IP Library Granted Patent US 9,081,572
Granted Patent B2
US 9,081,572 · App. 14/299,032 · Granted Jul 14, 2015

Proximity sensor

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Quick Facts
Patent No.
US 9,081,572
App. No.
14/299,032
Granted
Jul 14, 2015
Kind
B2
Abstract

In one embodiment, a method includes monitoring detection by a sensing element of a key touch on a touch screen; determining an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of a key touch on the touch screen; and, if the amount of time that has elapsed exceeds a predetermined time duration, then initiating a particular function of an apparatus.

Claims (30)

1. An apparatus comprising:

a sensing element; and

one or more computer-readable non-transitory storage media embodying logic that is operable when executed to:

determine an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of an object being in proximity to the sensing element; and

if the amount of time that has elapsed exceeds a predetermined time duration, then initiate a particular function of the apparatus.

2. The apparatus of claim 1 , wherein the particular function comprises deactivation of measurement of changes in capacitance by the sensing element.

3. The apparatus of claim 1 , wherein the particular function comprises recalibration of measurement of changes in capacitance by the sensing element.

4. The apparatus of claim 1 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of power supply voltages or an output voltage of the sensing element.

5. The apparatus of claim 1 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of delay multipliers determined by a polarity of a voltage pulse.

6. The apparatus of claim 1 , wherein the particular function comprises turning off the apparatus.

7. The apparatus of claim 1 , further comprising a control circuit.

8. The apparatus of claim 7 , wherein the sensing element comprises a pattern of electrodes within a touch screen, the electrodes being coupled to the control circuit.

9. The apparatus of claim 8 , wherein the electrodes comprise indium tin oxide (ITO).

10. A method comprising:

monitoring, by a control circuit, capacitance measurements of a sensing element of an apparatus;

determining an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of an object being in proximity to the sensing element; and

if the amount of time that has elapsed exceeds a predetermined time duration, then initiating a particular function of the apparatus.

11. The method of claim 10 , wherein the particular function comprises deactivating measurement of changes in capacitance by the sensing element.

12. The method of claim 10 , wherein the particular function comprises recalibrating measurement of changes in capacitance by the sensing element.

13. The method of claim 10 , further comprising calculating the predetermined time duration based on one of a plurality of power supply voltages or an output voltage of the sensing element.

14. The method of claim 10 , further comprising calculating the predetermined time duration based on one of a plurality of delay multipliers determined by a polarity of a voltage pulse.

15. The method of claim 10 , wherein the particular function comprises turning off power to the apparatus.

16. A computer-readable non-transitory storage media embodying logic that is operable when executed to:

monitor capacitance measurements of a sensing element of an apparatus;

determine an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of an object being in proximity to the sensing element; and

if the amount of time that has elapsed exceeds a predetermined time duration, then initiate a particular function of the apparatus.

17. The media of claim 16 , wherein the particular function comprises deactivation of measurement of changes in capacitance by the sensing element.

18. The media of claim 16 , wherein the particular function comprises recalibration of measurement of changes in capacitance by the sensing element.

19. The media of claim 16 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of power supply voltages or an output voltage of the sensing element.

20. The media of claim 16 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of delay multipliers determined by a polarity of a voltage pulse.

Assignments (14)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2019
From: SOLAS OLED LIMITED
To: NEODRÓN LIMITED
Reel/Frame 050518/0457 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2019
From: MICROCHIP TECHNOLOGY INCORPORATED; AMTEL CORPORATION
To: SOLAS OLED LIMITED
Reel/Frame 048201/0225 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0884 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0937 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038375/0724 →
PATENT SECURITY AGREEMENT Recorded Nov 4, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 034160/0563 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2014
From: QRG LIMITED
To: ATMEL CORPORATION
Reel/Frame 033105/0235 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2014
From: PHILIPP, HARALD; SNOAD, KEVIN
To: QRG LIMITED
Reel/Frame 033054/0516 →