Compositional variations of tungsten tetraboride with transition metals and light elements
A composition includes tungsten (W); at least one element selected form the group of elements consisting of boron (B), beryllium (Be) and silicon (Si); and at least one element selected from the group of elements consisting of titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), zinc (Zn), zirconium (Zr), niobium (Nb), molybdenum (Mo), ruthenium (Ru), hafnium (Hf), tantalum (Ta), rhenium (Re), osmium (Os), iridium (Ir), lithium (Li) and aluminum (Al). The composition satisfies the formula W 1-x M x X y wherein X is one of B, Be and Si; M is at least one of Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Ru, Hf, Ta, Re, Os, Ir, Li and Al; x is at least 0.001 and less than 0.999; and y is at least 4.0. A tool is made from or coated with this composition.
1 . A composition comprising a compound of a formula W1-xMxBy and a second metal element, wherein:
W is tungsten;
B is boron;
M comprises at least one element selected from the group of elements consisting of titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), zinc (Zn), zirconium (Zr), niobium (Nb), molybdenum (Mo), ruthenium (Ru), hafnium (Hf), tantalum (Ta), osmium (Os), iridium (Ir), Rhenium (Re), lithium (Li), and aluminum (Al);
x is from about 0.001 to about 0.999;
y is about 4.0;
the second metal element is Co, Ni, Cu, or any combination thereof; and
W1-xMxBy is a crystalline solid characterized by at least one X-ray diffraction pattern reflection at 2 theta=24.2±0.2.
2 . The composition according to claim 1 , wherein M comprises Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Ru, Hf, Ta, Os, Ir, Re, or any combination thereof.
3 . The composition according to claim 1 , wherein M comprises Ti, V, Cr, Mn, Fe, Zn, Zr, Nb, Mo, Ru, Hf, Ta, Os, Ir, Re, or any combination thereof.
4 . The composition according to claim 1 , wherein M comprises Ti, V, Cr, Mn, Zr, Nb, Mo, Hf, Ta, Re, or any combination thereof.
5 . The composition according to claim 1 , wherein M comprises V, Cr, Mn, Nb, Mo, Ta, Re, or any combination thereof.
6 . The composition according to claim 1 , wherein M comprises Nb, Ta, Mo, Re, or any combination thereof.
7 . The composition according to claim 1 , wherein M comprises Ta, Mn, Cr, or any combination thereof.
8 . The composition according to claim 1 , wherein M comprises V and x is from about 0.001 to about 0.3.
9 . The composition according to claim 1 , wherein M comprises Mo and x is from about 0.001 to about 0.05.
10 . The composition according to claim 1 , wherein M comprises Cr and x is from about 0.01 to about 0.15.
11 . The composition according to claim 1 , wherein x is from about 0.001 to about 0.6.
12 . The composition according to claim 1 , wherein x is from about 0.001 to about 0.4.
13 . The composition according to claim 1 , wherein x is from about 0.01 to about 0.3.
14 . The composition according to claim 1 , wherein x is from about 0.01 to about 0.1.
15 . The composition according to claim 1 , wherein x is from about 0.001 to about 0.01.
16 . The composition according to claim 1 , wherein the composition comprises a crystalline solid characterized by at least one X-ray diffraction pattern reflection at 2 theta=34.5±0.2 or 45.1±0.2.
17 . The composition according to claim 1 , wherein the composition comprises a crystalline solid characterized by at least one X-ray diffraction pattern reflection at 2 theta=28.1±0.2, 42.5±0.2, or 55.9±0.2.
18 . The composition according to claim 1 , wherein the composition comprises a crystalline solid characterized by at least one X-ray diffraction pattern reflection at 2 theta=47.5±0.2, 61.8±0.2, 69.2±0.2, 69.4±0.2, 79.7±0.2, 89.9±0.2, or 110.2±0.2.
19 . The composition according to claim 1 , wherein the composition comprises a crystalline solid characterized by at least two X-ray diffraction pattern reflections at 2 theta=28.1±0.2, 34.5±0.2, 42.5±0.2, 45.1±0.2, 47.5±0.2, 55.9±0.2, 61.8±0.2, 69.2±0.2,69.4±0.2, 79.7±0.2, 89.9±0.2, or 110.2±0.2.
20 . The composition according to claim 1 , wherein the composition comprises a crystalline solid characterized by at least five X-ray diffraction pattern reflections at 2 theta=28.1±0.2, 34.5±0.2, 42.5±0.2, 45.1±0.2, 47.5±0.2, 55.9=0.2, 61.8=0.2, 69.2=0.2, 69.4±0.2, 79.7±0.2, 89.9±0.2, or 110.2±0.2.