Granted Patent B2

US 9,240,224 · App. 14/102,666 · Granted Jan 19, 2016

Abstract

Claims (40)

1. A method of soft programming a non-volatile memory (NVM) array, comprising:

determining a first number of soft program pulses based on a temperature of the NVM array;

applying the first number of soft program pulses to a section of the NVM array; and

performing a first soft program verify of the section of the NVM array for a first time after completing the applying the first number of soft program pulses.

2. The method of claim 1 further comprising:

if the performing the first soft program verify determines soft program was not successful, applying an additional soft program pulse to the section of the NVM array followed by a soft program verification.

3. The method of claim 1 , further comprising:

determining if the first number should be updated based on a number of soft program pulses required to successfully soft program a block of the NVM array.

4. The method of claim 1 , further comprising:

if the performing the first soft program verify determines soft program of the section of the NVM was not successful, performing soft program verifies after the first number of soft program pulses are again applied until a determination that the soft programming has been successful.

5. The method of claim 1 , further comprising:

if the performing the first soft program verify determines a soft program of the section of the NVM was successful, incrementing to a next section of the NVM array and performing soft program verifies after the first number of soft program pulses are applied until a determination that the soft program has been successful.

6. The method of claim 4 , wherein the determining is further characterized by the first number being further based on a number of program/erase cycles already performed on a block of the NVM array that includes the section of the NVM array.

7. The method of claim 1 , wherein the determining is further characterized by the first number being further based on a number of program/erase cycles already performed on a block of the NVM array that includes the section of the NVM array.

8. The method of claim 1 , wherein the determining is further characterized by the first number being selected from a plurality of numbers, wherein each number of the plurality of numbers corresponds to a corresponding temperature range of a plurality of temperature ranges.

9. The method of claim 8 , wherein the determining is further characterized by each of the plurality of numbers being affected by changes in the number of pulses required to achieve a soft program state at the corresponding temperature range.

10. The method of claim 9 , wherein the determining is further characterized by each of the plurality of numbers being a percentage of the number of pulses required to achieve a soft program at the corresponding temperature range.

11. The method of claim 1 , wherein:

performing compaction on the NVM array before commencing the applying the first number of soft program pulses.

12. A non-volatile memory (NVM), comprising:

an NVM array;

charge pumps that provide a power supply for use in generating soft program pulses;

a temperature sensor that provides a signal indicative of a temperature of the NVM array;

a controller, coupled to the NVM array, the temperature sensor, and the charge pumps that:

determines a first number of soft program verifies to skip based on a temperature of the NVM array;

applies soft program pulses to a first section of the NVM array; and

performs, for a first time after the first number of soft program pulses to skip has been reached, a soft program verify of the first section of the NVM array.

13. The NVM of claim 12 , wherein if the controller determines the first soft program verify was not successful, the controller alternately applies soft program pulses and performs the soft program verify until a determination that the soft program verify on the section has been successful.

14. The NVM of claim 13 , wherein the first number of performances of the soft program verifies to skip is further based on a number of program/erase cycles already performed on a block of the NVM array that includes the first section of the NVM array.

15. The NVM of claim 14 , wherein the first number of performance of the soft program verify to skip is selected from a plurality of numbers, wherein each of the plurality of numbers correspond to a different temperature range.

16. The method of claim 15 , wherein at least one of the plurality of numbers is affected by changes in how many pulses are required to achieve a soft program state at the temperature range to which the at least one of the plurality of numbers corresponds.

17. The method of claim 16 , wherein at least one of the plurality of numbers is a percentage of how many pulses are required to achieve a soft program state at the temperature range to which the at least one of the plurality of numbers corresponds.

18. A method of soft programming a non-volatile memory (NVM) array, comprising;

determining a first number of soft program pulses to apply before performing a soft program verify for a section of the NVM array based on a temperature of the NVM array;

applying the first number of soft program pulses to the NVM array; and

in response to applying the soft program pulses to the section of the NVM array, verifying whether the section of the NVM array has been successfully soft programmed.

19. The method of claim 18 , further comprising, if the section of the NVM array has not been successfully soft programmed:

applying an additional soft program pulse to the section of the NVM array; and

verifying if the section of the NVM array has been successfully soft programmed after the additional soft program pulse has been applied.

20. The method of claim 18 , wherein the determining is further characterized by basing a number of soft program pulses to apply on a number of program/erase cycles previously performed on a block of the NVM array that includes the section of the NVM array.

Assignments (30)