IP Library Granted Patent US 9,443,895
Granted Patent B2
US 9,443,895 · App. 14/861,985 · Granted Sep 13, 2016

Solid-state image pickup apparatus and image pickup system

Inventors: Nobuyuki Endo (Fujisawa, JP); Tetsuya Itano (Sagamihara, JP); Kazuo Yamazaki (Ebina, JP); Kyouhei Watanabe (Yokohama, JP); Takeshi Ichikawa (Hachioji, JP)
Assignee: CANON KABUSHIKI KAISHA
H01L27/14634H01L27/1464H01L27/1469H01L27/14612H01L27/14632H01L27/14636H01L27/14687H01L31/02H04N5/374H04N5/3742
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Quick Facts
Patent No.
US 9,443,895
App. No.
14/861,985
Granted
Sep 13, 2016
Kind
B2
Abstract

An apparatus according to the present invention in which a first substrate including a photoelectric conversion element and a gate electrode of a transistor, and a second substrate including a peripheral circuit portion are placed upon each other. The first substrate does not include a high-melting-metal compound layer, and the second substrate includes a high-melting-metal compound layer.

Claims (38)

1. An apparatus comprising:

a first substrate having a first transistor and a photoelectric conversion element;

a second substrate having a second transistor; and

a wiring structure arranged between the first substrate and the second substrate,

wherein a drain region of the first transistor has a semiconductor region disposed in contact with an insulating film, and a drain region of the second transistor has a metal compound layer.

2. The apparatus according to claim 1 , wherein the metal compound layer is formed of silicide.

3. The apparatus according to claim 1 , wherein the metal compound layer contains cobalt.

4. The apparatus according to claim 1 , wherein the drain region of the first transistor does not have a cobalt silicide layer.

5. The apparatus according to claim 1 , wherein the drain region of the first transistor has a semiconductor region that is connected to a plug.

6. The apparatus according to claim 1 , wherein a gate electrode of the first transistor is arranged between the insulating film and the first substrate.

7. The apparatus according to claim 1 , wherein the wiring structure has a wiring layer arranged between the first substrate and the second substrate, and the wiring layer includes a wire connected to the first transistor.

8. The apparatus according to claim 1 , wherein the wiring structure has a wiring layer arranged between the first substrate and the second substrate, and the wiring layer includes a wire connected to the drain region of the second transistor.

9. The apparatus according to claim 1 , wherein the insulating film is an interlayer insulating film of the wiring structure.

10. The apparatus according to claim 1 , wherein the insulating film is formed of silicon oxide.

11. The apparatus according to claim 1 , wherein a first film which is an interlayer insulating film of the wiring structure and a second film formed of silicon nitride or silicon carbide are arranged between the first substrate and the second substrate.

12. The apparatus according to claim 11 , wherein the wiring structure has a wiring layer including a wire connected to the first transistor, and the second film is arranged between the second substrate and the wiring layer.

13. The apparatus according to claim 11 , wherein the second film is arranged between the first film and the second substrate.

14. The apparatus according to claim 11 , wherein the wiring structure has a wiring layer including a wire whose main component is copper, and the second film contacts the wire.

15. The apparatus according to claim 1 wherein a source of the first transistor is connected to the photoelectric conversion element.

16. The apparatus according to claim 1 wherein the first substrate has a third transistor included in a source follower circuit.

17. The apparatus according to claim 1 , wherein the second substrate has an amplification transistor.

18. The apparatus according to claim 1 , wherein an AD converter is provided in the apparatus.

19. A system comprising:

an apparatus; and

a lens which forms an optical image on the apparatus,

wherein the apparatus comprising:

a first substrate having a first transistor and a photoelectric conversion element;

a second substrate having a second transistor; and

a wiring structure arranged between the first substrate and the second substrate,

wherein a drain region of the first transistor has a semiconductor region disposed in contact with an insulating film, and a drain region of the second transistor has a metal compound layer.

20. A system comprising:

an apparatus; and

a signal processing section that processes a signal output from the apparatus,

wherein the apparatus comprising:

a first substrate having a first transistor and a photoelectric conversion element;

a second substrate having a second transistor; and

a wiring structure arranged between the first substrate and the second substrate,

wherein a drain region of the first transistor has a semiconductor region disposed in contact with an insulating film, and a drain region of the second transistor has a metal compound layer.

Priority Claims (1)
WO PCT/JP2009/071703 · Dec 26, 2009 · international
Continuity (3)
Continuation 13898264 · May 20, 2013
Continuation 12975088 · Dec 21, 2010
Related Publication 20160013236A1 · Jan 14, 2016