IP Library Granted Patent US 9,012,263
Granted Patent B1
US 9,012,263 · App. 14/069,103 · Granted Apr 21, 2015

Method for treating a bond pad of a package substrate

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Quick Facts
Patent No.
US 9,012,263
App. No.
14/069,103
Granted
Apr 21, 2015
Kind
B1
Abstract

A method of making a package substrate having a copper bond pad and a location for receiving a semiconductor die having a remnant of one of a group consisting of HEDP and an HEDP derivative on a top surface of the copper bond pad. The semiconductor die is attached to the substrate. A wirebond connection is attached between the remnant and the semiconductor die.

Claims (43)

1. A method of making a packaged device having a substrate, a copper bond pad on the substrate, and a semiconductor die, comprising:

preparing a top surface of the copper bond pad by removing copper oxide from the top surface;

applying a solution to the top surface to result in a treated top surface of the bond pad, wherein the solution comprises one of a group consisting of 1-Hydroxyethylidene-1, 1-Diphosphonic Acid (HEDP) and an HEDP alkyl derivative;

attaching the semiconductor die to the substrate; and

attaching a wirebond connection between the treated bond pad and the semiconductor die.

2. The method of claim 1 , wherein:

the applying the solution comprises dipping the substrate in a bath containing the solution.

3. The method of claim 1 , wherein:

the applying the solution comprises spraying the solution on the treated top surface.

4. The method of claim 1 , wherein:

the applying the solution is a self limiting process by which a protective layer is formed having a thickness that is self-limited.

5. The method of claim 1 , wherein:

the applying the solution is further characterized by the solution further comprising a surfactant.

6. The method of claim 5 , wherein:

the applying the solution is further characterized by the surfactant being non-ionic.

7. The method of claim 5 , wherein:

the applying the solution is further characterized by the surfactant comprising polyethylene glycol.

8. The method of claim 1 , wherein:

the applying the solution is further characterized by the solution further comprising a pH changing agent.

9. The method of claim 8 , wherein:

the applying the solution is further characterized by the pH changing agent comprising an acid or an alkaline substance.

10. The method of claim 1 , wherein the preparing the top surface comprises:

performing a clean of the top surface; and

removing the copper oxide using an etchant.

11. The method of claim 10 , wherein the removing the copper oxide using an etchant comprises using an acid as the etchant.

12. The method of claim 10 , wherein the removing the copper oxide using an etchant comprises using one of a group consisting of citric acid and malic acid.

13. A method of making a packaged device, comprising:

obtaining a substrate having a copper bond pad having a remnant of one of a group consisting of 1-Hydroxyethylidene-1, 1-Diphosphonic Acid (HEDP) and an HEDP derivative on a top surface of the copper bond pad;

attaching a semiconductor die to the substrate; and

attaching a wirebond connection between the remnant and the semiconductor die.

14. The method of claim 13 , wherein the attaching the wirebond connection is further characterized by the wirebond connection comprising a stitch bond contacting the bond pad through the remnant.

15. The method of claim 13 , wherein the obtaining the substrate is further characterized by the remnant being a monolayer.

16. A method of making a package substrate having a copper bond pad and a location for receiving a semiconductor die, comprising:

preparing a top surface of the copper bond pad by removing copper oxide from the top surface; and

applying a solution to the top surface to result in a treated top surface of the bond pad, wherein the solution comprises one of a group consisting of 1-Hydroxyethylidene-1, 1-Diphosphonic Acid (HEDP) and an HEDP alkyl derivative.

17. The method of claim 16 , wherein:

the applying the solution comprises dipping the substrate in a bath containing the solution.

18. The method of claim 16 , wherein:

the applying the solution comprises spraying the solution on the treated top surface.

19. The method of claim 16 , wherein:

the applying the solution is a self limiting process by which a protective layer is formed having a thickness that is self-limited.

20. The method of claim 16 , wherein:

the applying the solution is further characterized by the solution further comprising a surfactant.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE FILING AND REMOVE APPL. NO. 14085520 REPLACE IT WITH 14086520 PREVIOUSLY RECORDED AT REEL: 037515 FRAME: 0390. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Mar 1, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037926/0642 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT APPL. NO. 14/085,520 PREVIOUSLY RECORDED AT REEL: 037515 FRAME: 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037879/0581 →
CORRECTIVE ASSIGNMENT OF INCORRECT NUMBER 14085520 PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTON OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037785/0568 →
CORRECTIVE ASSIGNMENT OF INCORRECT PATENT APPLICATION NUMBER 14085520 ,PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0399. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037785/0454 →
CORRECTIVE ASSIGNMENT OF INCORRECT APPL. NO. 14/085,520 PREVIOUSLY RECORDED AT REEL: 037515 FRAME: 0390. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037792/0227 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL 037458 FRAME 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Jan 14, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037515/0420 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL 037458 FRAME 0399. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Jan 14, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
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To: MORGAN STANLEY SENIOR FOUNDING, INC.
Reel/Frame 037458/0420 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FOUNDING, INC.
Reel/Frame 037458/0399 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0790 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 13, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., COLLATERAL AGENT
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From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 13, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2014
From: MATHEW, VARUGHESE; CARPENTER, BURTON J.; HIGGINS III, LEO M.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 031943/0040 →