METHOD, COMPUTER PROGRAM PRODUCT, AND APPARATUS FOR SIMULATING ELECTROMAGNETIC IMMUNITY OF AN ELECTRONIC DEVICE
There is disclosed a method of simulating Electromagnetic (EM) immunity of an electronic device, comprising applying a disturbing signal on at least one first entry point of a model of the device and monitoring a disturbed signal on at least one observation point of said model of the device; and, automatically varying the frequency and the level of the disturbing signal stepwise until a default is just detected in the disturbed signal, wherein at each frequency and level step, a simulation is run up to a dwell time and resulting simulation data is examined for a default condition.
1 . A method of simulating Electromagnetic, EM, immunity of an electronic device, comprising:
applying a disturbing signal on at least one first entry point of a model of the device and monitoring a disturbed signal on at least one observation point of said model of the device;
automatically varying the frequency and the level of the disturbing signal stepwise until a default is just detected in the disturbed signal, wherein at each frequency and level step, a simulation is run up to a dwell time and resulting simulation data is examined for a default condition.
2 . The method of claim 1 wherein simulations are run at each frequency for respective levels of the disturbing signal, either increasing up to a given maximum level or decreasing down to a given minimum level, and, when a default is just detected, said simulations at said frequency are stopped and the corresponding level is stored, and new simulations are started at a next frequency with a level reduced or increased, respectively, by a first given quantity from the stored level.
3 . The method of claim 2 , wherein the simulations at a given frequency are stopped when the level reaches the maximum level or minimum level, respectively, without a default being detected, and new simulations are started at the next frequency with a level reduced by a second given quantity from the maximum specified level or increased by said second defined quantity from the minimum specified level, respectively.
4 . The method of claim 1 wherein, before applying the disturbing signal, a first simulation is run with no disturbing signal until a given time at which it is considered that a steady state of the device has been reached, and then data of the undisturbed signal at the observation point of the device over the dwell time are stored for use for the following simulations.
5 . The method of claim 4 wherein the data of the undisturbed signal at the observation point of the device are used to generate limits around the undisturbed signal, said limits corresponding to given deviations in level and time from the undisturbed signal and being stored to be used for the following simulations.
6 . The method of claim 5 wherein, at each frequency and level step, the simulation is run and resulting data of the disturbed signal at a given number of simulation instants over the dwell time is compared with the limits at corresponding instants and a default condition is considered to be met if, for at least one instant, said data exceeds said limits.
7 . The method of claim 6 wherein, at each frequency and level step, the number of simulation instants at which data of the disturbed signal is compared with the limits is adjusted depending on the nearness of the disturbed signal to the limits.
8 . The method of claim 5 wherein the quantity of change of level from one simulation to the other is adjusted depending on the nearness of the disturbed signal to the limits.
9 . The method of claim 6 wherein, when a default is detected, a delay of the disturbing signal for subsequent simulations at a next frequency is adjusted depending on the simulation instant at which the default has been detected within the dwell time.
10 . (canceled)
11 . Apparatus for simulating Electromagnetic, EM, immunity of an electronic device, comprising:
a simulator module configured to apply a disturbing signal on at least one first entry point of a model of the device and monitor a disturbed signal on at least one observation point of said model of the device automatically vary the frequency and the level of the disturbing signal stepwise until a default is just detected in the disturbed signal, wherein at each frequency and level step, a simulation is run up to a dwell time and resulting simulation data is examined for a default condition.
12 . The apparatus of claim 11 wherein the simulator module is further configured so that simulations are run at each frequency for respective levels of the disturbing signal, either increasing up to a given maximum level or decreasing down to a given minimum level, and so that, when a default is just detected, said simulations at said frequency are stopped and the corresponding level is stored, and new simulations are started at a next frequency with a level reduced or increased, respectively, by a first given quantity from the stored level.
13 . The apparatus of claim 12 , wherein the simulator module is further configured so that the simulations at a given frequency are stopped when the level reaches the maximum level or minimum level, respectively, without a default being detected, and so that new simulations are started at the next frequency with a level reduced by a second given quantity from the maximum specified level or increased by said second defined quantity from the minimum specified level, respectively.
14 . The apparatus of claim 11 wherein the simulator module is further configured so that, before applying the disturbing signal, a first simulation is run with no disturbing signal until a given time at which it is considered that a steady state of the device has been reached, and then data of the undisturbed signal at the observation point of the device over the dwell time are stored for use for the following simulations.
15 . The apparatus of claim 14 wherein the simulator module is further configured so that the data of the undisturbed signal at the observation point of the device are used to generate limits around the undisturbed signal, said limits corresponding to given deviations in level and time from the undisturbed signal and being stored to be used for the following simulations.
16 . The apparatus of claim 15 wherein the simulator module is further configured so that, at each frequency and level step, the simulation is run and resulting data of the disturbed signal at a given number of simulation instants over the dwell time is compared with the limits at corresponding instants and a default condition is considered to be met if, for at least one instant, said data exceeds said limits.
17 . The apparatus of claim 16 wherein the simulator module is further configured so that, at each frequency and level step, the number of simulation instants at which data of the disturbed signal is compared with the limits is adjusted depending on the nearness of the disturbed signal to the limits.
18 . The apparatus of claim 15 wherein the simulator module is further configured so that the quantity of change of level from one simulation to the other is adjusted depending on the nearness of the disturbed signal to the limits.
19 . The apparatus of claim 16 wherein the simulator module is further configured so that, when a default is detected, a delay of the disturbing signal for subsequent simulations at a next frequency is adjusted depending on the simulation instant at which the default has been detected within the dwell time.
20 . The method of claim 2 wherein, before applying the disturbing signal, a first simulation is run with no disturbing signal until a given time at which it is considered that a steady state of the device has been reached, and then data of the undisturbed signal at the observation point of the device over the dwell time are stored for use for the following simulations.
21 . The apparatus of claim 12 wherein the simulator module is further configured so that, before applying the disturbing signal, a first simulation is run with no disturbing signal until a given time at which it is considered that a steady state of the device has been reached, and then data of the undisturbed signal at the observation point of the device over the dwell time are stored for use for the following simulations.