IP Library Granted Patent US 9,202,584
Granted Patent B1
US 9,202,584 · App. 14/272,666 · Granted Dec 1, 2015

Power supply slew rate detector

Inventors: Richard Titov Saez (Campinas, BR); Walter Luis Tercariol (Campinas, BR)
Assignee: FREESCALE SEMICONDUCTOR, INC.
G11C16/28G01R19/0084G11C16/30H01L27/092
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Quick Facts
Patent No.
US 9,202,584
App. No.
14/272,666
Granted
Dec 1, 2015
Kind
B1
Abstract

In some embodiments, a power supply slew rate detector may include a filter circuit having a capacitive element operably coupled to a power supply output provided to a flash memory circuit and a resistive element operably coupled to the capacitive element and to ground, and a Schmitt trigger including an input operably coupled to a node between the capacitive element and the resistive element, the Schmitt trigger further including an output configured to indicate a slew rate of the power supply output.

Claims (26)

1. A power supply slew rate detector, comprising:

a filter circuit including a capacitive element operably coupled to a power supply output provided to a flash memory circuit, and a resistive element operably coupled to the capacitive element and to ground; and

a Schmitt trigger comprising an input operably coupled to a node between the capacitive element and the resistive element, the Schmitt trigger further comprising an output configured to indicate a slew rate of the power supply output, the Schmitt trigger further comprising:

rising trip circuitry configured to switch an output node from a first logic state to a second logic state in response to an input voltage being greater than a high threshold voltage, the rising trip circuitry including a first NMOS transistor configured to receive the high threshold voltage and a second NMOS transistor configured to receive the input voltage, the first NMOS transistor operably coupled to the second NMOS transistor through a PMOS current mirror; and

falling trip circuitry operably coupled to the rising trip circuitry and configured to switch the output node from the second logic state to a first logic state in response to the input voltage being smaller than a low threshold voltage, the falling trip circuitry including a first PMOS transistor configured to receive the low threshold voltage and a second PMOS transistor configured to receive the input voltage, the first PMOS transistor operably coupled to the second PMOS transistor through an NMOS current mirror.

2. The power supply slew rate detector of claim 1 , wherein the capacitive element includes a Metal-Oxide-Semiconductor (MOS) transistor.

3. The power supply slew rate detector of claim 1 , wherein the output is configured to identify a selected range of slew rate values.

4. The power supply slew rate detector of claim 1 , wherein the output is configured to indicate the slew rate based upon a comparison between a voltage at the node and a selected threshold voltage.

5. The power supply slew rate detector of claim 4 , wherein the threshold voltage is selected via a voltage divider as a percentage of the power supply output.

6. The power supply slew rate detector of claim 1 , wherein the PMOS current mirror is a 1:1 current mirror having two or more PMOS transistors.

7. The power supply slew rate detector of claim 1 , wherein a gate of the first NMOS transistor is configured to receive the high threshold voltage, and wherein a drain of the first NMOS transistor is operably coupled to the PMOS current mirror.

8. The power supply slew rate detector of claim 1 , wherein an output of the PMOS current mirror is operably coupled to a drain of the second NMOS transistor through a first switch, wherein a gate of the first switch is operably coupled to the output node, and wherein a gate of the second NMOS transistor is configured to receive the input voltage.

9. The power supply slew rate detector of claim 8 , wherein the first switch is another NMOS transistor having its gate operably coupled to the output node.

10. The power supply slew rate detector of claim 8 , further comprising a third NMOS transistor having a drain operably coupled to the output node, its source operably coupled to the drain of the second NMOS transistor, and its gate operably coupled to the input voltage.

11. The power supply slew rate detector of claim 8 , wherein the NMOS current mirror is a 1:1 current mirror having two or more NMOS transistors.

12. The power supply slew rate detector of claim 1 , wherein a gate of the first PMOS transistor is configured to receive the low threshold voltage, and wherein a source of the first PMOS transistor is operably coupled to the NMOS current mirror.

13. The power supply slew rate detector of claim 12 , wherein an output of the NMOS current mirror is operably coupled to a source of the second PMOS transistor through a second switch, wherein a gate of the second switch is operably coupled to the output node, and wherein a gate of the second PMOS transistor is configured to receive the input voltage.

14. The power supply slew rate detector of claim 13 , wherein the second switch is another PMOS transistor having its gate operably coupled to the output node.

15. The power supply slew rate detector of claim 14 , further comprising a third PMOS transistor having a source operably coupled to the output node, its drain operably coupled to the source of the second PMOS transistor, and its gate operably coupled to the input voltage.

16. A method, comprising:

monitoring an input voltage at a node within an RC filter operably coupled to a power supply output provided to a flash memory circuit; and

switching an output node of a Schmitt trigger from a first logic state to a second logic state in response to the input voltage meeting a threshold voltage, wherein the second logic state indicates that a slew rate of the power supply output is within a selected range of values, wherein the threshold voltage is applied to a first transistor of a first doping type and the input voltage is applied to a second transistor of the first doping type, the first and second transistors operably coupled to each other through a current mirror of a second doping type.

17. The method of claim 16 , further comprising selecting the threshold voltage via a voltage divider as a percentage of the power supply output.

18. An electronic circuit, comprising:

a power supply circuit configured to provide power to at least one of a plurality of power domains within a flash memory circuit; and

a power supply slew rate detector circuit operably coupled to the power supply circuit, the power supply slew rate detector circuit including a filter circuit having a capacitive element operably coupled to a power supply output and a resistive element operably coupled to the capacitive element and to ground, the power supply slew rate detector circuit further including a first Schmitt trigger having an input operably coupled to a node between the capacitive element and the resistive element and an output configured to indicate a first range slew rate values of the power supply output, the power supply slew rate detector circuit further including a second Schmitt trigger having an input operably coupled to the node between the capacitive element and the resistive element and an output configured to indicate a second range slew rate values of the power supply output.

Assignments (25)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 14/258,829 AND REPLACE ITWITH 14/258,629 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0082. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OFSECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0332 →
CORRECTIVE ASSIGNMENT OF INCORRECT APPLICATION 14/258,829 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0109. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0208 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0082 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0109 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0903 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0293 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0267 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033460/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2014
From: SAEZ, RICHARD TITOV; TERCARIOL, WALTER LUIS
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 032848/0085 →