IP Library Granted Patent US 9,472,528
Granted Patent B2
US 9,472,528 · App. 14/296,835 · Granted Oct 18, 2016

Integrated electronic package and method of fabrication

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Quick Facts
Patent No.
US 9,472,528
App. No.
14/296,835
Granted
Oct 18, 2016
Kind
B2
Abstract

An integrated electronic package includes an integrated circuit (IC) die and conductive discrete components. Electrical interconnects are formed directly between bond pads on an active side of the IC die and contacts on the conductive discrete components without an intervening lead frame. The IC die, conductive discrete components and electrical interconnects are embedded in an encapsulation material. Contact surfaces of at least some of the conductive discrete components are exposed from the encapsulation material and can be attached to a printed circuit board in order to mount the integrated electronic package to the printed circuit board.

Claims (24)

1. An integrated electronic package comprising:

an integrated circuit (IC) die having an active side at which bond pads are located, and a back side opposing said active side;

a surface mount component having first and second electrically conductive contacts separated from one another by a body portion spanning between said first and second contacts, wherein said surface mount component comprises at least one of a resistor, a capacitor, an inductor, and a diode;

a first electrical interconnect formed directly between one of said bond pads and said first contact without an intervening lead frame;

a second electrical interconnect formed directly between a second one of said bond pads and said second contact; and

encapsulation material formed over said IC die, said surface mount component, and said electrical interconnect, wherein said first contact and said body portion of said surface mount component are embedded within said encapsulation material and a contact surface of said second contact is exposed from said encapsulation material.

2. The integrated electronic package of claim 1 wherein said contact surface of said second contact is a first contact surface, and said first contact has a second contact surface that is exposed from said encapsulation material.

3. The integrated electronic package of claim 1 further comprising a chip-based device, said chip-based device being one of a chip resistor, a chip resistor array, and a chip capacitor, said chip-based device including:

a body portion having a third contact located on said body portion; and

a metallization layer located on a surface of said body portion, wherein said third contact and said body portion are embedded within said encapsulation material, and said metallization layer is exposed from said encapsulation material.

4. The integrated electronic package of claim 1 wherein said first contact is formed from a material that melts at a first temperature, said first temperature being greater than a second temperature used to perform a reflow soldering process.

5. The integrated electronic package of claim 4 wherein said material used to form said first contact is at least one of a gold, a copper, a nickel, and a solder wettable material.

6. An integrated electronic package comprising:

an integrated circuit (IC) die having an active side at which bond pads are located, and a back side opposing said active side;

a surface mount component having first and second electrically conductive contacts separated from one another by a body portion spanning between said first and second contacts, wherein said surface mount component comprises at least one of a resistor, a capacitor, an inductor, and a diode, and a material used to form said first and second contacts is at least one of a gold, a copper, a nickel, and a solder wettable material;

a first electrical interconnect formed directly between one of said bond pads and said first contact without an intervening lead frame;

a second electrical interconnect formed directly between a second one of said bond pads and said second contact; and

encapsulation material formed over said IC die, said surface mount component, and said electrical interconnect, wherein said first electrically conductive contact includes a first contact surface that is exposed from said encapsulation material and configured to be attached to a printed circuit board.

7. The integrated electronic package of claim 6 wherein said second electrically conductive contact has a second contact surface that is exposed from said encapsulation material.

8. The integrated electronic package of claim 7 wherein said second contact is formed from said at least one of said gold, said copper, said nickel, and said solder wettable material.

9. The integrated electronic package of claim 6 wherein said second contact is formed from said at least one of said gold, said copper, said nickel, and said solder wettable material.

10. The integrated electronic package of claim 6 further comprising a chip-based device, said chip-based device being one of a chip resistor, a chip resistor array, and a chip capacitor, said chip-based device including;

a body portion having a third contact located on said body portion; and

a metallization layer located on a surface of said body portion, wherein said third contact and said body portion are embedded within said encapsulation material, and said metallization layer is exposed from said encapsulation material.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 14/258,829 AND REPLACE ITWITH 14/258,629 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0082. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OFSECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0332 →
CORRECTIVE ASSIGNMENT OF INCORRECT APPLICATION 14/258,829 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0109. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0208 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0082 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0109 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0903 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0293 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0267 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033460/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 5, 2014
From: YAP, WENG F.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 033038/0483 →