Manufacturing method of substrate, cutting method of processing object and laser processing apparatus
A manufacturing method of a substrate, the method includes a crack forming process of forming a crack along an interface between a first portion of a processing object and a second portion of the processing object, the crack-forming process forming the crack in a manner that an ultrashort-pulse laser light is irradiated so that a focus point thereof is positioned at the interface or in a vicinity thereof, and a separating process of separating the processing object at the crack, wherein an impurity concentration of the first portion and an impurity concentration of the second portion are different from each other or material of the first portion and material of the second portion are different from each other.
1. A manufacturing method of a substrate, the method comprising:
a crack forming process of forming a crack along an interface between a first portion of a processing object and a second portion of the processing object, the crack-forming process forming the crack in a manner that an ultrashort-pulse laser light is irradiated so that a focus point of the ultrashort-pulse laser light is positioned at the interface or in a vicinity of the interface; and
a separating process of separating the processing object at the crack, wherein
an impurity concentration of the first portion and an impurity concentration of the second portion are different from each other or material of the first portion and material of the second portion are different from each other.
2. The manufacturing method of the substrate according to claim 1 , wherein
the ultrashort-pulse laser light entering the processing object includes a light axis corresponding to a direction intersecting an in-plane direction of the interface and
a locus of a portion at which the ultrashort-pulse laser light is focused is along the interface.
3. The manufacturing method of the substrate according to claim 1 , wherein the irradiation of the ultrashort-pulse laser light is repeated in the crack forming process.
4. The manufacturing method of the substrate according to claim 1 , wherein
the processing object includes a plurality of interfaces formed to be apart from each other in a normal direction of the interfaces and
the ultrashort-pulse laser light is irradiated to each of the plurality of interfaces and the crack is formed along each of the plurality of interfaces in the crack forming process.
5. The manufacturing method of the substrate according to claim 1 , wherein
a cross section of the ultrashort-pulse laser light at the interface corresponds to an oval shape and
a scanning direction of the ultrashort-pulse laser light intersects a long axis of the oval shape.
6. The manufacturing method of the substrate according to claim 1 , wherein the focus point of the ultrashort-pulse laser light is positioned to be displaced from the interface in a normal direction of the interface in the crack forming process.
7. The manufacturing method of the substrate according to claim 1 , wherein the processing object is separated in the separating process in a manner that an external force in a direction along an in-plane direction of the interface is applied to the processing object.
8. A cutting method of a processing object comprising:
a crack forming process of forming a crack along an interface between a first portion of the processing object and a second portion of the processing object, the crack-forming process forming the crack in a manner that an ultrashort-pulse laser light is irradiated so that a focus point of the ultrashort-pulse laser light is positioned at the interface or in a vicinity of the interface; and
a separating process of separating the processing object at the crack, wherein
an impurity concentration of the first portion and an impurity concentration of the second portion are different from each other or material of the first portion and material of the second portion are different from each other.
9. A laser processing apparatus comprising:
a light source emitting an ultrashort-pulse laser light; and
a control portion forming a crack along an interface between a first portion of a processing object and a second portion of the processing object, the control portion forming the crack in a manner that an ultrashort-pulse laser light is irradiated so that a focus point of the ultrashort-pulse laser light is positioned at the interface or in a vicinity of the interface, wherein
an impurity concentration of the first portion and an impurity concentration of the second portion are different from each other or material of the first portion and material of the second portion are different from each other.