IP Library Granted Patent US 9,567,492
Granted Patent B2
US 9,567,492 · App. 14/471,755 · Granted Feb 14, 2017

Polishing of hard substrates with soft-core composite particles

Inventors: Rajiv K. Singh (Newberry, FL); Arul Chakkaravarthi Arjunan (Gainesville, FL); Kannan Balasundaram (Gainesville, FL); Deepika Singh (Newberry, FL); Wei Bai (Gainesville, FL)
Assignees: Sinmat, Inc.; University of Florida Research Foundation, Inc.
C09G1/04B24B37/044C09G1/02C09K3/1436C09K3/1463C30B33/00H01L21/02002H01L21/02024H01L21/30625
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Quick Facts
Patent No.
US 9,567,492
App. No.
14/471,755
Granted
Feb 14, 2017
Kind
B2
Abstract

A chemical mechanical polishing (CMP) includes providing a slurry including composite particles dispersed in a water-based carrier that comprise a plurality of hard particles on an outer surface of a soft-core particle. The hard particles have a Mohs hardness at least 1 greater than a Mohs hardness of the soft core particle and/or a Vickers hardness at least 500 Kg/mm 2 greater than the soft-core particle. A substrate having a substrate surface with a hardness greater than a Mohs number of 6 or a Vickers hardness greater than 1,000 kg/mm 2 is placed into a CMP apparatus having a rotating polishing pad, and CMP is performed with the rotating polishing pad and the slurry to polish the substrate surface.

Claims (21)

1. A method of chemical mechanical polishing (CMP), comprising

providing a slurry

comprising a plurality of composite particles dispersed in a water-based carrier that comprise a plurality of hard diamond particles on an outer surface of a soft-core particle comprising an inorganic material wherein said soft-core particle comprise alumina, boron carbide, boron nitride, or silicon carbide, and wherein an average size of said soft-core particle is at least 1 μm

placing a substrate having a substrate surface with a hardness greater than a Mohs number of 6 or a Vickers hardness greater than 1,000 kg/mm into a CMP apparatus having a rotating polishing pad, and

performing CMP with said rotating polishing pad and said slurry to polish said substrate surface.

2. The method of claim 1 , wherein said substrate surface comprises sapphire, single crystal SiC, or single crystal GaN.

3. The method of claim 1 , wherein said slurry has a pH between 9 and 14.0 or said slurry has a pH between 0.01 and 4.

4. The method of claim 1 , wherein said slurry further comprises alkali ions in a concentration between 0.01 gm/liter and 200 gm/liter.

5. The method of claim 1 , wherein said slurry further comprises at least one oxidizer and at least one surfactant.

6. A chemical mechanical polishing (CMP) slurry, comprising:

a plurality of composite particles dispersed in a water-based carrier that comprise a plurality of diamond particles on an outer surface of a soft-core particle comprising an inorganic material,

and

wherein said soft-core particle comprise alumina, boron carbide, boron nitride, or silicon carbide, and

wherein an average size of said soft-core particle is at least 1 μm.

7. The slurry of claim 6 , wherein at least one of said plurality of diamond particles and said soft-core particle include a metallic oxide compound coating thereon.

8. The slurry of claim 6 , wherein said slurry has a pH between 9 and 14 or said slurry has a pH between 0.01 and 4.

9. The slurry of claim 6 , wherein said slurry further comprises alkali ions in a concentration between 0.01 gm/liter and 200 gm/liter.

10. The slurry of claim 6 , wherein said slurry further comprises at least one oxidizer and at least one surfactant.

11. The slurry of claim 10 , wherein said oxidizer comprises a per-based compound, and wherein said plurality of diamond particles have an average size <1 μm, and a pH of said slurry is <7.0.

12. The slurry of claim 6 , wherein said soft-core particle comprises alumina.

13. The slurry of claim 7 , wherein both said plurality of diamond particles and said soft-core particle include said metallic oxide compound coating thereon.

Assignments (5)
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060614/0980 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 14, 2020
From: SINMAT, INC.
To: ENTEGRIS, INC.
Reel/Frame 052388/0520 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2014
From: SINGH, RAJIV K.
To: UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INC.
Reel/Frame 033633/0278 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2014
From: ARJUNAN, ARUL CHAKKARAVARTHI; BALASUNDARAM, KANNAN; SINGH, DEEPIKA; BAI, WEI
To: SINMAT, INC.
Reel/Frame 033633/0571 →
Continuity (1)
Related Publication 20160060488A1 · Mar 3, 2016