IP Library Granted Patent US 9,510,120
Granted Patent B2
US 9,510,120 · App. 14/066,767 · Granted Nov 29, 2016

Apparatus and method for testing sound transducers

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Quick Facts
Patent No.
US 9,510,120
App. No.
14/066,767
Granted
Nov 29, 2016
Kind
B2
Abstract

In one embodiment, an apparatus for testing sound transducers includes a test socket having at least one acoustic generator and at least one sound monitoring device integrated therein. In one embodiment, the test socket includes a well for holding the sound transducer during test, the well being in communication with the at least one acoustic generator and the at least one sound receiving device.

Claims (42)

1. An apparatus for testing a sound transducer comprising:

a test socket having a first major surface and a sidewall surface, the first major surface being configured to hold a first sound transducer, the test socket further comprising:

a first passage;

a second passage spaced apart from the first passage; and

a sound channel extending between the first passage, the second passage, and the first major surface, the sound passage configured to pass sound waves;

a first sound generator disposed within the first passage and configured to be in communication with the first sound transducer; and

a first sound receiving device disposed within the second passage and configured to monitor output of the first sound generator through the sound channel.

2. The apparatus of claim 1 , wherein the test socket has a second major surface opposite to the first major surface, the apparatus further comprising a plurality of electrical connect structures extending from the first major surface to the second major surface.

3. The apparatus of claim 2 , wherein the electrical connect structure comprises spring-loaded pins.

4. The apparatus of claim 1 , wherein the test socket includes a recessed well disposed in the first major surface configured for holding the first sound transducer.

5. The apparatus of claim 1 , wherein the first sound receiving device comprises a microphone.

6. The apparatus of claim 1 , wherein the test socket is configured so that the first sound transducer and the first sound receiving device are substantially equidistant from the first sound generator when the first sound transducer is under test.

7. The apparatus of claim 1 further comprising a test board, wherein the test socket is coupled to the test board, and wherein the test board is configured for connecting the apparatus to an automated test device.

8. The apparatus of claim 1 further comprising:

a second generator incorporated into the test socket and configured to be in communication with a second sound transducer; and

a second sound receiving device incorporated into the test socket and configured to monitor output of the second sound generator.

9. The apparatus of claim 1 , wherein:

the first passage is disposed extending inward from a first portion of the sidewall surface,

the second passage is disposed extending inward from a second portion of the sidewall surface; and

the sound channel comprises a generally horizontal portion extending between the first passage and the second passage and a generally vertical portion extending between the generally horizontal portion and the first major surface of the test socket.

10. The apparatus of claim 9 , wherein the sound channel has a generally circular cross-sectional shape, and wherein the second portion of the sidewall surface is opposite to the first portion of the sidewall surface.

11. An apparatus for testing an electronic device having a sound transducer comprising:

a socket configured to hold the electronic device, the socket having a sound passage configured to pass sound waves;

a sound driver disposed within a first passage in the socket, the sound driver configured to be in audio communication with the electronic device through the sound passage; and

a sound receiver disposed within a second passage in the socket, the sound receiver configured to monitor audio output of the sound driver through the sound passage.

12. The apparatus of claim 11 , wherein:

the socket comprises a first major surface configured to hold the electronic device and a sidewall surface;

the first passage is disposed extending inward from a first portion of the sidewall surface,

the second passage is disposed extending inward from a second portion of the sidewall surface;

the sound passage comprises a generally horizontal portion extending between the first passage and the second passage and a generally vertical portion extending between the generally horizontal portion and the first major surface of the socket; and

the sound passage is configured such that a surface of the electronic device and the sound receiver are substantially equidistant from the sound driver when electronic device is under test.

13. The apparatus of claim 11 further comprising a plurality of electrical connect devices within the socket configured to carry electrical signals to and from the electronic device.

14. The apparatus of claim 11 further comprising a test board, wherein the socket is coupled to the test board.

15. The apparatus of claim 11 , wherein the socket comprises a machined work piece.

16. A method for testing a sound transducer comprising:

placing a sound transducer onto a test socket, the test socket having an acoustic generator and a sound receiving device integrated therein, wherein the acoustic generator is in audio communication with the sound transducer through an audio passage in the test socket;

applying sound pressure from the acoustic generator to the sound transducer through the audio passage; and

monitoring the sound pressure with the sound receiving device.

17. The method of claim 16 , wherein placing the sound transducer comprises placing the sound transducer within a well of the test socket, the test socket further comprising at least one electrical connect structure for carrying electrical signals between the sound transducer and a test system.

18. The method of claim 17 further comprising measuring electrical signals from the sound transducer.

19. The method of claim 16 further comprising applying a downward force to the sound transducer.

20. The method of claim 16 , wherein placing the sound transducer comprises placing a micro-machined microphone, and wherein placing the micro-machined microphone comprises placing the micro-machined microphone onto the test socket, wherein the audio passage is configured such that the micro-machined microphone and the sound receiving device are substantially equidistant from the acoustic generator.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2020
From: AMKOR TECHNOLOGY, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE.LTD.
Reel/Frame 054046/0673 →
SECURITY INTEREST Recorded Aug 1, 2018
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A., AS AGENT
Reel/Frame 046683/0139 →
PATENT SECURITY AGREEMENT Recorded May 7, 2015
From: AMKOR TECHNOLOGY, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 035613/0592 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2013
From: JOHN, GERARD
To: AMKOR TECHNOLOGY, INC.
Reel/Frame 031506/0832 →