Nanostructured device
View Patent ↗A nanostructured device according to the invention comprises a first group of nanowires protruding from a substrate where each nanowire of the first group of nanowires comprises at least one pn- or p-i-n-junction. A first contact, at least partially encloses and is electrically connected to a first side of the pn- or p-i-n-junction of each nanowire in the first group of nanowires. A second contacting means comprises a second group of nanowires that protrudes from the substrate, and is arranged to provide an electrical connection to a second side of the pn- or p-i-n-junction.
1. A method of forming a nanostructured device, comprising the steps of:
providing a substrate
growing a first group of nanowires and a second group of nanowires on the substrate or a buffer layer on the substrate,
forming a pn- or p-i-n-junction in each of the nanowires of the first and second groups of nanowires,
forming a first contact that at least partially encloses and electrically connects to a first side of the pn or p-i-n junction of each nanowire in only the first group of nanowires, and
forming a second contact that at least partly encloses only the nanowires of the second group of nanowires, whereby the second contact forms part of an electrical connection to a second side of the pn- or p-i-n-junction of each nanowire in the first group of nanowires,
wherein the second group of nanowires are electrically inactive.
2. Method of forming a nanostructured device according to claim 1 , wherein the step of growing comprises growing a shell layer enclosing the nanowires.
3. Method of forming a nanostructured device according to claim 1 , wherein the step of forming the second contact comprises uncovering the nanowire from surrounding layers on the second group of nanowires, and forming a second contact that at least partly encloses the nanowires of the second group of nanowires.
4. The method according to claim 1 , wherein the buffer layer or the substrate comprises a GaN buffer layer or a semiconductor substrate, and the second contact is in direct contact with at least one of the GaN buffer layer or the semiconductor substrate.
5. The method according to claim 1 , wherein the first and second groups of nanowires are formed simultaneously in the same process step.
6. The method according to claim 1 , wherein a nanowire core is exposed in an end portion of the second group of nanowires.
7. The method according to claim 6 , wherein a predefined portion of the nanowires of the first and second group of nanowires is removed using at least one of chemical mechanical polishing (CMP) or etching.