Method of manufacturing a semiconductor device
A method for manufacturing a semiconductor device, for example formed utilizing component stacking. As non-limiting examples, various aspects of this disclosure provide a method for reducing warpage and/or stress in stacked semiconductor devices.
1. A method of manufacturing a semiconductor device, the method comprising:
attaching an interposer to a substrate utilizing a first reflow process and a plurality of electrical interconnection structures;
after said attaching an interposer, attaching a semiconductor die to the interposer utilizing a second reflow process;
after said attaching a semiconductor die to the interposer, forming a first underfill between the interposer and the substrate, and forming a second underfill between the semiconductor die and the interposer, wherein the first underfill and the electrical interconnection structures are the only structures directly vertically between the interposer and the substrate; and
after said forming a first underfill and said forming a second underfill, curing the first and second underfills,
wherein:
no underfill lies on the interposer prior to said attaching the semiconductor die to the interposer;
the semiconductor die comprises a plurality of bond pads on a bottom surface the semiconductor die and a plurality of conductive bumps directly attached to the bond pads;
said attaching the semiconductor die to the interposer comprises directly attaching the conductive bumps to the interposer; and
said forming the second underfill comprises surrounding and directly contacting the conductive bumps with the second underfill.
2. The method of claim 1 , wherein said forming a first underfill and said forming a second underfill are performed sequentially in separate respective process steps.
3. The method of claim 2 , wherein said forming a first underfill is performed utilizing a first type of underfill having a first viscosity, and said forming a second underfill is performed utilizing a second type of underfill having a second viscosity different from the first viscosity.
4. The method of claim 1 , wherein the first underfill comprises a first lateral side and a second lateral side opposite the first lateral side, and there is no material other than the first underfill and electrical interconnection structures positioned laterally between the first lateral side and the second lateral side.
5. The method of claim 1 , wherein:
the interposer comprises a top interposer side, a bottom interposer side opposite the top interposer side, and a lateral interposer side that extends between the top interposer side and the bottom interposer side;
the semiconductor die comprises a top die side, a bottom die side opposite the top die side and attached to the top interposer side, and a lateral die side that extends between the top die side and the bottom die side; and
the first underfill contacts the lateral interposer side, and the second underfill contacts the lateral die side.
6. The method of claim 1 , wherein immediately after said attaching an interposer, the interposer is warped a first amount, and immediately after said attaching a semiconductor die, the interposer has less warpage than the first amount.
7. The method of claim 1 , wherein the second underfill directly contacts the semiconductor die.