IP Library Granted Patent US 9,841,678
Granted Patent B2
US 9,841,678 · App. 15/025,796 · Granted Dec 12, 2017

Photosensitive resin composition, photosensitive element, semiconductor device and method for forming resist pattern

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Quick Facts
Patent No.
US 9,841,678
App. No.
15/025,796
Granted
Dec 12, 2017
Kind
B2
Abstract

A photosensitive resin composition comprises: a component (A): a resin having a phenolic hydroxyl group; a component (B): a compound having a methylol group or an alkoxyalkyl group; a component (C): an aliphatic compound having two or more functional groups, the functional groups being one or more types selected from an acryloyloxy group, a methacryloyloxy group, a glycidyloxy group and a hydroxyl group; and a component (D): a photosensitive acid generator.

Claims (34)

1. A photosensitive resin composition comprising:

a component (A): a resin having a phenolic hydroxyl group, the component (A) comprising a novolac resin;

a component (B): a compound having a methylol group or an alkoxyalkyl group;

a component (C): an aliphatic compound having two or more functional groups, the functional groups being one or more groups selected from an acryloyloxy group, a methacryloyloxy group, a glycidyloxy group and a hydroxyl group; and

a component (D): a photosensitive acid generator, the component (D) comprising at least one compound selected from the group consisting of an onium salt compound, a halogen-containing compound, a sulfone compound, a sulfonimide compound, and a diazomethane compound.

2. The photosensitive resin composition according to claim 1 , wherein the component (B) comprises a compound having at least one selected from the group consisting of an aromatic ring, a heterocycle and an alicycle, and having a methylol group or an alkoxyalkyl group.

3. The photosensitive resin composition according to claim 1 , wherein the content of the component (C) is 20 to 70 parts by mass relative to 100 parts by mass of the component (A).

4. The photosensitive resin composition according to claim 1 , wherein the component (C) has three or more of the functional groups.

5. A photosensitive element comprising a supporting material and a photosensitive layer formed on the supporting material,

wherein the photosensitive layer comprises the photosensitive resin composition according to claim 1 .

6. A cured product of the photosensitive resin composition according to claim 1 .

7. A semiconductor device comprising the cured product of the photosensitive resin composition according to claim 6 as a surface protective film or an interlayer insulating film.

8. A method for forming a resist pattern, comprising:

a step of applying the photosensitive resin composition according to claim 1 onto a substrate and drying the applied photosensitive resin composition so as to form a photosensitive layer;

a step of exposing the photosensitive layer to an active ray in order to form a predetermined pattern and performing a heat-treatment after exposure; and

a step of developing the photosensitive layer after the heat-treatment and heat-treating the obtained resin pattern.

9. A method for forming a resist pattern, comprising:

a step of forming the photosensitive layer of the photosensitive element according to claim 5 on a substrate;

a step of exposing the photosensitive layer to an active ray in order to form a predetermined pattern and performing a heat-treatment after the exposure; and

a step of developing the photosensitive layer after the heat-treatment and heat-treating the obtained resin pattern.

10. The photosensitive resin composition according to claim 2 , wherein the content of the component (C) is 20 to 70 parts by mass relative to 100 parts by mass of the component (A).

11. The photosensitive resin composition according to claim 2 , wherein the component (C) has three or more of the functional groups.

12. The photosensitive resin composition according to claim 3 , wherein the component (C) has three or more of the functional groups.

13. A photosensitive element comprising a supporting material and a photosensitive layer formed on the supporting material,

wherein the photosensitive layer comprises the photosensitive resin composition according to claim 2 .

14. A photosensitive element comprising a supporting material and a photosensitive layer formed on the supporting material,

wherein the photosensitive layer comprises the photosensitive resin composition according to claim 3 .

15. A photosensitive element comprising a supporting material and a photosensitive layer formed on the supporting material,

wherein the photosensitive layer comprises the photosensitive resin composition according to claim 4 .

16. A cured product of the photosensitive resin composition according to claim 2 .

17. A cured product of the photosensitive resin composition according to claim 3 .

18. A cured product of the photosensitive resin composition according to claim 4 .

19. A semiconductor device comprising the cured product of the photosensitive resin composition according to claim 17 as a surface protective film or an interlayer insulating film.

20. A semiconductor device comprising the cured product of the photosensitive resin composition according to claim 18 as a surface protective film or an interlayer insulating film.

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
CHANGE OF NAME Recorded Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2016
From: IWASHITA, KENICHI; KATO, TETSUYA; EBIHARA, MASAHIKO
To: HITACHI CHEMICAL COMPANY, LTD
Reel/Frame 038455/0121 →