IP Library Granted Patent US 9,134,193
Granted Patent B2
US 9,134,193 · App. 14/098,559 · Granted Sep 15, 2015

Stacked die sensor package

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Quick Facts
Patent No.
US 9,134,193
App. No.
14/098,559
Granted
Sep 15, 2015
Kind
B2
Abstract

A stacked die sensor package includes a die paddle and lead fingers that surround the die paddle. The lead fingers have proximal ends near the die paddle and distal ends spaced from the die paddle. A first semiconductor die is mounted to one side of the die paddle and electrically connected to the lead fingers with first bond wires. A sensor die is mounted to the other side of the die paddle and electrically connected to the lead fingers with sensor bond wires. An encapsulation material covers the first die and the first bond wires, while a gel material and a lid cover the sensor die and the sensor bond wires. The package may also have a second semiconductor die attached on an active surface of the first die and electrically connected one or both of the lead fingers or first die bonding pads with second bond wires.

Claims (43)

1. A stacked die sensor package, comprising:

a die paddle having a first side and an opposite second side;

lead fingers that surround the die paddle, each lead finger having a proximal end near a respective edge of the die paddle and a distal end providing an external electrical connection for the package;

a first semiconductor die having an active surface with first die bonding pads and an opposite die mount surface attached to the first side of the die paddle;

a sensor die having a sensor active surface with sensor die bonding pads and an opposite sensor surface attached to the second side of the die paddle;

sensor bond wires selectively electrically connecting the sensor die bonding pads to the proximal ends of the lead fingers;

die bond wires selectively electrically connecting the first die bonding pads to the proximal ends of the lead fingers;

an encapsulating material that covers the first semiconductor die and the die bond wires, wherein the encapsulating material has an outer package base surface and an opposite planar surface and the lead fingers distal ends are exposed from the encapsulating material at the outer package base surface for providing the external electrical connections, and the lead fingers proximal ends are exposed from the encapsulating material at the opposite planar surface; and

a footed lid mounted to the opposite planar surface of the encapsulating material and covering the sensor die and the sensor bond wires, wherein the footed lid includes a hole in a surface thereof.

2. The stacked die sensor package of claim 1 , further comprising a second semiconductor die mounted on the active surface of the first semiconductor die.

3. The stacked die sensor package of claim 2 , further comprising second die bonding wires selectively electrically connecting bonding pads of the second semiconductor die to the proximal ends of the lead fingers.

4. The stacked die sensor package of claim 1 , wherein at least one of the proximal ends provides an internal package connection between one of the sensor bonding pads and one of the first die bonding pads.

5. The stacked die sensor package of claim 1 , further comprising:

a gel material that covers the sensor die and the sensor bond wires.

6. The stacked die sensor package of claim 1 , wherein each lead finger proximal end has a first wire bonding side and a second wire bonding side, and wherein the first wire bonding side is coplanar with the first side of the die paddle and the second wire bonding side is coplanar with the opposite second side of the die paddle.

7. The stacked die sensor package of claim 6 , wherein the first die bond wires are bonded to the first wire bonding side and the sensor bond wires are bonded to the second wire bonding side.

8. The stacked die sensor package of claim 5 , wherein the gel material is a non-electrically conductive gel.

9. The stacked die sensor package of claim 5 , wherein the gel material is disposed within a chamber formed by the footed lid.

10. A tire pressure monitoring system, comprising:

a die paddle having a first side and an opposite second side;

lead fingers that surround the die paddle, each lead finger having a proximal end near a respective edge of the die paddle and a distal end further from the die paddle and for providing an external electrical connection for the system;

a controller die having an active surface with first die bonding pads and an opposite die mount surface that is attached to the first side of the die paddle;

an acceleration sensor die having an active surface with second die bonding pads and an opposite mounting surface attached to the active surface of the controller die;

a pressure sensor die having a sensor active surface with sensor die bonding pads and an opposite back side surface attached to the second side of the die paddle;

pressure sensor bond wires selectively electrically connecting the sensor die bonding pads to the proximal ends of the lead fingers;

controller die bond wires selectively electrically connecting the first die bonding pads to the proximal ends of the lead fingers;

acceleration sensor bond wires selective electrically connecting the second die bonding pads to the first die bonding pads;

an encapsulating material that covers the controller die, the acceleration sensor die, the controller die bond wires and the acceleration sensor bond wires, wherein the encapsulating material has an outer package base surface and a planar inner package base surface and wherein the distal ends of the lead fingers are exposed from the encapsulating material at the outer package base surface for providing the external electrical connections, and the proximal ends of the lead fingers are exposed from the encapsulating material at the planar inner package surface to allow attachment of the pressure sensor bond wires thereto;

a non-conductive gel material covering the pressure sensor die and the pressure sensor bond wires; and

a footed lid attached to the planar inner package surface of the encapsulating material and covering the pressure sensor die, the pressure sensor bond wires and the gel material, and wherein the lid has a hole in a surface thereof to facilitate operation of the pressure sensor die.

11. A method for assembling a stacked die sensor package, the method comprising:

providing an electrically conductive lead frame sheet that has a plurality of lead frames, each of the lead frames having an outer frame surrounding a die paddle with a first side and an opposite second side, the die paddle being supported from the outer frame by tie bars, and wherein each of the lead frames has lead fingers each with a proximal end near a respective edge of the die paddle and a distal end adjacent and integral with the outer frame;

attaching a first semiconductor die to the first side of the die paddle of one of the lead frames, the first semiconductor die having an active surface with first die bonding pads and an opposite die mount surface that is attached to the first side of the die paddle;

selectively electrically connecting the first die bonding pads to the proximal ends of the lead fingers with first die bond wires;

encapsulating the first semiconductor die and first die bond wires with an encapsulating material, wherein the encapsulating material forms an outer package base surface and an opposite planar surface and wherein each lead finger distal end is exposed from the encapsulating material at the outer package base surface and each lead finger proximal end is exposed from the encapsulating material at the opposite planar surface;

attaching a sensor die to the second side of the die paddle, the sensor die having a sensor active surface with sensor bonding pads and an opposite sensor surface attached to the second side of the die paddle;

selectively electrically connecting the sensor bonding pads to the proximal ends of the lead fingers with sensor bond wires;

covering the sensor die and the sensor bond wires with a footed lid mounted to the opposite planar surface of the encapsulating material, wherein the footed lid includes a hole in a surface thereof; and

separating the outer frame from the lead fingers and tie bars.

12. The method for assembling of claim 11 , further comprising mounting a second semiconductor die on the active surface of the first semiconductor die.

13. The method for assembling of claim 12 , further comprising selectively electrically connecting bonding pads on an active surface of the second semiconductor die to the proximal ends of the lead fingers with second die bonding wires.

14. The method for assembling of claim 12 , further comprising selectively electrically connecting bonding pads on an active surface of the second semiconductor die to the first die bonding pads with second die bonding wires.

15. The method for assembling of claim 11 , wherein covering the sensor die further includes covering the sensor die and the sensor bond wires with a gel material.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE FILING AND REMOVE APPL. NO. 14085520 REPLACE IT WITH 14086520 PREVIOUSLY RECORDED AT REEL: 037515 FRAME: 0390. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Mar 1, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037926/0642 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT APPL. NO. 14/085,520 PREVIOUSLY RECORDED AT REEL: 037515 FRAME: 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037879/0581 →
CORRECTIVE ASSIGNMENT OF INCORRECT NUMBER 14085520 PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTON OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037785/0568 →
CORRECTIVE ASSIGNMENT OF INCORRECT PATENT APPLICATION NUMBER 14085520 ,PREVIOUSLY RECORDED AT REEL: 037458 FRAME: 0399. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037785/0454 →
CORRECTIVE ASSIGNMENT OF INCORRECT APPL. NO. 14/085,520 PREVIOUSLY RECORDED AT REEL: 037515 FRAME: 0390. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 11, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037792/0227 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL 037458 FRAME 0420. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Jan 14, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037515/0420 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL 037458 FRAME 0399. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Jan 14, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FOUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FOUNDING, INC.
Reel/Frame 037458/0399 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0790 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 13, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 13, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 13, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 8, 2013
From: FOONG, CHEE SENG; BENG, LAU TECK; TOOK, SHENG PING
To: FREESCALE SEMICONDUCTOR, INC.
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