IC tap/scan selecting between TDI/SI and a test pattern source
An integrated circuit has controller circuitry having coupled to a test clock and a test mode select inputs, and having state a register clock state output, a register capture state output, and a register update state output. Register circuitry has a test data in lead input, control inputs coupled to the state outputs of the controller circuitry, and a control output. Connection circuitry has a control input connected to the control output of the register circuitry and selectively couples one of a first serial data output of first scan circuitry and a second serial data output of second scan circuitry to a test data out lead. Selection circuitry has an input connected to the serial data input lead, an input connected to a test pattern source lead, a control input coupled to the scan circuitry control output leads, and an output connected to the scan input lead.
1. An integrated circuit comprising:
A. a substrate carrying a serial data input lead, a serial data output lead, a select lead, and a clock lead;
B. functional circuitry on the substrate having data input leads and data output leads;
C. test access port circuitry on the substrate having a test data input lead connected to the serial data input lead, a test data output lead selectively connected to the serial data output lead, scan circuitry control output leads, a TAP controller having a test mode select input lead selectively coupled to the select lead, a test clock input lead connected to the clock lead, and a buffer enable output lead, and a data register having an input connected to the test data input lead and having an output selectively coupled to the test data output lead;
D. scan test port circuitry on the substrate having a scan input lead, a scan output lead selectively coupled to the serial data output lead, a capture select input lead, a scan clock input lead, and a scan register connected between the scan input lead and the scan output lead, the scan register having functional data output and input leads connected to the functional circuitry data input leads and data output leads;
E. connection circuitry on the substrate coupling the scan test port circuitry to the test access port circuitry, the connection circuitry having control inputs connected to the scan circuitry control output leads, the select lead, and the clock lead, and the connection circuitry having control outputs connected to the capture select input lead, and the scan clock input lead; and
F. selection circuitry having an input connected to the serial data input lead, an input connected to a test pattern source lead, a control input coupled to the scan circuitry control output leads, and an output connected to the scan input lead.
2. The integrated circuit of claim 1 in which the test access port circuitry includes an instruction register having an input connected to the test data input lead, an output selectively coupled to the test data output lead, and outputs connected to the scan circuitry control output leads.
3. The integrated circuit of claim 1 in which the TAP controller has data register control outputs and the data register has control inputs connected to the data register control outputs.
4. The integrated circuit of claim 1 in which the TAP controller has instruction register control outputs, and in which the test access port circuitry includes an instruction register having an input connected to the test data input lead, an output selectively coupled to the test data output lead, outputs connected to the scan circuitry control output leads, and control inputs connected to the instruction register control outputs.