Systems and methods for pulse width modulated control of a semiconductor switch

1. A pulse width modulated controller system for a semiconductor switch, the system comprising:

a microcontroller coupled with a memory;

a switch controller coupled with the microcontroller; and

a calibration unit, the calibration unit comprising:

at least two comparators, one or more passive electrical components, and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller;

wherein the microcontroller is configured to send a calibration trigger signal to the encoder logic of the calibration unit, and, in response, the calibration unit is configured to:

using a first one of the at least two comparators, generate a first comparator output for a switching-on operation of the semiconductor switch;

using a second one of the at least two comparators, generate a second comparator output for a switching-off operation of the semiconductor switch;

generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and

send the status signal to the microcontroller;

wherein the one or more comparators and the one or more passive electrical components are electrically coupled with a supply voltage to the semiconductor switch and with an output voltage from the semiconductor switch;

wherein the memory coupled to the microcontroller comprises a digitally stored model comprising one or more control parameters for generating a control signal for the semiconductor switch; and

wherein the microcontroller is configured to receive one or more operating condition parameters, and, using one or more operating condition parameters and the digitally stored model, to generate control parameters for generating the control signal for the semiconductor switch.

2. The system of claim 1 , wherein the switch controller comprises a control logic and a memory operatively coupled together and operatively coupled with the semiconductor switch.

3. The system of claim 1 , wherein the memory coupled to the microcontroller comprises a look-up table comprising one or more model parameters for use by the microcontroller to calculate one or more control parameters for generating a control signal for the semiconductor switch.

4. The system of claim 1 , wherein the microcontroller is further configured to, in response to receiving the status signal, adjust one or more of the one or more control parameters of the digital model stored in the memory coupled to the microcontroller.

5. The system of claim 1 , wherein the microcontroller is configured to generate the calibration trigger signal on a predetermined time interval.

6. The system of claim 1 , wherein the microcontroller is configured to generate the calibration trigger signal after analyzing one of a current value of one or more operating condition parameters and a development of values of one or more operating condition parameters over a period of time.

7. The system of claim 1 , wherein the microcontroller is not configured to generate the calibration trigger signal after each switching operation of the semiconductor switch.

8. The system of claim 1 , wherein the switch controller further comprises a serial peripheral interface (SPI), a gate driver, and a charge pump unit all operatively coupled together and operatively coupled with the semiconductor switch.

9. A pulse width modulated controller system for a semiconductor switch, the system comprising:

a microcontroller coupled with a memory, the memory comprising a look-up table comprising one or more model parameters;

a switch controller coupled with the microcontroller and with a semiconductor switch, the switch controller comprising a control logic;

a calibration unit, the calibration unit comprising:

at least two or more comparators, one or more passive electrical components, and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller;

wherein the microcontroller is configured to send a calibration trigger signal to the encoder logic of the calibration unit, and, in response, the calibration unit is configured to:

using a first one of the two or more comparators, generate a first comparator output for a switching-on operation of the semiconductor switch;

using a second one of the two or more comparators, generate a second comparator output for a switching-off operation of the semiconductor switch;

generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and

send the status signal to the microcontroller;

wherein the one or more comparators and the one or more passive electrical components are electrically coupled with a supply voltage to the semiconductor switch and with a load voltage from the semiconductor switch; and

wherein the microcontroller is configured to receive one or more operating condition parameters, and, using one or more operating condition parameters and the look-up table, to generate control parameters for generating the control signal for the semiconductor switch.

10. The system of claim 9 , wherein the microcontroller is further configured to, in response to receiving the status signal, change one or more of the one or more model parameters comprised in the look-up table stored in the memory coupled to the microcontroller.

11. The system of claim 9 , wherein the microcontroller is configured to generate the calibration trigger signal on a predetermined time interval.

12. The system of claim 9 , wherein the microcontroller is configured to generate the calibration trigger signal after analyzing one of a current value of the one or more operating condition parameters and a development of values of the one or more operating condition parameters over a period of time.

13. The system of claim 9 , wherein the microcontroller is not configured to generate the calibration trigger signal after each switching operation of the semiconductor switch.

14. A method of controlling a semiconductor switch, the method comprising:

storing one or more model parameters in a look-up table comprised in memory coupled with a control logic and with a microcontroller;

receiving one or more operating condition parameters using the microcontroller;

in response to receiving one or more operating condition parameters, retrieving one or more of the one or more model parameters in the look-up table and generating one or more control parameters using the microcontroller and using the one or more operating condition parameters;

generating a control signal for a semiconductor switch using the one or more control parameters and the control logic;

providing a calibration trigger signal to a calibration unit using the microcontroller;

in response to receiving the calibration trigger signal, evaluating a switching-on operation of the semiconductor switch using one or more comparators and one or more passive electrical components comprised in a calibration unit coupled with the microcontroller by generating a switching-on output through comparing a value of an output voltage from the semiconductor switch with a predetermined switching-on voltage;

in response to receiving the calibration trigger signal, evaluating a switching-off operation of the semiconductor switch using the one or more comparators and the one or more passive electrical components comprised in the calibration unit coupled with the microcontroller by generating a switching-off output through comparing a value of the output voltage from the semiconductor switch with a predetermined switching-off voltage;

using an encoder logic comprised in a calibration unit coupled with the microcontroller to generate a status signal using one of the switching-on output, the switching-off output, and both the switching-on output and the switching-off output;

sending the status signal to the microcontroller;

in response to receiving the status signal, evaluating whether the data representing the output voltage in the status signal is outside a predetermined voltage window using the microprocessor; and

if the output voltage is outside the predetermined voltage window, changing one or more of the one or more model parameters comprised in the look-up table comprised in the memory coupled to the microcontroller using the microcontroller in response to receiving the calibration signal.

15. The system of claim 14 , wherein the microcontroller is configured to provide the calibration trigger signal after analyzing one of a current value of the one or more operating condition parameters and a development of values of the one or more operating condition parameters over a period of time.

16. The system of claim 14 , wherein the microcontroller is not configured to provide the calibration trigger signal after each switching operation of the semiconductor switch.