IP Library Granted Patent US 9,165,904
Granted Patent B1
US 9,165,904 · App. 14/306,254 · Granted Oct 20, 2015

Insulated wire bonding with EFO before second bond

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Quick Facts
Patent No.
US 9,165,904
App. No.
14/306,254
Granted
Oct 20, 2015
Kind
B1
Abstract

A method of attaching a bond wire to first and second electrical contact pads includes holding the bond wire in a capillary, wherein a first end of the bond wire extends out of an opening in the capillary, attaching the first end of the bond wire to the first electrical contact pad using a ball bonding technique, moving a second end of the bond wire toward the second electrical contact pad after the attachment of the first end of the bond wire, performing an electric flame off on the second end of the bond wire without forming a free air ball, and attaching the second end of the bond wire to the second electrical contact pad after the EFO on the second end of the bond wire.

Claims (27)

1. A method of attaching a bond wire to first and second electrical contact pads, the method comprising:

holding the bond wire in a capillary, wherein a first end of the bond wire extends out of an opening in the capillary;

attaching the first end of the bond wire to the first electrical contact pad;

moving a second end of the bond wire toward the second electrical contact pad after the attachment of the first end of the bond wire;

performing an electric flame off (EFO) on the second end of the bond wire without forming a free air ball (FAB); and

attaching the second end of the bond wire to the second electrical contact pad after the EFO on the second end of the bond wire.

2. The method of claim 1 , further comprising:

performing an EFO on the first end of the bond wire to form a free air ball at the first end of the bond wire prior to attachment of the first end of the bond wire to the first electrical contact pad.

3. The method of claim 2 , wherein the EFO on the first end of the bond wire is performed at a temperature greater than about 1000° C.

4. The method of claim 3 , wherein the EFO on the second end of the bond wire is performed at a temperature between about 250° C. and about 600° C.

5. The method of claim 2 , wherein attachment of the first end of the bond wire to the first electrical contact pad is performed by one of a thermosonic bonding process or an ultrasonic bonding process.

6. The method of claim 1 , wherein the attaching of the second end of the bond wire comprises forming one of a wedge bond or a stitch bond.

7. The method of claim 1 , wherein the EFO on the second end of the bond wire is performed at a temperature between about 250° C. and about 600° C.

8. The method of claim 1 , wherein the bond wire is one of an insulated copper wire or an insulated gold wire.

9. The method of claim 1 , further comprising:

separating the bond wire from the capillary following attachment of the second end of the bond wire.

10. The method of claim 1 , wherein the bond wire comprises an insulated bond wire.

11. The method of claim 1 , wherein the bond wire comprises a Pd coated copper wire.

12. A method of attaching a bond wire to first and second electrical contact pads, the method comprising:

holding the bond wire in a capillary, wherein a first end of the bond wire extends out of an opening in the capillary;

performing a first electrical flame off (EFO) on the first end of the bond wire to form a free air ball (FAB) on the bond wire first end;

attaching the FAB to the first electrical contact pad;

moving a second end of the bond wire from the first contact pad toward the second electrical contact pad after the attachment of the first end of the bond wire;

performing a second EFO on the second end of the bond wire without forming a FAB; and

attaching the second end of the bond wire to the second electrical contact pad after performing the second EFO.

13. The method of claim 12 , wherein the first EFO is performed with a temperature of about 1000° C. and the second EFO is performed with a temperature of about 500° C.

14. The method of claim 12 , wherein the bond wire comprises an insulated bond wire and the second EFO substantially removes the insulation from the second end of the bond wire.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 14/258,829 AND REPLACE ITWITH 14/258,629 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0082. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OFSECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0332 →
CORRECTIVE ASSIGNMENT OF INCORRECT APPLICATION 14/258,829 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0109. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0208 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0082 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0109 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0903 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0293 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0267 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033460/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 17, 2014
From: SIONG, CHIN TECK; POH, ZI SONG; TAN, LAN CHU
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 033114/0059 →