IP Library › Granted Patent US 9,336,086
Granted Patent B2
US 9,336,086 · App. 14/600,800 · Granted May 10, 2016

Apparatuses and methods including error correction code organization

Inventor: William Henry Radke (Los Gatos, CA)
Assignee: Micron Technology, Inc.
G06F11/1072G06F11/1016G06F11/1048H03M13/116H03M13/356
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Quick Facts
Patent No.
US 9,336,086
App. No.
14/600,800
Granted
May 10, 2016
Kind
B2
Abstract

Some embodiments include apparatuses and methods having first memory cells, a first access line configured to access the first memory cells, second memory cells, and a second access line configured to access the second memory cells. One of such apparatuses can include a controller configured to cause data to be stored in a memory portion of the first memory cells, to cause a first portion of an error correction code associated with the data to be stored in another memory portion of the first memory cells, and to cause a second portion of the error correction code to be stored in the second memory cells. Other embodiments including additional apparatuses and methods are described.

Claims (35)

1. An apparatus comprising:

first memory cells located on a first level of a memory device;

second memory cells located on a second level of the memory device; and

a controller to cause data to be stored in a first memory cell group of the first memory cells, to cause a first portion of an error correction code associated with the data to be stored in a second memory cell group of the first memory cells, to cause additional data to be stored in a first memory cell group of the second memory cells and to cause a second portion of the error correction code to be stored in a second memory cell group of the second memory cells, wherein the controller is further configured to cause at least a portion of an error correction code associated with the additional data to be stored in a third memory cell group of the second memory cells concurrently with storing of the second portion of the error correction code in the second memory cell group of the second memory cells.

2. The apparatus of claim 1 , wherein the controller is further configured to cause an additional portion of the error correction code associated with the data to be stored in a third memory cell group of the first memory cells.

3. The apparatus of claim 1 , wherein the data includes a page of information, and the error correction code is associated with the page of information.

4. The apparatus of claim 1 , further comprising a first line access to access the first memory cells, and a second access line to access the second memory cells.

5. The apparatus of claim 4 , wherein the first access line is located immediately next to the second access line.

6. The apparatus of claim 1 , wherein the first and second memory cells are located on a semiconductor die, and the controller is located on another semiconductor die.

7. The apparatus of claim 1 , wherein the controller includes an error correction code generator to generate the first and second portions of the error correction code.

8. An apparatus comprising:

first memory cells associated with a first access line;

second memory cells associated with a second access line; and

a controller to:

store first data in the first memory cells;

store second data in a first memory cell group of second memory cells;

store at least a portion of an error correction code associated with the second data in a second memory cell group of the second memory cells; and

store a portion of an error correction code associated with the first data in a third memory cell group of the second memory cells, wherein the controller is configured to concurrently store the at least a portion of the error correction code associated with the second data and the portion of the error correction code associated with the first data.

9. The apparatus of claim 8 , wherein the controller is further configured to store at least a portion of an error correction code associated with third data in the second memory cell group of the second memory cells.

10. The apparatus of claim 9 , wherein the controller is further configured to store an additional portion of the error correction code associated with the third data in the third memory cell group of the second memory cells.

11. The apparatus of claim 10 , wherein the portion of the error correction code associated with the first data is stored in the third memory cell group of the second memory cells before the additional portion of the error correction code associated with the third data is stored in the third memory cell group of the second memory cells.

12. The apparatus of claim 8 , wherein the at least a portion of the error correction code associated with the second data and the portion of the error correction code associated with the first data have difference sizes.

13. An apparatus comprising:

first memory cells associated with a first access line;

second memory cells associated with a second access line; and

a controller to:

retrieve information from the first memory cells;

generate data from the information using a first portion of error correction code associated with the data, the first portion of error correction code associated with the data being included in the information;

retrieve a second portion of the error correction code associated with the data from the second memory cells if the data is unsuccessfully generated from the information using the first portion of error correction code associated with the data; and

generate data using the first portion of error correction code associated with the data and the second portion of error correction code associated with the data.

14. The apparatus of claim 13 , wherein the first portion of the error correction code associated with the data and the second portion of the error correction code associated with the data have unequal sizes.

15. The apparatus of claim 13 , wherein the controller is configured to generate the first and second portions of the error correction code based on the data before the information is stored.

16. The apparatus of claim 15 , wherein the first and second memory cells are located on a memory device, and the controller is located on a memory controller.

17. The apparatus of claim 13 , wherein the first and second memory cells and the controller are located on a same semiconductor die.

18. The apparatus claim 13 , wherein the first and second memory cells and the controller are located different semiconductor dice.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
Continuity (2)
Continuation 13413363 · Mar 6, 2012
Related Publication 20150135037A1 · May 14, 2015