IP Library Granted Patent US 9,312,589
Granted Patent B2
US 9,312,589 · App. 14/293,696 · Granted Apr 12, 2016

Coaxial waveguide microstructure having center and outer conductors configured in a rectangular cross-section

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Quick Facts
Patent No.
US 9,312,589
App. No.
14/293,696
Granted
Apr 12, 2016
Kind
B2
Abstract

Provided are coaxial waveguide microstructures. The microstructures include a substrate and a coaxial waveguide disposed above the substrate. The coaxial waveguide includes: a center conductor; an outer conductor including one or more walls, spaced apart from and disposed around the center conductor; one or more dielectric support members for supporting the center conductor in contact with the center conductor and enclosed within the outer conductor; and a core volume between the center conductor and the outer conductor, wherein the core volume is under vacuum or in a gas state. Also provided are methods of forming coaxial waveguide microstructures by a sequential build process and hermetic packages which include a coaxial waveguide microstructure.

Claims (31)

1. A coaxial waveguide microstructure, comprising:

at least one coaxial waveguide, comprising:

a center conductor;

an outer conductor comprising one or more walls, spaced apart from and disposed around the center conductor;

one or more dielectric support members for supporting the center conductor in contact with the center conductor and enclosed within the outer conductor; and

a core volume between the center conductor and the outer conductor,

wherein the core volume is under vacuum or in a gas state and wherein the center conductor and the outer conductor of the at least one coaxial waveguide each having a generally rectangular cross-sectional structure.

2. The coaxial waveguide microstructure of claim 1 , wherein the outer conductor comprises a first sidewall, and a plurality of the one or more dielectric support members have a first end portion embedded in the first sidewall and extend beneath the center conductor.

3. The coaxial waveguide microstructure of claim 2 , wherein the outer conductor comprises a second sidewall opposite the first sidewall, and a second plurality of the one or more dielectric support members have a first end portion embedded in the second sidewall and extend beneath the center conductor.

4. The coaxial waveguide microstructure of claim 1 , wherein the one or more dielectric support members are in the form of support posts having a first end on an inner surface of the outer conductor and a second end in contact with the center conductor.

5. A hermetic package, comprising the coaxial waveguide microstructure of claim 1 .

6. The coaxial waveguide microstructure of claim 1 , wherein the at least one coaxial waveguide comprises a plurality of coaxial waveguides, wherein the plurality of coaxial waveguides are present in a stacked arrangement.

7. The coaxial waveguide microstructure of claim 6 , wherein the plurality of coaxial waveguides are joined together by one or more vias.

8. The coaxial waveguide microstructure of claim 1 , comprising a plurality of the one or more dielectric support members.

9. The coaxial waveguide microstructure of claim 1 , wherein the center conductor and the outer conductor are formed of copper or a copper-alloy and comprise a coating including gold, copper, palladium, nickel-iron, platinum, nickel, or combinations thereof.

10. The coaxial waveguide microstructure of claim 1 , comprising a substrate over which the at least one coaxial waveguide is disposed and comprising a sacrificial release layer between the substrate and the waveguide.

11. The coaxial at least one coaxial waveguide microstructure of claim 1 , wherein the at least one coaxial waveguide further comprises a connectorization structure at an end portion of the at least one coaxial waveguide comprising a slot structure, a key structure or a flared structure.

12. The coaxial at least one coaxial waveguide microstructure of claim 1 , wherein the at least one coaxial waveguide further comprises a dielectric membrane over an end face of the at least one coaxial waveguide extending from the center conductor to the outer conductor.

13. The coaxial waveguide microstructure of claim 1 , comprising a substrate over which the at least one coaxial waveguide is disposed and comprising a compliant interface structure between the substrate and at least one coaxial waveguide to compensate for CTE mismatch therebetween.

14. The coaxial waveguide microstructure of claim 1 , wherein the at least one coaxial waveguide comprises a plurality of the one or more dielectric support members; the center conductor and outer conductor comprise copper or a copper alloy; and further comprising an active device bonded to the waveguide.

15. A method of forming a coaxial waveguide microstructure by a sequential build process, comprising:

(a) depositing a plurality of layers over a substrate, wherein the layers comprise one or more of a metal material, a sacrificial photoresist material, and a dielectric material, thereby forming a structure above the substrate, comprising:

a center conductor;

an outer conductor comprising one or more walls, spaced apart from and disposed around the center conductor;

one or more dielectric support members for supporting the center conductor, in contact with the center conductor and enclosed within the outer conductor; and

a core volume between the center conductor and the outer conductor, wherein the core volume comprises sacrificial photoresist; and

(b) planarizing one or more of the layers of (a) by one or more of plasma etching, diamond turning, and laser ablation;

(c) removing the sacrificial photoresist from the core volume.

16. The method of claim 15 , further comprising after (c), (d) evacuating the core volume to a vacuous state.

17. The method of claim 15 , wherein the outer conductor comprises a first sidewall, and a plurality of the dielectric support members have a first end portion embedded in the first sidewall and extend beneath the center conductor.

18. The method of claim 15 , further comprising after (c), (d) separating the substrate from the structure.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Jul 30, 2025
From: ALTER DOMUS (US) LLC
To: CUBIC CORPORATION; CUBIC DIGITAL SOLUTIONS LLC; NUVOTRONICS, INC.
Reel/Frame 072281/0176 →
RELEASE OF SECURITY INTEREST AT REEL/FRAME 056393/0281 Recorded Jul 28, 2025
From: BARCLAYS BANK PLC, AS ADMINISTRATIVE AGENT
To: CUBIC CORPORATION; CUBIC DEFENSE APPLICATIONS, INC.; CUBIC DIGITAL SOLUTIONS LLC (FORMERLY PIXIA CORP.)
Reel/Frame 072282/0124 →
FIRST LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: BARCLAYS BANK PLC
Reel/Frame 056393/0281 →
SECOND LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: ALTER DOMUS (US) LLC
Reel/Frame 056393/0314 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE INSIDE THE ASSIGNMENT DOCUMENTATION PREVIOUSLY RECORDED AT REEL: 048698 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 10, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048843/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048698/0301 →
CHANGE OF NAME Recorded Oct 13, 2015
From: NUVOTRONICS, LLC
To: NUVOTRONICS, INC.
Reel/Frame 036851/0027 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 4, 2014
From: ROHM AND HAAS ELECTRONIC MATERIALS, LLC
To: NUVOTRONICS, LLC
Reel/Frame 033027/0560 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 4, 2014
From: SHERRER, DAVID W.; FISHER, JOHN J.
To: ROHM AND HAAS ELECTRONIC MATERIALS, LLC
Reel/Frame 033027/0554 →