tips are less conductive than the sidewalls; and

(e) the tips are nonconductive.

12. The method of claim 11 wherein: (a) the lower conductivity material comprises p-AlGaN and the higher conductivity material comprises p-GaN.

13. The method of claim 11 wherein: (b) the shell is formed to provide the plurality of the lower conductivity layers and the plurality of the higher conductivity layers on the sidewalls.

14. The method of claim 11 wherein: (c) the shell is formed to provide only the combined lower conductivity layer comprised of multiple films of the lower conductivity material on the tips.

15. The method of claim 11 wherein: (d) the shell is formed to provide the plurality of the lower conductivity layers and the plurality of the higher conductivity layers on the tips, wherein the thickness of the higher conductivity layers on the tips is less than that on the sidewalls, such that the tips are less conductive than the sidewalls.

16. The method of claim 11 wherein: (e) the tips are nonconductive.

Assignments (10)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2024
From: GLO TECHNOLOGIES LLC
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 068297/0220 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2023
From: SYSONAN, INC.
To: GLO TECHNOLOGIES LLC
Reel/Frame 065178/0210 →
CHANGE OF NAME Recorded Oct 5, 2023
From: NANOSYS, INC.
To: SYSONAN, INC.
Reel/Frame 065156/0416 →
TERMINATION AND RELEASE OF PATENT SECURITY AGREEMENT RECORDED AT REEL 059569 / FRAME 0840 Recorded Sep 7, 2023
From: FORTRESS CREDIT CORP.,
To: NANOSYS, INC.
Reel/Frame 064836/0263 →
SECURITY INTEREST Recorded Apr 1, 2022
From: NANOSYS, INC.
To: FORTRESS CREDIT CORP., AS AGENT
Reel/Frame 059569/0840 →
NUNC PRO TUNC ASSIGNMENT Recorded Aug 13, 2021
From: GLO AB
To: NANOSYS, INC.
Reel/Frame 057184/0564 →
RELEASE OF SECURITY INTEREST Recorded Apr 12, 2021
From: HERCULES CAPITAL, INC.
To: GLO AB
Reel/Frame 057210/0690 →
SECURITY INTEREST Recorded Jan 23, 2019
From: GLO AB
To: HERCULES CAPITAL INC.
Reel/Frame 048110/0063 →
ASSIGNMENT OF IP SECURITY AGREEMENT Recorded Dec 12, 2018
From: GLO AB
To: HERCULES CAPITAL, INC., AS ADMINISTRATIVE AGENT
Reel/Frame 049042/0527 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2015
From: SVENSSON, CARL PATRIK THEODOR; GARDNER, NATHAN
To: GLO AB
Reel/Frame 035905/0994 →