IP Library Granted Patent US 9,612,254
Granted Patent B2
US 9,612,254 · App. 14/318,199 · Granted Apr 4, 2017

Microelectromechanical systems devices with improved lateral sensitivity

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Quick Facts
Patent No.
US 9,612,254
App. No.
14/318,199
Granted
Apr 4, 2017
Kind
B2
Abstract

Microelectromechanical system (MEMS) devices and methods for forming MEMS devices are provided. The MEMS devices include a substrate, an anchored structure fixedly coupled to the substrate, and a movable structure resiliently coupled to the substrate. The movable structure has an opening formed therethrough and is positioned such that the anchored structure is at least partially within the opening and is in a capacitor-forming relationship with the movable structure. The movable structure comprises a movable structure finger extending only partially across the opening.

Claims (32)

1. A microelectromechanical systems (MEMS) device comprising:

a substrate;

a first anchored structure fixedly coupled to the substrate;

a second anchored structure fixedly coupled to the substrate; and

a movable structure resiliently coupled to the substrate, the movable structure having an opening formed therethrough and being positioned such that the first anchored structure is at least partially within the opening and such that the second anchored structure is at least partially within the opening, and wherein the movable structure is in a capacitor-forming relationship with the first anchored structure and the second anchored structure, wherein the movable structure comprises a first movable structure finger extending only partially across the opening and a second movable structure finger extending only partially across the opening, and wherein the first movable structure finger is positioned to move away from the first anchored structure to decrease capacitance between the movable structure and the first anchored structure when the movable structure moves in a first direction, and wherein the second movable structure finger is positioned to move closer to the second anchored structure to increase capacitance between the movable structure and the second anchored structure when the movable structure moves in the first direction, and wherein the movable structure comprises a first portion and a second portion, the second portion being on a side of the opening opposite the first portion, and wherein the first movable structure finger extends from the first portion, into the opening, and towards the second portion, and wherein the first anchored structure comprises a first anchored structure finger in a capacitor-forming relationship with the first movable structure finger, and wherein the first anchored structure finger extends from the first anchored structure towards the first portion of the movable structure, and wherein the movable structure further comprises a third portion and a fourth portion, the fourth portion being on a side of the opening opposite the third portion, and wherein the first anchored structure further comprises a second anchored structure finger in a capacitor-forming relationship with the third portion of the movable structure.

2. The MEMS device of claim 1 , wherein the movable structure laterally surrounds the first anchored structure and the second anchored structure.

3. The MEMS device of claim 1 , wherein the first movable structure finger is at least partially positioned between the first anchored structure finger and the second anchored structure finger.

4. The MEMS device of claim 3 , wherein a ratio of a distance between the first movable structure finger and the first anchored structure finger and a distance between the first movable structure finger and the second anchored structure finger is between about 1:2 and about 1:4.

5. The MEMS device of claim 4 , wherein the distance between the first movable structure finger and the first anchored structure finger is between about 1 micrometer (μm) and about 5 μm.

6. A microelectromechanical systems (MEMS) device comprising:

a substrate;

a first anchored structure fixedly coupled to the substrate and comprising a first anchored structure finger;

a second anchored structure fixedly coupled to the substrate and comprising a second anchored structure finger; and

a movable structure resiliently coupled to the substrate, the movable structure having an opening formed therethrough and being positioned such that the first anchored structure and the second anchored structure are at least partially within the opening and are laterally surrounded by the movable structure, wherein the movable structure comprises:

a first movable structure finger extending only partially across the opening and being in a capacitor-forming relationship with the first anchored structure finger; and

a second movable structure finger extending only partially across the opening and being in a capacitor-forming relationship with the second anchored structure finger; and

wherein the first movable structure finger is positioned to move away from the first anchored structure finger to decrease capacitance between the movable structure and the first anchored structure when the movable structure moves in a first direction, and wherein the second movable structure finger is positioned to move closer to the second anchored structure finger to increase capacitance between the movable structure and the second anchored structure when the movable structure moves in the first direction, and

wherein the movable structure further comprises a first portion, a second portion, a third portion, and a fourth portion, the second portion being on a side of the opening opposite the first portion and the fourth portion being on a side of the opening opposite the third portion, and

wherein the first movable structure finger extends from the first portion of the movable structure, into the opening, and towards the second portion, and the second movable structure finger extends from the second portion of the movable structure, into the opening, and towards the first portion,

wherein the first anchored structure further comprises a third anchored structure finger, the third anchored structure finger being in a capacitor-forming relationship with the third portion of the movable structure, and

wherein the second anchored structure further comprises a fourth anchored structure finger, the fourth anchored structure finger being in a capacitor-forming relationship with the fourth portion of the movable structure.

7. The MEMS device of claim 6 , wherein the first movable structure finger is at least partially positioned between the first anchored structure finger and the third anchored structure finger, and

wherein the second movable structure finger is at least partially positioned between the second anchored structure finger and the fourth anchored structure finger.

8. The MEMS device of claim 7 , wherein a ratio of a distance between the first movable structure finger and the first anchored structure finger and a distance between the first movable structure finger and the third anchored structure finger is between about 1:2 and about 1:4, and wherein a ratio of the distance between the second movable structure finger and the second anchored structure finger and the distance between the second movable structure finger and the fourth anchored structure finger is between about 1:2 and about 1:4.

9. A method for determining a force with a microelectromechanical (MEMS) system device, the method comprising:

detecting a first change in capacitance between a first anchored structure fixedly coupled to a substrate and a first finger of a movable structure resiliently coupled to the substrate, the movable structure having an opening and being positioned such that the first anchored structure is at least partially within the opening, the first finger of the movable structure extending only partially across the opening, where the first finger of the movable structure is positioned to move away from the first anchored structure to decrease capacitance between the movable structure and the first anchored structure when the movable structure moves in a first direction;

detecting a second change in capacitance between a second anchored structure fixedly coupled to a substrate and a second finger of a movable structure resiliently coupled to the substrate, the movable structure having an opening and being positioned such that the second anchored structure is at least partially within the opening, the second finger of the movable structure extending only partially across the opening, where the second finger of the movable structure is positioned to move closer to the second anchored structure to increase capacitance between the movable structure and the second anchored structure when the movable structure moves in the first direction;

determining a force based on the detected first change in capacitance and second change in capacitance;

wherein the movable structure comprises a first portion and a second portion, the second portion being on a side of the opening opposite the first portion, and wherein the first finger extends from the first portion, into the opening, and towards the second portion, and wherein the first anchored structure comprises a third finger in a capacitor-forming relationship with the first finger; and

wherein the movable structure further comprises a third portion and a fourth portion, the fourth portion being on a side of the opening opposite the third portion, and wherein the anchored structure further comprises a fourth finger in a capacitor-forming relationship with the third portion of the movable structure.

10. The method of claim 9 , wherein the first finger is at least partially positioned between the third finger and the fourth finger.

11. The method of claim 10 , wherein a ratio of a distance between the first finger and the third finger and a distance between the first finger and the fourth finger is between about 1:2 and about 1:4.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 14/258,829 AND REPLACE ITWITH 14/258,629 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0082. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OFSECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0332 →
CORRECTIVE ASSIGNMENT OF INCORRECT APPLICATION 14/258,829 PREVIOUSLY RECORDED ON REEL 037444 FRAME 0109. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Aug 10, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039639/0208 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0082 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 5, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037444/0109 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0903 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0293 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033462/0267 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 1, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 033460/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 7, 2014
From: NAUMANN, MICHAEL
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 033252/0846 →