Systems and methods for calibrating a temperature detection module
A determination is made if a temperature of a system has exceeded a hot threshold or a cold threshold. At room temperature, a first adjustment is determined for first nominal settings. The first nominal settings are for a first input to a first comparator. At room temperature, a second adjustment is determined for second nominal settings. The second nominal settings are for a first input to a second comparator. The temperature is monitored, during normal operation of the system, using a temperature dependent voltage with the first comparator adjusted with the first adjustment and second comparator adjusted with the second adjustment.
1. A semiconductor device comprising:
a first comparator having a first input that receives a temperature dependent voltage, an output to indicate if the device has a temperature that is below a low threshold temperature, and a second input having associated therewith a first nominal voltage;
a second comparator having a first input that receives the temperature dependent voltage, an output to indicate if the device has a temperature that exceeds a high threshold temperature, and a second input having associated therewith a second nominal voltage;
a source of a plurality of voltages coupled to the voltage supply device having a plurality of outputs for providing a plurality of voltages based on a reference voltage; and
a test module that runs a test at room temperature with the first and second comparators using a first set of room temperature voltages from the source of the plurality of voltages to determine a first adjustment to the first nominal voltage that is to be applied to the second input of the first comparator during normal operation of the device at temperatures outside a range of room temperatures associated with the first set of room temperature voltages, and a second set of room temperature voltages from the source of the plurality of voltages to determine a second adjustment to the second nominal voltage that is to be applied to the second input of the second comparator during normal operation of the device at temperatures outside a range of room temperatures associated with the second set of room temperature voltages, wherein the first adjustment is determined using one of the first set of room temperature reference voltages that causes output of the first comparator to change from a high voltage to a low voltage or from a low voltage to a high voltage during the test, and wherein the second adjustment is determined using one of the second set of room temperature reference voltages that causes output of the second comparator to change from a high voltage to a low voltage or from a low voltage to a high voltage during the test.
2. The device of claim 1 , further comprising a first coupling circuit that couples an output of the source of the plurality of voltages that corresponds to a resulting voltage from the adjustment to the first nominal voltage.
3. The device of claim 2 , further comprising a second coupling circuit that couples an output of the source of the plurality of voltages that corresponds to a resulting voltage from the adjustment to the second nominal voltage.
4. The device of claim 3 , wherein the first coupling circuit comprises a first multiplexer coupled to the source of the plurality of voltages.
5. The device of claim 1 , wherein the temperature dependent voltage comprises a Vbe voltage.
6. The device of claim 1 , wherein the source of the plurality of voltages comprises a voltage divider having an upper voltage portion from which is selected an output of the source of the plurality of voltages that corresponds to a resulting voltage from the adjustment to the first nominal voltage, a lower voltage portion from which is selected an output of the source of the plurality of voltages that corresponds to a resulting voltage from the adjustment to the second nominal voltage; and a middle portion for use in determining the adjustments to the first and second nominal voltages.
7. The device of claim 6 , wherein the test module comprises a test multiplexer coupled to the middle portion of the source of the plurality of voltages and operated under control of a processor that has access to a memory.
8. The device of claim 1 , wherein the nominal voltage for the second input of the first comparator is an estimate of the reference voltage at the low threshold temperature.
9. The device of claim 8 , wherein the nominal voltage for the second input of the second comparator is an estimate of the reference voltage at the high threshold temperature.
10. The device of claim 1 , wherein the first adjustment is determined using the one of the first set of room temperature reference voltages that causes output of the first comparator to change from the high voltage to the low voltage.
11. The device of claim 1 , wherein the first adjustment is determined using the one of the first set of room temperature reference voltages that causes output of the first comparator to change from the low voltage to the low high.
12. The device of claim 1 , wherein the second adjustment is determined using the one of the second set of room temperature reference voltages that causes output of the second comparator to change from the high voltage to the low voltage.
13. The device of claim 1 , wherein the second adjustment is determined using the one of the second set of room temperature reference voltages that causes output of the second comparator to change from the low voltage to the low high.