IP Library Granted Patent US 9,429,630
Granted Patent B2
US 9,429,630 · App. 14/493,347 · Granted Aug 30, 2016

Circuit for testing power supplies in multiple power modes

Inventors: Yong Zhu (Suzhou, CN); Shayan Zhang (Austin, TX)
Assignee: Freescale Semiconductor, Inc.
G01R31/40G01R31/31721
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Quick Facts
Patent No.
US 9,429,630
App. No.
14/493,347
Granted
Aug 30, 2016
Kind
B2
Abstract

A BIST circuit is provided for testing the status of power supplies in an integrated circuit in multiple power modes including multiple circuit blocks. The BIST circuit includes a finite state machine (FSM), power monitors and a comparator. The FSM sequentially enables at least two power mode states in a predetermined order. In each power mode state, the FSM outputs power mode signals to enable the power supplies used in the corresponding power mode. Each power monitor is connected to a power input node of one of the circuit blocks, and outputs a monitor signal indicative of the voltage at the corresponding power input node when the corresponding power supply is enabled. The comparator compares each monitor signal with a corresponding reference signal and generates a set of power supply status signals.

Claims (15)

1. A built-in self test (BIST) circuit for testing the status of a plurality of power supplies that operate in N power modes where N>1, of a system including a plurality of circuit blocks connected to respective ones of the plurality of power supplies, the BIST circuit comprising:

a finite state machine (FSM) having at least two power mode states respectively corresponding to at least two of the N power modes, wherein the FSM sequentially enables the at least two power mode states in a predetermined order, and in each power mode state, outputs one or more power mode signals to the power supplies to enable the power supplies used in the corresponding power mode;

a plurality of power monitors, each connected to a respective power input node of a respective one of the plurality of circuit blocks, wherein each power monitor outputs a monitor signal indicative of the voltage at the corresponding power input node when the power supply provided to the corresponding power input node is enabled; and

a comparator that receives the monitor signals and compares the monitor signals with corresponding reference signals, and generates a set of status signals that respectively indicate whether the corresponding power supply and a connection with the corresponding power input node are operating correctly.

2. The BIST circuit of claim 1 , wherein each of the power monitors includes a pull-down resistor and a switch, wherein a first end of the pull-down resistor is connected to the corresponding power input node, the switch is connected between a second end of the pull-down resistor and ground, and the switch is controlled by at least one of a BIST enable signal that activates the BIST circuit or the power mode signal that enables the corresponding power supply.

3. The BIST circuit of claim 2 , wherein the switch is an NMOS transistor.

4. The BIST circuit of claim 2 , wherein the pull-down resistor is a high-sheet resistor.

5. The BIST circuit of claim 1 , wherein the comparator comprises a set of XNOR gates, wherein each of the XNOR gates has two input terminals, one of the input terminals receiving one of the monitor signals and the other of the input terminals receiving a reference signal, and an output terminal for providing one of the status signals.

6. The BIST circuit of claim 5 , further comprising:

level shifters, connected between each power monitor and the comparator, wherein the level shifters shift a high level of the corresponding monitor signal to a predetermined level and output the shifted monitor signal to the comparator.

7. The BIST circuit of claim 1 , further comprising a memory connected to the comparator for storing the set of status signals.

8. The BIST circuit of claim 7 , wherein the memory comprises a register array.

9. The BIST circuit of claim 8 , wherein the register array comprises N groups of flip-flops, wherein each group of flip-flops stores a set of status signals generated in one of the power modes, and has clock input terminals that receive respective ones of the power mode signals generated by the FSM.

10. The BIST circuit of claim 1 , further comprising:

a decoder, connected to the FSM, for decoding a coded power mode signal generated by the FSM and providing the power enable signals for enabling the power supplies used in the corresponding power mode.

Assignments (23)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0502 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 7, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037458/0460 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0921 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034153/0027 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034160/0351 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Nov 4, 2014
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 034160/0370 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2014
From: ZHU, YONG; ZHANG, SHAYAN
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 033792/0804 →
Priority Claims (1)
CN 2013 1 0637398 · Dec 3, 2013 · national
Continuity (1)
Related Publication 20150153409A1 · Jun 4, 2015