IP Library Granted Patent US 9,558,987
Granted Patent B2
US 9,558,987 · App. 14/582,149 · Granted Jan 31, 2017

Gap-fill methods

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Quick Facts
Patent No.
US 9,558,987
App. No.
14/582,149
Granted
Jan 31, 2017
Kind
B2
Abstract

Gap-fill methods comprise: (a) providing a semiconductor substrate having a relief image on a surface of the substrate, the relief image comprising a plurality of gaps to be filled; (b) applying a gap-fill composition over the relief image, wherein the gap-fill composition comprises a non-crosslinked crosslinkable polymer, an acid catalyst, a crosslinker and a solvent, wherein the crosslinkable polymer comprises a first unit of the following general formula (I): wherein: R 1 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; and Ar 1 is an optionally substituted aryl group that is free of crosslinkable groups; and a second unit of the following general formula (II): wherein: R 3 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; and R 4 is chosen from optionally substituted C 1 to C 12 linear, branched or cyclic alkyl, and optionally substituted C 6 to C 15 aryl, optionally containing heteroatoms, wherein at least one hydrogen atom is substituted with a functional group independently chosen from hydroxyl, carboxyl, thiol, amine, epoxy, alkoxy, amide and vinyl groups; and (c) heating the gap-fill composition at a temperature to cause the polymer to crosslink. The methods find particular applicability in the manufacture of semiconductor devices for the filling of high aspect ratio gaps.

Claims (29)

1. A gap-fill method, comprising:

(a) providing a semiconductor substrate having a relief image on a surface of the substrate, the relief image comprising a plurality of gaps to be filled;

(b) applying a gap-fill composition over the relief image, wherein the gap-fill composition comprises a non-crosslinked crosslinkable polymer, an acid catalyst, a crosslinker and a solvent, wherein the crosslinkable polymer comprises a first unit of the following general formula (I):

wherein: R 1 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; and Ar 1 is an optionally substituted aryl group that is free of crosslinkable groups; and a second unit of the following general formula (II):

wherein: R 3 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; and R 4 is chosen from optionally substituted C 1 to C 12 linear, branched or cyclic alkyl, and optionally substituted C 6 to C 15 aryl, optionally containing heteroatoms, wherein at least one hydrogen atom is substituted with a functional group independently chosen from hydroxyl, carboxyl, thiol, amine, amide and vinyl groups; and

(c) heating the gap-fill composition at a temperature to cause the polymer to crosslink.

2. The method of claim 1 , wherein the first unit is chosen from one or more unit chosen from the following formula (I-A), (I-B) and (1-C):

wherein: R 1 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; R 2 is independently chosen from halogen, nitro, cyano, and optionally substituted C 1 -C 15 linear, branched or cyclic alkyl, alkenyl, alkynyl, C 6 -C 18 aryl, and combinations thereof, and R 2 is free of crosslinkable groups; a is an integer from 0 to 5; b is an integer from 0 to 7; and c is an integer from 0 to 9.

3. The method of claim 2 , wherein the first unit is:

4. The method of claim 1 , wherein the second unit is chosen from one or more of the following units:

5. The method of claim 4 , wherein the second unit is:

6. The method of claim 1 , wherein the crosslinkable polymer consists of the units of general formula (I) and general formula (II).

7. The method of claim 1 , wherein the crosslinkable polymer has a weight average molecular weight of greater than 9000.

8. The method of claim 1 , wherein the gaps have a width of less than 50 nm and an aspect ratio of 2 or more.

9. The method of claim 1 , further comprising prior to causing the gap fill composition to crosslink, heating the gap-fill composition at a temperature to cause the gap-fill composition to fill the plurality of gaps.

10. The method of claim 9 , wherein the heating to fill the plurality of gaps and the heating to crosslink are conducted in a single process.

11. A gap-fill method, comprising:

(a) providing a semiconductor substrate having a relief image on a surface of the substrate, the relief image comprising a plurality of gaps to be filled;

(b) applying a gap-fill composition over the relief image, wherein the gap-fill composition comprises a non-crosslinked crosslinkable polymer, an acid catalyst, a crosslinker and a solvent, wherein the crosslinkable polymer comprises a first unit of the following general formula (I):

wherein: R 1 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; and Ar 1 is an optionally substituted aryl group that is free of crosslinkable groups; and a second unit chosen from the following:

(c) heating the gap-fill composition at a temperature to cause the polymer to crosslink.

12. The method of claim 11 , wherein the first unit is chosen from one or more unit chosen from the following formula (I-A), (I-B) and (1-C):

wherein: R 1 is chosen from hydrogen, fluorine, C 1 -C 3 alkyl and C 1 -C 3 fluoroalkyl; R 2 is independently chosen from halogen, nitro, cyano, and optionally substituted C 1 -C 15 linear, branched or cyclic alkyl, alkenyl, alkynyl, C 6 -C 18 aryl, and combinations thereof, and R 2 is free of crosslinkable groups; a is an integer from 0 to 5; b is an integer from 0 to 7; and c is an integer from 0 to 9.

13. The method of claim 12 , wherein the first unit is:

14. The method of claim 11 , wherein the crosslinkable polymer consists of the units of general formula (I) and of the second unit.

15. The method of claim 11 , wherein the crosslinkable polymer has a weight average molecular weight of greater than 9000.

16. The method of claim 11 , wherein the gaps have a width of less than 50 nm and an aspect ratio of 2 or more.

17. The method of claim 11 , further comprising prior to causing the gap fill composition to crosslink, heating the gap-fill composition at a temperature to cause the gap-fill composition to fill the plurality of gaps.

18. The method of claim 17 , wherein the heating to fill the plurality of gaps and the heating to crosslink are conducted in a single process.

Assignments (12)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
CHANGE OF LEGAL ENTITY Recorded Sep 17, 2024
From: DDP SPECIALTY ELECTRONIC MATERIALS US, INC
To: DDP SPECIALTY ELECTRONIC MATERIALS US, LLC
Reel/Frame 068972/0210 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2024
From: DOW GLOBAL TECHNOLOGIES LLC
To: THE DOW CHEMICAL COMPANY
Reel/Frame 068971/0226 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2024
From: THE DOW CHEMICAL COMPANY
To: DDP SPECIALTY ELECTRONIC MATERIALS US, INC
Reel/Frame 068971/0362 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2016
From: XU, CHENG-BAI; PARK, JONG KEUN; LI, MINGQI
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 040185/0473 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2016
From: SIM, JAE HWAN; PARK, JIN HONG; LIM, JAE-BONG; JO, JUNG KYU
To: ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD
Reel/Frame 040185/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 1, 2016
From: HUSTAD, PHILLIP D
To: DOW GLOBAL TECHNOLOGIES LLC
Reel/Frame 040185/0550 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2015
From: SIM, JAE HWAN; PARK, JIN HONG; LIM, JAE-BONG; JO, JUNG KYU; XU, CHENG-BAI; PARK, JONG KEUN; LI, MINGQI; HUSTAD, PHILIP D
To: ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD; ROHM AND HAAS ELECTRONIC MATERIALS LLC; DOW GLOBAL TECHNOLOGIES LLC
Reel/Frame 036920/0954 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2015
From: XU, CHENG-BAI; PARK, JONG KEUN; LI, MINGQI
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 035235/0216 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2015
From: SIM, JAE HWAN; PARK, JIN HONG; LIM, JAE-BONG; JO, JUNG KYU
To: ROHM AND HAAS ELECTRONIC MATERIAL KOREA LTD.
Reel/Frame 035235/0190 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2015
From: HUSTAD, PHILLIP D.
To: DOW GLOBAL TECHOLOGIES LLC
Reel/Frame 035235/0225 →