Semiconductor device grid array package
A grid array assembly is formed from an electrical insulating material with embedded solder deposits. A first portion of each of the solder deposits is exposed on a first surface of the insulating material and a second portion of each of the solder deposits is exposed on an opposite surface of the insulating material. A semiconductor die is mounted to the first surface of the insulating material and electrodes of the die are connected to the solder deposits with bond wires. The die, bond wires, and the first surface of the insulating material then are covered with a protective encapsulating material.
1. A method of assembling a semiconductor die grid array package, the method comprising:
providing a grid array assembly formed from an electrical insulating material with solder deposits embedded therein, wherein a first portion of each of the solder deposits is exposed on and protrudes from a first surface of the insulating material and a second portion of each of the solder deposits is exposed on an opposite surface of the insulating material;
mounting a semiconductor die to the first surface of the insulating material;
electrically connecting electrodes of the semiconductor die to the solder deposits; and
covering the semiconductor die and the first surface of the insulating material with an encapsulating material.
2. The method of claim 1 , wherein providing the grid array assembly includes:
positioning the solder deposits in a mold, wherein the mold includes a first portion with a plurality of recesses, wherein each of the plurality of recesses receives the first portion of each of the solder deposits; and
molding the electrical insulating material around the solder deposits.
3. The method of claim 2 , wherein the solder deposits are solder balls.
4. The method of claim 3 , further comprising deforming at least one of the first and second portions of the solder deposits.
5. The method of claim 2 , wherein the second portion of each of the solder deposits protrudes from the second surface of the insulating material.
6. The method of claim 2 , further including selectively depositing conductive plating regions onto the first portion of each of the solder deposits.
7. The method of claim 6 , wherein each of the plating regions includes a conductive trace on the first surface of the insulating material.
8. The method of claim 7 , wherein electrically connecting the electrodes of the semiconductor die to the solder deposits is provided by bond wires, and wherein the bond wires are selectively bonded to each of said plating regions.
9. The method of claim 7 , wherein after mounting is performed, an active surface of the semiconductor die faces the first surface of the insulating material, and the selectively electrically connecting is provided by solder joints between the electrodes and respective aligned mounting pads of the conductive traces.
10. The method of claim 2 , wherein electrically connecting the electrodes of the semiconductor die to the solder deposits is provided by bond wires.
11. A semiconductor die grid array package, comprising:
a grid array assembly formed from an electrical insulating material with solder deposits embedded therein, wherein a first portion of each of the solder deposits is exposed on and protrudes from a first surface of the insulating material and a second portion of each of the solder deposits is exposed on an opposite second surface of the insulating material;
a semiconductor die mounted to the first surface of the insulating material, the semiconductor die having a plurality of electrodes that are selectively electrically connected to the solder deposits; and
an encapsulating material covering the semiconductor die and the first surface of the insulating material.
12. The semiconductor die grid array package of claim 11 , wherein the electrical insulating material is a mold compound molded around the solder deposits.
13. The semiconductor die grid array package of claim 12 , wherein the second portion of each of the solder deposits protrudes from the second surface of the insulating material.
14. The semiconductor die grid array package of claim 12 , including conductive plating regions deposited on the first portion of each of the solder deposits.
15. The semiconductor die grid array package of claim 14 , wherein each of the plating regions includes a conductive trace on the first surface of the insulating material.
16. The semiconductor die grid array package of claim 15 , wherein an active surface of the semiconductor die faces the first surface of the insulating material, and the electrodes are selectively electrically connected to the solder deposits by solder joints between the electrodes and respective aligned mounting pads of the conductive traces.