IP Library Granted Patent US 9,362,212
Granted Patent B1
US 9,362,212 · App. 14/850,958 · Granted Jun 7, 2016

Integrated circuit package having side and bottom contact pads

Inventors: Yanbo Xu (Tianjin, CN); Jianshe Bi (Tianjin, CN); Jinsheng Wang (Tianjin, CN); Zhijie Wang (Tianjin, CN); Fei Zong (Tianjin, CN)
Assignee: FREESCALE SEMICONDUCTOR, INC.
H01L23/4952H01L23/3121H01L23/49537H01L23/49555H01L23/49811H01L23/49838H01L24/10H01L24/42H01L24/45H01L24/85
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Quick Facts
Patent No.
US 9,362,212
App. No.
14/850,958
Granted
Jun 7, 2016
Kind
B1
Abstract

A packaged integrated circuit device includes a substrate module, leads, an IC die having first and second sets of die contact pads, and an encapsulant. The substrate module has upper and lower sets of conductive contacts on its upper and lower surfaces, respectively. The upper set of conductive contacts is electrically connected to the lower set of conductive contacts. The first set of die contact pads is electrically connected to the upper set of conductive contacts. The second set of die contact pads is electrically connected to the leads. Certain embodiments are a multi-form packaged device having both leads and conductive balls supporting different types of external connections, such as BGA and QFN.

Claims (52)

1. A packaged integrated circuit (IC) device, comprising:

a substrate module comprising:

an upper set of conductive contacts on an upper surface of the substrate module; and

a lower set of conductive contacts on a lower surface of the substrate module;

a plurality of leads; and

an IC die comprising a first set of die contact pads and a second set of die contact pads, wherein:

at least one of the upper set of conductive contacts is electrically connected to at least one of the lower set of conductive contacts;

at least one of the first set of die contact pads is electrically connected to at least one of the upper set of conductive contacts; and

at least one of the second set of die contact pads is electrically connected to at least one of the plurality of leads.

2. The IC device of claim 1 , further comprising an encapsulant that covers at least a part of the IC die, at least part of the upper surface of the substrate module, and at least part of the plurality of leads.

3. The IC device of claim 2 , wherein:

the IC device has a top, a bottom, and a plurality of side surfaces;

the lower surface of the substrate module forms at least part of the bottom of the IC device;

the upper surface of the encapsulant forms at least part of the top of the IC device; and

the encapsulant, the substrate module, and exposed conductive surfaces of the plurality of leads form at least part of the side surfaces of the IC device.

4. The IC device of claim 3 , wherein the exposed conductive surfaces of the plurality of leads are flush with the encapsulant at the side surfaces of the IC device.

5. The IC device of claim 3 , wherein the exposed conductive surfaces of the plurality of leads are one of (i) gull-wing leads and (ii) j leads.

6. The IC device of claim 2 , wherein:

one or more of the second set of die contact pads is electrically connected to one or more of the plurality of leads with one or more corresponding bond wires; and

the encapsulant covers the bond wires.

7. The IC device of claim 1 , wherein:

the substrate module comprises a redistribution layer interposed between the upper and lower sets of conductive contacts; and

the redistribution layer connects each contact pad of the upper set of conductive contacts to one or more corresponding contact pads of the lower set of conductive contacts.

8. The IC device of claim 1 , wherein the substrate module includes a set of vias that connect each contact pad of the upper set of conductive contacts to a corresponding contact pad of the lower set of conductive contacts.

9. The IC device of claim 1 , wherein the lower set of conductive contacts comprises one of (i) bond pads for conductive-ball attachment, (ii) pins for a corresponding socket, and (iii) openings for corresponding pins on a corresponding receptacle.

10. The IC device of claim 1 , wherein:

the first set of die contact pads is located on a bottom side of the IC die; and

the IC die has a plurality of through-silicon-vias (TSVs) for connecting components on a top side of the IC die the first set of die contact pads.

11. The IC device of claim 1 , wherein:

the first set of die contact pads is electrically connected to the upper set of conductive contacts using conductive balls; and

the second set of die contact pads is electrically connected to the plurality of leads with bond wires.

12. A method for assembling one or more packaged integrated circuit (IC) devices, the method comprising:

attaching a lead frame array of lead frame modules to a substrate plate comprising an array of substrate modules, wherein:

each lead frame module comprises a plurality of leads;

each lead frame module corresponds to one of the substrate modules;

each substrate module comprises:

an upper set of conductive contacts on an upper surface of the substrate module; and

a lower set of conductive contacts on a lower surface of the substrate module; and

attaching a corresponding IC die to each substrate module, wherein, for each corresponding IC die:

the IC die has a first set of die contact pads and a second set of die contact pads;

at least one of the upper set of conductive contacts is electrically connected to at least one of the lower set of conductive contacts;

at least one of the first set of die contact pads is electrically connected to at least one of the upper set of conductive contacts; and

at least one of the second set of die contact pads is electrically connected to at least one of the plurality of leads.

13. The method of claim 12 , wherein one or more of the first set of die contact pads is electrically connected to one or more of the upper set of conductive contacts using one or more conductive balls.

14. The method of claim 12 , wherein one or more of the second set of die contact pads is electrically connected to one or more of the plurality of leads using one or more bond wires.

15. The method of claim 12 , further comprising encapsulating, for each substrate module and corresponding lead frame module, at least a part of the IC die, at least part of the upper surface of the substrate module, and at least part of the plurality of leads with an encapsulant.

16. The method of claim 15 , further comprising singulation of the encapsulated substrate plate into a plurality of IC devices corresponding to the substrate modules, wherein, for each IC device:

the IC device has a top, a bottom, and a plurality of side surfaces;

the lower surface of the substrate module forms part of the bottom of the IC device;

the upper surface of the encapsulant forms part of the top of the IC device; and

the encapsulant, the substrate module, and exposed conductive surfaces of the plurality of leads form part of the side surfaces of the IC device.

17. The method of claim 12 , further comprising attaching the IC device to a printed circuit board using conductive balls corresponding to the lower set of conductive contacts and conductive connectors corresponding to the plurality of leads.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2024
From: NXP USA, INC.
To: CHIP PACKAGING TECHNOLOGIES, LLC
Reel/Frame 068541/0903 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2015
From: XU, YANBO; BI, JIANSHE; WANG, JINSHENG; WANG, ZHIJIE; ZONG, FEI
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 036537/0544 →
Priority Claims (1)
CN 2015 1 0226315 · Mar 12, 2015 · national