IP Library Granted Patent US 9,166,702
Granted Patent B2
US 9,166,702 · App. 14/070,816 · Granted Oct 20, 2015

Signal level detect circuit with reduced loss-of-signal assertion delay

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Quick Facts
Patent No.
US 9,166,702
App. No.
14/070,816
Granted
Oct 20, 2015
Kind
B2
Abstract

A signal level detect circuit configured to assess an input signal with varying amplitude signal levels and to generate an indicator signal includes an input circuit configured to receive the input signal and to process the input signal, the input circuit including a first node on which the input signal is sampled; a comparator configured to compare the processed input signal to a signal level threshold and generate a comparator output signal; and an active discharge circuit configured to provide a first discharge current to the first node in response to the comparator output signal. The comparator output signal changes from a low output state to a high output state in response to the comparator input signal, and the active discharge circuit generates the first discharge current to discharge the sampled input signal on the first node after the comparator output signal changes to the high output state.

Claims (44)

1. A signal level detect circuit configured to assess an input signal with varying amplitude signal levels on an input terminal and to generate an indicator signal indicative of the presence and absence of a valid signal at the input terminal, the signal level detect circuit comprising:

an input circuit configured to receive the input signal and to process the input signal, the input circuit comprising a first node on which the input signal is sampled;

a comparator configured to receive the sampled input signal as a comparator input signal and to compare the sampled input signal to a signal level threshold where an amplitude level of the comparator input signal being above the signal level threshold is indicative of the valid signal and the amplitude level of the comparator input signal being below the signal level threshold is indicative of an invalid signal, the comparator generating a comparator output signal, wherein the valid signal is a data signal having a logical low state and a logical high state, and the invalid signal is not a data signal and does not have a logical low or logical high state;

an output circuit configured to receive the comparator output signal and to generate the indicator signal having a first logical level indicating the presence of the valid signal at the input terminal and having a second logical level indicating the absence of the valid signal at the input terminal; and

an active discharge circuit configured to provide a first discharge current to the first node in response to the comparator output signal,

wherein the comparator output signal changes from a low output state to a high output state in response to the comparator input signal having an amplitude level above the signal level threshold, and the active discharge circuit generates the first discharge current to discharge the sampled input signal on the first node in response to the comparator output signal changing to the high output state indicating the detection of the presence of the valid signal at the input terminal.

2. The signal level detect circuit of claim 1 , wherein the comparator output signal has an analogue output characteristic comprising a step transition in response to the comparator input signal being at the signal level threshold and a sloped transition from the low output state to the high output state outside the step transition.

3. The signal level detect circuit of claim 1 , wherein the active discharge circuit generates the first discharge current in response to the comparator input signal having an amplitude level above the signal level threshold plus a positive, non-zero offset margin.

4. The signal level detect circuit of claim 1 , wherein the active discharge circuit is further configured to provide a second discharge current to the first node in response to the sampled input signal having an amplitude level at or above a reference voltage, the second discharge current being provided to discharge the sampled input signal on the first node to clamp the amplitude level of the sampled input signal to the reference voltage.

5. The signal level detect circuit of claim 4 , wherein the active discharge circuit generates the first and second discharge currents as sinking currents.

6. The signal level detect circuit of claim 5 , wherein the input circuit comprises:

a rectifier configured to receive and amplify the input signal; and

a RC filter circuit configured to filter the amplified input signal, the RC filter circuit comprising a resistor and a capacitor,

wherein the first and second discharge currents sink current out of the first node being the top plate of the capacitor.

7. The signal level detect circuit of claim 4 , wherein the active discharge circuit generates the first and second discharge currents as sourcing currents to the first node.

8. The signal level detect circuit of claim 7 , wherein the input circuit comprises:

a rectifier configured to receive and amplify the input signal; and

a RC filter circuit configured to filter the amplified input signal, the RC filter circuit comprising a resistor and a capacitor,

wherein the first and second discharge currents source current to the first node being the bottom plate of the capacitor.

9. The signal level detect circuit of claim 1 , wherein the active discharge circuit comprises:

a first voltage source configured to introduce an offset voltage to the comparator output signal, the offset voltage being applied to the comparator output signal to introduce a positive, nonzero offset margin to the signal level threshold of the comparator; and

a first operational amplifier having an input terminal configured to receive the offset-added comparator output signal and an output terminal generating the first discharge current,

wherein the first operational amplifier generates the first discharge current in response to the comparator output signal changing from the low output state to the high output state in response to the input signal exceeding the signal level threshold plus the positive, nonzero offset margin.

10. The signal level detect circuit of claim 4 , wherein the active discharge circuit comprises:

a first voltage source configured to introduce an offset voltage to the comparator output signal, the offset voltage being applied to the comparator output signal to introduce a positive, nonzero offset margin to the signal level threshold of the comparator;

a first operational amplifier having an input terminal configured to receive the offset-added comparator output signal and an output terminal generating the first discharge current, wherein the first operational amplifier generates the first discharge current in response to the comparator output signal changing from the low output state to the high output state in response to the input signal exceeding the signal level threshold plus the positive, nonzero offset margin;

a second voltage source configured to introduce the reference voltage to the sampled input signal; and

a second operational amplifier having an input terminal configured to receive the reference-voltage-added sampled input signal and an output terminal generating the second discharge current, wherein the second operational amplifier generates the second discharge current in response to the sampled input signal having an amplitude level at or above the reference voltage.

11. The signal level detect circuit of claim 10 , wherein the first voltage source comprises a first resistor and the second voltage source comprises a second resistor.

12. The signal level detect circuit of claim 10 , wherein the first and second operation amplifier comprise differential operational amplifiers.

13. A method to access an input signal with varying amplitude signal levels on an input terminal and to generate an indicator signal indicative of the presence and absence of a valid signal at the input terminal, the method comprising:

sampling the input signal into a first node;

comparing the sampled input signal to a signal level threshold where an amplitude level of the sampled input signal being above the signal level threshold is indicative of the valid signal and the amplitude level of the comparator input signal being below the signal level threshold is indicative of an invalid signal, wherein the valid signal is a data signal having a logical low state and a logical high state, and the invalid signal is not a data signal and does not have a logical low or logical high state;

changing a comparator output signal from a low output state to a high output state in response to the sampled input signal having an amplitude level above the signal level threshold;

generating the indicator signal in response to the comparator output signal, the indicator signal having a first logical level indicating the presence of the valid signal at the input terminal and having a second logical level indicating the absence of the valid signal at the input terminal; and

providing a first discharge current to the first node to discharge the sampled input signal after the comparator output signal changes to the high output state indicating the detection of the presence of the valid signal at the input terminal.

14. The method of claim 13 , further comprising:

detecting the sampled input signal having an amplitude level at or above a reference voltage; and

providing a second discharge current to the first node to discharge the sampled input signal and to clamp the amplitude level of the sampled input signal to the reference voltage in response to the detecting.

15. The method of claim 13 , wherein comparing the sampled input signal to a signal level threshold comprises comparing the sampled input signal to a signal level threshold plus a positive, non-zero offset margin.

16. The method of claim 13 , wherein providing a first discharge current to the first node to discharge the sampled input signal comprises providing a sinking current as the first discharge current to the first node to discharge the sampled input signal.

17. The method of claim 14 , wherein providing a second discharge current to the first node to discharge the sampled input signal comprises providing a sinking current as the second discharge current to the first node to discharge the sampled input signal.

18. The method of claim 13 , wherein providing a first discharge current to the first node to discharge the sampled input signal comprises providing a sourcing current as the first discharge current to the first node to cause the first node to be discharged.

19. The method of claim 14 , wherein providing a second discharge current to the first node to discharge the sampled input signal comprises providing a sourcing current as the second discharge current to the first node to cause the first node to be discharged.

Assignments (10)
INTELLECTUAL PROPERTY BUY-IN AGREEMENT/ASSIGNMENT Recorded Apr 4, 2023
From: MICREL LLC
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 063241/0771 →
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2013
From: BRUEDIGAM, ULRICH; KAPUCIJA, TOMISLAV
To: MICREL, INC.
Reel/Frame 031536/0592 →