Removable compartments for workpiece stocker
The present invention discloses apparatuses and method for configuring a compartmentable equipment to accommodate emergency responses. An exemplary equipment comprises a plurality of removable compartments for storing workpieces so that in emergency events, such as power failure or equipment failure, the workpieces can be removed from the equipment for continuing processing without disrupting the flow of the fabrication facility. The compartmentable equipment can comprise emergency access ports, including mating interface to a portable workpiece removal equipment to allow accessing the individual compartments without compromising the quality, defects and yield of the workpieces stored in the stocker.
1. A method for improving the operation of a workpiece stocker having a storage chamber and an IO station, the method comprising
storing a plurality of workpieces in the storage chamber, wherein the storage chamber is compartmentalized into a plurality of compartments, wherein the plurality of compartments are open during normal operation;
providing a robotic mechanism to transfer the plurality of workpieces from the storage chamber to the IO station through an IO station opening;
emergency accessing each stationary storage chamber location of each of the plurality of compartments disposed in the workpiece stocker, through an emergency access port separate and distinct from each of the IO station opening and disposed on each exterior wall of the storage chamber, wherein both the IO station opening and the emergency access port extend through and are defined by a common housing forming the storage chamber distinct from the plurality of compartments, so that in an event of a failure of the workpiece stocker the emergency access port provides emergency access to each stationary storage chamber location of each of the plurality of compartments and removal of at least one compartment of the plurality of compartments from a corresponding stationary storage location of the storage chamber independent of each of the IO station opening;
assessing that the failure of the workpiece stocker occurs; and
sealing each of the plurality of compartments disposed within the storage chamber before accessing the workpiece stocker, based on an assessment that failure of the workpiece stocker has occurred, to prevent contamination, wherein the workpiece stocker is accessed through the emergency access port.
2. A method as in claim 1 further comprising accessing the stocker after sealing all compartments.
3. A method as in claim 1 wherein the failure comprises a failure of the robotic mechanism.
4. A method as in claim 1 wherein the failure is detected through a sensor mechanism.
5. A method as in claim 1 wherein the plurality of compartments are sealed individually after the failure is assessed.
6. A method as in claim 1 wherein accessing the stocker comprises unsealing one compartment while other compartments remain sealed.
7. A method as in claim 1 wherein accessing the stocker comprises removing a compartment from the stocker.
8. A method as in claim 1 wherein accessing the stocker comprises unsealing a compartment for accessing the workpieces within.
9. A method as in claim 1 wherein accessing the stocker comprises unsealing a compartment and storing workpieces from the unsealed compartment in a container box before removing the workpieces from the workpiece stocker.
10. A method as in claim 1 wherein accessing the workpiece stocker comprises accessing the plurality of semiconductor workpieces, stored in the storage chamber, through the emergency access port distinct from the IO station opening and disposed on the exterior wall of the storage chamber.
11. A method for improving the operation of a workpiece stocker having a storage chamber, an IO station having an IO station opening, and a robotic mechanism, the method comprising:
storing a plurality of semiconductor workpieces in the storage chamber, wherein each of the plurality of semiconductor workpieces are stored bare in the storage chamber;
providing a robotic mechanism to transfer the plurality of semiconductor workpieces from the storage chamber to the IO station through the IO station opening;
emergency accessing each stationary storage chamber location for each of the plurality of semiconductor workpieces stored in the workpiece stocker, through an emergency access port separate and distinct from each of the IO station opening and disposed on each exterior wall of the storage chamber, wherein both the IO station opening and the emergency access port extend through and are defined by a common housing forming the storage chamber, so that in an event of a failure of the workpiece stocker the emergency access port provides emergency access to each stationary storage chamber location for each of the plurality of semiconductor workpieces and removal of at least one semiconductor workpiece of the plurality of semiconductor workpieces from a corresponding stationary storage location of the storage chamber independent of each of the IO station opening;
assessing that the failure of the workpiece stocker occurs; and
sealing the storage chamber at each stationary storage chamber location for each of the plurality of semiconductor workpieces before accessing the workpiece stocker, based on an assessment that failure of the workpiece stocker has occurred, to prevent contamination, wherein the workpiece stocker is accessed through the emergency access port.
12. A method as in claim 11 further comprising accessing the stocker after sealing the storage chamber.
13. A method as in claim 11 wherein sealing the storage chamber comprises sealing individual portions of the storage chamber.
14. A method as in claim 13 wherein accessing the stocker comprises unsealing a portion of the storage chamber while sealing remaining portions of the storage chamber.
15. A method as in claim 13 wherein accessing the stocker comprises unsealing a portion of the storage chamber and storing semiconductor workpieces from the unsealed portion in a container box before removing the semiconductor workpieces from the workpiece stocker.
16. A method as in claim 11 wherein accessing the workpiece stocker comprises accessing the plurality of semiconductor workpieces, stored in the storage chamber, through the emergency access port distinct from the IO station opening and disposed on the exterior wall of the storage chamber.
17. A method for improving the operation of a workpiece stocker having a storage chamber, an IO station, and a robotic mechanism, the method comprising
storing a plurality of semiconductor workpieces in the storage chamber, wherein each of the plurality of semiconductor workpieces is stored bare in the storage chamber;
providing a robotic mechanism based within the storage chamber to transfer the plurality of semiconductor workpieces from the storage chamber to the IO station through an IO station opening, of the IO station;
emergency accessing each stationary storage chamber location for each of the plurality of semiconductor workpieces stored in the workpiece stocker, through an emergency access port separate and distinct from each of the IO station opening and disposed on each exterior wall of the storage chamber, wherein both the IO station opening and the emergency access port extend through and are defined by a common housing forming the storage chamber, so that in an event of a failure of the workpiece stocker the emergency access port provides emergency access to each stationary storage chamber location for each of the plurality of semiconductor workpieces and removal of at least one semiconductor workpiece of the plurality of semiconductor workpieces from a corresponding stationary storage location of the storage chamber independent of each of the IO station opening; and
sealing each stationary storage chamber location for each of the plurality of semiconductor workpieces stored in the storage chamber before accessing the workpiece stocker, based on an assessment that failure of the workpiece stocker has occurred, to prevent contamination, wherein the workpiece stocker is accessed through the emergency access port.
18. A method as in claim 17 wherein the storage chamber is compartmentalized into a plurality of compartments, wherein the plurality of compartments are open during normal operation, the method further comprising accessing the stocker after sealing all compartments.
19. A method as in claim 18 wherein the plurality of compartments are sealed individually after the failure is assessed.
20. A method as in claim 18 wherein accessing the stocker comprises unsealing one compartment while other compartments remain sealed.
21. A method as in claim 17 wherein accessing the stocker comprises removing a compartment from the stocker.
22. A method as in claim 17 wherein accessing the stocker comprises unsealing a compartment and storing semiconductor workpieces from the unsealed compartment in a container box before removing the semiconductor workpieces from the workpiece stocker.
23. A method as in claim 17 wherein accessing the workpiece stocker comprises accessing the plurality of semiconductor workpieces, stored in the storage chamber, through the emergency access port distinct from the IO station opening and disposed on the exterior wall of the storage chamber.