Method and apparatus for configuring I/O cells of a signal processing IC device into a safe state
A peripheral integrated circuit (IC) device for providing support to a data processing IC device. The peripheral IC device comprises a fault detection component arranged to detect an occurrence of fault conditions within the data processing IC device. The peripheral IC device further comprises a safe state control component. Upon detection of a fault condition occurring within the data processing IC device by the fault detection component, the safe state control component is arranged to cause at least one I/O cell of the data processing IC device to be configured into at least one scan-chain, and cause at least one predefined control signal to be scanned into the at least one scan-chain to configure the at least one I/O cell into a state corresponding to the predefined control signal.
1. A peripheral integrated circuit, IC, device for providing support to a data processing IC device, the peripheral IC device comprising:
a fault detection component arranged to detect an occurrence of a fault condition within the data processing IC device; and
a safe state control component arranged to, in response to detection of the fault condition occurring within the data processing IC device by the fault detection component:
cause an input/output, I/O, cell of the data processing IC device to be configured into a scan-chain; and
cause a predefined control signal to be scanned into the scan-chain to configure the I/O cell into a state corresponding to the predefined control signal.
2. The peripheral IC device of claim 1 , wherein the peripheral IC device is arranged to be operably coupled to the data processing IC device via a serial peripheral interface, and the safe state control component is arranged to transmit command signals to the data processing IC device to cause the I/O cell of the data processing IC device to be configured into the scan-chain and to cause the predefined control signal to be scanned into the scan-chain via the serial peripheral interface.
3. The peripheral IC device of claim 1 , wherein the safe state control component is arranged to cause the I/O cell of the data processing IC device to be configured into the scan-chain by sending a command signal to a debug component of the data processing IC device instructing the debug component to configure the I/O cell of the data processing IC device into the scan-chain.
4. The peripheral IC device of claim 3 , wherein the safe state control component is arranged to cause the predefined control signal to be scanned into the scan-chain by sending the command signal to the debug component of the data processing IC device comprising a control signal pattern to cause the debug component to scan in a control signal into the scan-chain to configure the I/O cell to comprise a logical level corresponding to the control signal pattern.
5. The peripheral IC device of claim 3 , wherein the safe state control component is arranged to cause the predefined control signal to be scanned into the scan-chain by sending a command signal to the debug component of the data processing IC device to cause the debug component to scan in a control signal into the scan-chain to configure the I/O cell to comprise a high input impedance.
6. The peripheral IC device of claim 3 , wherein the safe state control component is arranged to cause the predefined control signal to be scanned into the scan-chain by sending a command signal to the debug component of the data processing IC device to cause the debug component to scan in a control signal into the scan-chain to configure the I/O cell to comprise a logical level corresponding to a predefined control signal pattern.
7. The peripheral IC device of claim 3 , wherein the safe state control component is operably coupled to a memory element and arranged to read therefrom a series of command signals for causing the I/O cell of the data processing IC device to be configured into the scan-chain and for causing a predefined control signal to be scanned into the scan-chain to configure the I/O cell into to a state corresponding to the predefined control signal.
8. The peripheral IC device of claim 7 , wherein the safe state control component is further arranged to read from the memory element the control signal to be scanned into the scan-chain.
9. The peripheral IC device of claim 3 , wherein the safe state control component is operably coupled to a fuse element configurable to define the control signal to be scanned into the scan-chain.
10. The peripheral IC device of claim 3 , wherein the control signal to be scanned into the scan-chain is hardcoded into the peripheral IC device.
11. The peripheral IC device of claim 1 , wherein the predefined control signal to be scanned into the scan-chain is arranged to force the I/O cell into to a state comprising at least one of:
a high logical level;
a low logical level; and
a high input impedance level.
12. The peripheral IC device of claim 1 , wherein the fault detection component is arranged to detect the occurrence of at least one of:
an over-current condition within the data processing IC device;
an over-voltage condition within the data processing IC device;
an over-temperature condition within the data processing IC device; and
a watchdog function not being serviced.
13. The peripheral IC device of claim 1 , wherein the fault detection component is arranged to detect the occurrence of fault conditions based on a notification received from the data processing IC device of the detection of a fault condition thereby.
14. The peripheral IC device of claim 1 , wherein the support provided by the peripheral IC device to the data processing IC device comprises at least one from a group comprising:
power regulator functionality;
over current detection functionality;
watchdog functionality; and
physical layer communication functionality.
15. A data processing integrated circuit, IC, device comprising a safety level configuration component, the safety level configuration component being controllable by a peripheral IC device operably coupled to the data processing IC device to:
configure an input/output, I/O, cell of the data processing IC device to be configured into a scan-chain in response to a detection of a fault condition occurring within the data processing IC device; and
cause a predefined control signal to be scanned into the scan-chain to configure the I/O cell into to a state corresponding to the predefined control signal.
16. The data processing IC device of claim 15 , wherein the I/O cell is arranged to be isolated from core functional components of the data processing IC device when configured into the scan-chain by the safety level configuration component.
17. The data processing IC device of claim 15 , wherein the safety level configuration component comprises a debug component of the data processing IC device.
18. The data processing IC device of claim 15 , wherein the scan-chain comprises at least one boundary scan scan-chain.
19. The data processing IC device of claim 15 , wherein the data processing IC device comprises a microprocessor.
20. A method comprising:
detecting, at a detection component, an occurrence of a fault condition within a data processing integrated circuit, IC, device; and
in response to detection of the fault condition occurring within the data processing IC device:
causing, by a safe state control component, an input/output, I/O, cell of the data processing IC device to be configured into a scan-chain; and
causing, by the safe state control component, a predefined control signal to be scanned into the scan-chain to configure the I/O cell into a state corresponding to the predefined control signal.