IP Library Granted Patent US 9,913,355
Granted Patent B2
US 9,913,355 · App. 14/804,166 · Granted Mar 6, 2018

Method of forming a sequencing system and structure therefor

Inventors: Frank J. Kolanko (North Smithfield, RI); Sam J. B. W. Vermeir (Hofstade, BE); Brian Blackburn (Rochester, MI); Wim Van de Maele (Bissegem, BE); Benjamin M. Rice (Norwell, MA)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H05B37/036H05B33/0887G01R31/026
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Quick Facts
Patent No.
US 9,913,355
App. No.
14/804,166
Filed
Jul 20, 2015
Granted
Mar 6, 2018
Kind
B2
Art Unit
2858
USPC
324/511
Abstract

In one embodiment, a sequencing system includes a plurality of integrated circuits connected in a daisy chain arrangement, where each integrated circuit has an LED load connection. The system includes a diagnostic circuit which signals to the control unit that an open circuit condition has been detected, thereby turning off all LED loads.

Claims (29)

1. A sequencing lighting system comprising:

at least two integrated circuits, wherein each integrated circuit comprises a control input and a sequence output;

a control unit coupled to a first integrated circuit of the at least two integrated circuits;

an intermediate communication signal coupling the sequence output of the first integrated circuit to the control input of a second integrated circuit of the at least two integrated circuits;

a diagnostic circuit contained within each integrated circuit, wherein the diagnostic circuit detects an open circuit condition and produces an open circuit signal.

2. The sequencing lighting system of claim 1 , wherein each integrated circuit comprises a diagnostic output.

3. The sequencing lighting system of claim 2 , wherein the diagnostic output is electrically coupled to the control unit.

4. The sequencing lighting system of claim 3 , wherein the open circuit signal is sent to the control unit through the diagnostic output when the diagnostic circuit detects an open circuit condition.

5. The sequencing lighting system of claim 1 , wherein the open circuit signal is propagated to the control unit through the diagnostic circuits and intermediate communication signals when an open circuit condition is detected.

6. The sequencing lighting system of claim 1 , comprising an LED load electrically connected to each of the integrated circuits, wherein the LED load is turned off when the open circuit condition is detected.

7. An open circuit detection system comprising:

at least two integrated circuits, wherein each integrated circuit comprises a control input and a sequence output;

a control unit coupled to a first integrated circuit of the at least two integrated circuits;

an intermediate communication signal coupling the sequence output of the first integrated circuit to the control input of a second integrated circuit of the at least two integrated circuits;

a diagnostic circuit contained within each integrated circuit, wherein the diagnostic circuit detects an open circuit condition and produces an open circuit signal.

8. The open circuit detection system of claim 7 , wherein each integrated circuit comprises a diagnostic output.

9. The open circuit detection system of claim 8 , wherein the diagnostic output is electrically coupled to the control unit.

10. The open circuit detection system of claim 9 , wherein the open circuit signal is sent to the control unit through the diagnostic output when the diagnostic circuit detects an open circuit condition.

11. The open circuit detection system of claim 1 , wherein the open circuit signal is propagated to the control unit through the diagnostic circuits and intermediate communication signals when an open circuit condition is detected.

12. A method for forming an open circuit detection system comprising:

providing at least two integrated circuits, wherein each integrated circuit comprises a control input and a sequence output;

providing a control unit coupled to a first integrated circuit of the at least two integrated circuits;

providing an intermediate communication signal coupling the sequence output of the first integrated circuit to the control input of a second integrated circuit of the at least two integrated circuits;

providing a diagnostic circuit contained within each integrated circuit, wherein the diagnostic circuit detects an open circuit condition and produces an open circuit signal.

13. The method for forming an open circuit detection system of claim 12 , wherein each integrated circuit comprises a diagnostic output.

14. The method for forming an open circuit detection system of claim 13 , wherein the diagnostic output is electrically coupled to the control unit.

15. The method for forming an open circuit detection system of claim 14 , wherein the open circuit signal is sent to the control unit through the diagnostic output when the diagnostic circuit detects an open circuit condition.

16. The method for forming an open circuit detection system of claim 12 , wherein the open circuit signal is propagated to the control unit through the diagnostic circuits and intermediate communication signals when an open circuit condition is detected.

17. The method for forming an open circuit detection system of claim 12 , providing an LED load electrically connected to each of the integrated circuits, wherein the LED load is turned off when the open circuit condition is detected.

Assignments (5)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2016
From: BLACKBURN, BRIAN K.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038933/0949 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 13, 2015
From: KOLANKO, FRANK; VERMEIR, SAM; VAN DE MAELE, WIM; RICE, BENJAMIN M.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 036319/0173 →
Continuity (2)
Provisional Application 62031060 · Jul 30, 2014
Related Publication 20160033584A1 · Feb 4, 2016