Microelectronic package debug access ports
A microelectronic package may be fabricated with debug access ports formed either at a side or at a bottom of the microelectronic package. In one embodiment, the debug access ports may be formed within an encapsulation material proximate the microelectronic package side. In another embodiment, the debug access ports may be formed in a microelectronic interposer of the microelectronic package proximate the microelectronic package side. In a further embodiment, the debug access ports may be formed at the microelectronic package bottom and may include a solder contact.
1. A microelectronic package, comprising:
a microelectronic interposer having a first surface, an opposing second surface, and at least one side extending between the first surface and the second surface;
at least one microelectronic device attached to the microelectronic interposer first surface;
an encapsulation material disposed over the at least one microelectronic device and the microelectronic interposer, wherein the encapsulation material includes at least one side which is substantially planar to the at least one microelectronic interposer side and wherein the at least one encapsulation material side and the at least one microelectronic interposer side comprise a microelectronic package side; and
at least one exposed debug access port formed proximate the least one of the microelectronic package side and the microelectronic interposer second surface, wherein the exposed debug access port is electrically connected to the at least one microelectronic device.
2. The microelectronic package of claim 1 , wherein the at least one exposed debug access port is formed at the microelectronic interposer first surface.
3. The microelectronic package of claim 1 , wherein the at least one exposed debug access port comprises at least one exposed debug trace formed within the microelectronic interposer.
4. The microelectronic package of claim 3 , wherein the at least one exposed debug trace comprises a plurality of exposed debug traces in a stacked configuration relative to the microelectronic interposer first surface and the microelectronic interposer second surface.
5. The microelectronic package of claim 3 , wherein the at least one exposed debug access port comprises at least one probe contact on the microelectronic interposer side and electrically connected to the at least one exposed debug trace.
6. The microelectronic package of claim 1 , wherein the at least one exposed debug access port comprises at least one exposed debug trace formed in or on the microelectronic interposer second surface.
7. An electronic system, comprising
a microelectronic substrate; and
a microelectronic package attached to the microelectronic substrate, wherein the microelectronic package comprises:
a microelectronic interposer having a first surface, an opposing second surface, and at least one side extending between the first surface and the second surface;
at least one microelectronic device attached to the microelectronic interposer first surface;
an encapsulation material disposed over the at least one microelectronic device and the microelectronic interposer, wherein the encapsulation material includes at least one side which is substantially planar to the at least one microelectronic interposer side and wherein the at least one encapsulation material side and the at least one microelectronic interposer side comprise a microelectronic package side; and
at least one exposed debug access port formed proximate the least one of the microelectronic package side and the microelectronic interposer second surface, wherein the exposed debug access port is electrically connected to the at least one microelectronic device.
8. The electronic system of claim 7 , wherein the at least one exposed debug access port is formed at the microelectronic interposer first surface.
9. The electronic system of claim 7 , wherein the at least one exposed debug access port comprises at least one exposed debug trace formed within the microelectronic interposer.
10. The electronic system of claim 9 , wherein the at least one exposed debug trace comprises a plurality of exposed debug traces in a stacked configuration relative to the microelectronic interposer first surface and the microelectronic interposer second surface.
11. The electronic system of claim 9 , wherein the at least en one exposed debug access port comprises at least one probe contact proximate the microelectronic interposer side and electrically connected to the at least one debug trace.
12. The electronic system of claim 7 , wherein the at least one exposed debug access port comprises at least one debug trace formed in or on the microelectronic interposer second surface.
13. The microelectronic package of claim 3 , wherein the at least one exposed debug trace extends to and is exposed at the at least one side of the microelectronic interposer.
14. The microelectronic package of claim 6 , wherein the at least one exposed debug trace extends to and is exposed at the at least one side of the microelectronic interposer.
15. The electronic system of claim 9 , wherein the at least one exposed debug trace extends to and is exposed at the at least one side of the microelectronic interposer.
16. The electronic system of claim 12 , wherein the at least one exposed debug trace extends to and is exposed at the at least one side of the microelectronic interposer.