IP Library › Granted Patent US 10,125,412
Granted Patent B2
US 10,125,412 · App. 14/112,903 · Granted Nov 13, 2018

Compositional variations of tungsten tetraboride with transition metals and light elements

Inventors: Richard B. Kaner (Pacific Palisades, CA); Sarah H. Tolbert (Encino, CA); Reza Mohammadi (Los Angeles, CA); Andrew T. Lech (Los Angeles, CA); Miao Xie (Los Angeles, CA)
Assignee: The Regents of the University of California
C22C27/04B22F9/04C22C1/02C22C1/045C22C1/1084C22C29/14C23C30/00C23C30/005B22F2005/001B22F2009/041
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Quick Facts
Patent No.
US 10,125,412
App. No.
14/112,903
Granted
Nov 13, 2018
Kind
B2
Abstract

A composition includes tungsten (W); at least one element selected form the group of elements consisting of boron (B), beryllium (Be) and silicon (Si); and at least one element selected from the group of elements consisting of titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), zinc (Zn), zirconium (Zr), niobium (Nb), molybdenum (Mo), ruthenium (Ru), hafnium (Hf), tantalum (Ta), rhenium (Re), osmium (Os), iridium (Ir), lithium (Li) and aluminum (Al). The composition satisfies the formula W 1-x M x X y wherein X is one of B, Be and Si; M is at least one of Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Ru, Hf, Ta, Re, Os, Ir, Li and Al; x is at least 0.001 and less than 0.999; and y is at least 4.0. A tool is made from or coated with this composition.

Claims (24)

1. A composition, comprising:

tungsten (W);

at least one element selected from the group of elements consisting of boron (B), beryllium (Be) and silicon (Si); and

at least one element selected from the group of elements consisting of titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), zinc (Zn), zirconium (Zr), niobium (Nb), molybdenum (Mo), ruthenium (Ru), hafnium (Hf), tantalum (Ta), osmium (Os), iridium (Ir), lithium (Li) and aluminum (Al),

wherein said composition satisfies the formula

W 1-x M x X y

wherein X is B,

wherein M is at least one of Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Ru, Hf, Ta, Os, Ir, Li and Al,

wherein x is at least 0.001 and less than 0.999,

wherein y is about 4.0, and

wherein the composition is a crystalline solid characterized by at least one X-ray diffraction pattern reflection at 2 theta=24.2±0.2.

2. A composition according to claim 1 , wherein M is one of Ta, Mn, Cr, Ta and Mn, or Ta and Cr.

3. A composition according to claim 1 , wherein x is at least 0.001 and less than 0.6.

4. A composition according to claim 1 , wherein M is Ta, and x is at least 0.001 and less than 0.05.

5. A composition according to claim 4 , wherein x is about 0.02.

6. A composition according to claim 1 , wherein M is Mn, and x is at least 0.001 and less than 0.4.

7. A composition according to claim 1 , wherein M is Cr, and x is at least 0.001 and less than 0.6.

8. A composition according to claim 1 , wherein M is Ta and Cr.

9. A composition according to claim 1 , wherein M is Ta and Cr, and x is from 0.02 to 0.1.

10. A composition according to claim 1 , wherein the crystalline solid is further characterized by at least one X-ray diffraction pattern reflection at 2 theta=34.5±0.2 or 45.1±0.2.

11. A composition according to claim 1 , wherein the crystalline solid is further characterized by at least one X-ray diffraction pattern reflection at 2 theta=28.1±0.2, 42.5±0.2, or 55.9±0.2.

12. A composition according to claim 1 , wherein the crystalline solid is further characterized by at least one X-ray diffraction pattern reflection at 2 theta=47.5±0.2, 61.8±0.2, 69.2±0.2, 69.4±0.2, 79.7±0.2, 89.9±0.2, or 110.2±0.2.

13. A composition according to claim 1 , wherein the crystalline solid is further characterized by at least two X-ray diffraction pattern reflections at 2 theta=28.1±0.2, 34.5±0.2, 42.5±0.2, 45.1±0.2, 47.5±0.2, 55.9±0.2, 61.8±0.2, 69.2±0.2, 69.4±0.2, 79.7±0.2, 89.9±0.2, or 110.2±0.2.

14. A composition according to claim 1 , wherein the crystalline solid is further characterized by at least five X-ray diffraction pattern reflections at 2 theta=28.1±0.2, 34.5±0.2, 42.5±0.2, 45.1±0.2, 47.5±0.2, 55.9±0.2, 61.8±0.2, 69.2±0.2, 69.4±0.2, 79.7±0.2, 89.9±0.2, or 110.2±0.2.

Assignments (2)
CONFIRMATORY LICENSE Recorded Aug 5, 2014
From: UNIVERISITY OF CALIFORNIA LOS ANGELES
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 033471/0570 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2013
From: KANER, RICHARD B.; TOLBERT, SARAH H.; MOHAMMADI, REZA; LECH, ANDREW T.; XIE, MIAO
To: THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
Reel/Frame 031647/0448 →
Continuity (2)
Provisional Application 61478276 · Apr 22, 2011
Related Publication 20140041313A1 · Feb 13, 2014
Cited By (7)
US 12,227,853 US 12,378,647 US 12,569,942 US 12,649,963 US 12,655,068 US 12,668,495 US 12,692,578