IP Library Granted Patent US 9,460,914
Granted Patent B2
US 9,460,914 · App. 14/856,244 · Granted Oct 4, 2016

Method of manufacturing semiconductor device, substrate processing apparatus, and non-transitory computer-readable recording medium

Inventors: Katsuyoshi Harada (Toyama, JP); Yoshiro Hirose (Toyama, JP); Atsushi Sano (Toyama, JP)
Assignee: Hitachi Kokusai Electric, Inc.
H01L21/02205C23C16/342C23C16/36C23C16/45531C23C16/45542H01J37/32082H01J37/32449H01J37/32779H01L21/02175H01L21/02274
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Quick Facts
Patent No.
US 9,460,914
App. No.
14/856,244
Granted
Oct 4, 2016
Kind
B2
Abstract

A technique includes forming a film having a borazine ring structure and containing boron and nitrogen on a substrate by intermittently performing an act of simultaneously performing: (a) supplying borazine-based gas including a ligand to the substrate; and (b) supplying a ligand desorption gas which desorbs the ligand to the substrate, wherein the (a) and (b) are performed under a condition where the borazine ring structure in the borazine-based gas is held.

Claims (33)

1. A method of manufacturing a semiconductor device, comprising forming a film having a borazine ring structure and containing boron and nitrogen on a substrate by intermittently performing an act of simultaneously performing:

(a) supplying borazine-based gas including a ligand to the substrate; and

(b) supplying a ligand desorption gas which desorbs the ligand to the substrate,

wherein the (a) and (b) are performed under a condition where the borazine ring structure in the borazine-based gas is held.

2. The method according to claim 1 , wherein the forming of the film comprises stopping the supply of at least one selected from a group consisting of the borazine-based gas and the ligand desorption gas.

3. The method according to claim 1 , wherein the forming of the film comprises intermittently supplying one of the borazine-based gas and the ligand desorption gas while the other of the borazine-based gas and the ligand desorption gas is continuously supplied.

4. The method according to claim 1 , wherein the forming of the film comprises intermittently supplying the borazine-based gas while the ligand desorption gas is continuously supplied.

5. The method according to claim 1 , wherein the forming of the film comprises intermittently supplying the ligand desorption gas while the borazine-based gas is continuously supplied.

6. The method according to claim 1 , wherein the forming of the film comprises stopping the supply of the borazine-based gas and the ligand desorption gas.

7. The method according to claim 1 , wherein the forming of the film comprises stopping the supply of the borazine-based gas and the ligand desorption gas, and purging a space where the substrate is present.

8. The method according to claim 1 , wherein, in the forming of the film, the ligand desorption gas is excited to a plasma state and is then supplied to the substrate.

9. The method according to claim 1 , wherein the forming of the film further comprises supplying non-borazine-based boron-containing gas to the substrate.

10. The method according to claim 9 , wherein the forming of the film further comprises intermittently performing an act of simultaneously performing:

(c) supplying the boron-containing gas; and

(d) supplying the ligand desorption gas.

11. The method according to claim 9 , wherein, in the forming of the film, the borazine-based gas and the boron-containing gas are intermittently supplied while the ligand desorption gas is continuously supplied.

12. The method according to claim 9 , wherein the supplying of the boron-containing gas is performed before the supplying of the borazine-based gas.

13. The method according to claim 1 , wherein the ligand comprises an organic ligand.

14. The method according to claim 1 , wherein the ligand desorption gas comprises a nitrogen-containing gas.

15. A substrate processing apparatus comprising:

a process chamber configured to accommodate a substrate;

a borazine-based gas supply system configured to supply borazine-based gas including a ligand to the substrate in the process chamber;

a ligand desorption gas supply system configured to supply ligand desorption gas which desorbs the ligand to the substrate in the process chamber;

a heater configured to heat the substrate in the process chamber;

a pressure regulator configured to regulate a pressure in the process chamber; and

a controller configured to control the borazine-based gas supply system, the ligand desorption gas supply system, the heater, and the pressure regulator so as to form a film having a borazine ring structure and containing boron and nitrogen on the substrate by intermittently performing an act of simultaneously performing:

(a) supplying the borazine-based gas to the substrate in the process chamber; and

(b) supplying the ligand desorption gas to the substrate in the process chamber,

wherein the (a) and (b) are performed under a condition where the borazine ring structure in the borazine-based gas is held.

16. A non-transitory computer-readable recording medium storing a program configured to cause a computer to perform forming a film having a borazine ring structure and containing boron and nitrogen on a substrate by intermittently performing an act of simultaneously performing:

(a) supplying borazine-based gas including a ligand to the substrate; and

(b) supplying a ligand desorption gas which desorbs the ligand to the substrate,

wherein the (a) and (b) are performed under a condition where the borazine ring structure in the borazine-based gas is held.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2018
From: HITACHI KOKUSAI ELECTRIC INC.
To: KOKUSAI ELECTRIC CORPORATION
Reel/Frame 047995/0490 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 7, 2015
From: HARADA, KATSUYOSHI; HIROSE, YOSHIRO; SANO, ATSUSHI
To: HITACHI KOKUSAI ELECTRIC INC.
Reel/Frame 036745/0268 →
Priority Claims (1)
JP 2014-188429 · Sep 17, 2014 · national
Continuity (1)
Related Publication 20160079056A1 · Mar 17, 2016