IP Library Granted Patent US 9,391,079
Granted Patent B2
US 9,391,079 · App. 14/856,943 · Granted Jul 12, 2016

Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making

Inventor: Yuniarto Widjaja (San Jose, CA)
Assignee: Zeno Semiconductor, Inc.
H01L27/10802G11C11/404G11C11/4091G11C11/4099G11C2211/4016
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Quick Facts
Patent No.
US 9,391,079
App. No.
14/856,943
Granted
Jul 12, 2016
Kind
B2
Abstract

An integrated circuit including a link or string of semiconductor memory cells, wherein each memory cell includes a floating body region for storing data. The link or siring includes at least one contact configured to electrically connect the memory cells to at least one control line, and the number of contacts in the string or link is the same as or less than the number of memory cells in the string or link.

Claims (33)

1. An integrated circuit comprising:

a link or string of semiconductor memory cells, wherein each said semiconductor memory cell comprises:

a floating body region for storing charge indicating a state of said semiconductor memory cell; and

a back-bias region;

wherein applying a voltage to said back-bias region results in at least two stable floating body charge levels;

wherein said link or string comprises at least one contact configured to electrically connect said semiconductor memory cells to at least one control line; and

wherein a number of said at least one contact is the same as or less than a number of said semiconductor memory cells in said link or string.

2. The integrated circuit of claim 1 , wherein said number of said at least one contact is less than said number of semiconductor memory cells.

3. The integrated circuit of claim 1 , wherein said semiconductor memory cells are connected in series.

4. The integrated circuit of claim 1 , wherein said semiconductor memory cells are connected in parallel.

5. The integrated circuit of claim 1 , wherein said integrated circuit is fabricated on a bulk silicon substrate.

6. The integrated circuit of claim 1 , wherein said number of said at least one contact is two.

7. The integrated circuit of claim 1 , wherein said semiconductor memory cells further comprise first and second conductive regions interfacing with said floating body region.

8. The integrated circuit of claim 1 , wherein each said semiconductor memory cell further comprises a gate insulated from said floating body region.

9. The integrated circuit of claim 1 , wherein at least one of said semiconductor memory cells is a contactless semiconductor memory cell.

10. The integrated circuit of claim 9 , wherein a majority of said semiconductor memory cells are contactless semiconductor memory cells.

11. An integrated circuit comprising:

a link or string of semiconductor memory cells, wherein each said semiconductor memory cell comprises:

a floating body region for storing charge; and

a back bias region;

wherein applying a voltage to said back-bias region results in at least two stable floating body charge levels;

wherein said link or string comprises at least one contact configured to electrically connect said semiconductor memory cells to at least one control line;

wherein a number of said at least one contact is the same as or less than a number of said semiconductor memory cells in said link or string; and

wherein said at least one control line is connected to a read circuitry.

12. The integrated circuit of claim 11 , wherein said number of said at least one contact is less than said number of said semiconductor memory cells.

13. The integrated circuit of claim 11 , wherein said semiconductor memory cells are connected in series.

14. The integrated circuit of claim 11 , wherein said semiconductor memory cells are connected in parallel.

15. The integrated circuit of claim 11 , wherein said integrated circuit is fabricated on a bulk silicon substrate.

16. The integrated circuit of claim 11 , wherein said number of said at least one contact is two.

17. The integrated circuit of claim 11 , wherein said semiconductor memory cells further comprise first and second conductive regions interfacing with said floating body region.

18. The integrated circuit of claim 11 , wherein each said semiconductor memory cell further comprises a gate insulated from said floating body region.

19. The integrated circuit of claim 11 , wherein at least one of said semiconductor memory cells is a contactless semiconductor memory cell.

20. The integrated circuit of claim 19 , wherein a majority of said semiconductor memory cells are contactless semiconductor memory cells.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2025
From: ZENO SEMICONDUCTOR, INC.
To: EXACTOJOIN LLC
Reel/Frame 073109/0393 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 25, 2021
From: SILICON STORAGE TECHNOLOGY, INC.
To: ZENO SEMICONDUCTOR, INC.
Reel/Frame 056681/0744 →
DECLARATION SUPPORTING CORRECTION OF ERRONEOUSLY FILED REEL/FRAME NO. 037009/0792 Recorded May 10, 2018
From: ZENO SEMICONDUCTOR, INC.
To: ZENO SEMICONDUCTOR, INC.
Reel/Frame 047012/0922 →
INVENTION ASSIGNMENT AGREEMENT Recorded Oct 30, 2015
From: WIDJAJA, YUNIARTO
To: SILICON STORAGE TECHNOLOGY, INC.
Reel/Frame 037009/0792 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2015
From: WIDJAJA, YUNIARTO
To: ZENO SEMICONDUCTOR, INC.
Reel/Frame 036854/0578 →
Continuity (14)
Continuation 14177819 · Feb 11, 2014
Continuation 13941227 · Jul 12, 2013
Continuation 12897528 · Oct 4, 2010
Continuation In Part 12797320 · Jun 9, 2010
Continuation In Part 12797334 · Jun 9, 2010
Continuation In Part 12552903 · Sep 2, 2009
Continuation In Part 12552903 · Sep 2, 2009
Continuation In Part 12533661 · Jul 31, 2009
Continuation In Part 12545623 · Aug 21, 2009
Continuation In Part 14856943
Continuation 14637688 · Mar 4, 2015
Provisional Application 61093726 · Sep 3, 2008
Provisional Application 61094540 · Sep 5, 2008
Related Publication 20160005741A1 · Jan 7, 2016