IP Library Granted Patent US 9,979,388
Granted Patent B2
US 9,979,388 · App. 15/033,869 · Granted May 22, 2018

Adjustable losses of bond wire arrangement

Inventor: Youri Volokhine (Stevensbeek, NL)
Assignee: NXP USA, INC.
H03K17/689H01L23/66H01L24/09H01L24/49H03F3/193H03F3/213H01L24/05H01L24/45H01L24/48H01L2223/6611H01L2223/6655H01L2224/04042H01L2224/05554H01L2224/05599H01L2224/09505H01L2224/45124H01L2224/48091H01L2224/48137H01L2224/48472H01L2224/49052H01L2224/49096H01L2224/49175H01L2224/85399H01L2924/00014H01L2924/13091H01L2924/3011H01L2924/30107H01L2924/30111H03F2200/451
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Quick Facts
Patent No.
US 9,979,388
App. No.
15/033,869
Granted
May 22, 2018
Kind
B2
Abstract

The invention provides a bond wire arrangement comprising a signal bond wire ( 1 ) for operably connecting a first electronic device ( 6 ) to a second electronic device ( 8 ), and a control bond wire ( 2 ) being arranged alongside the signal bond wire at a distance so as to have a magnetic coupling with the signal bond wire ( 1 ), and having a first end ( 11 ) coupled to ground, and a second end ( 12 ) coupled to ground via a resistive element ( 14 ). The proposed solution allows the control of the Q factor (losses) of wire bond inductors during assembly phase, which will save time and reduce overall design cycle as compared to known methods.

Claims (23)

1. A bond wire arrangement comprising:

a signal bond wire for operably connecting a first device to a second device; and

a first control bond wire being arranged alongside said signal bond wire at a distance so as to have a magnetic coupling with said signal bond wire, and having a first end coupled to ground, and a second end coupled to ground via a resistive element, wherein the first control bond wire and the signal bond wire have different shapes, the different shapes selected to result in a coupling factor between the signal bond wire and the control bond wire that reduces a quality factor (Qeq).

2. A bond wire arrangement according to claim 1 , said resistive element having a resistance between 0.2 Ohm and 5 Ohm.

3. A bond wire arrangement according to claim 1 , wherein the resistive element comprises a resistor.

4. A bond wire arrangement according to claim 1 , wherein the first control bond wire is coupled to a metal bonding pad at the second end, and wherein the resistive element comprises a semiconductor layer formed under the metal bonding pad.

5. A bond wire arrangement according to claim 1 , wherein a coupling factor between said signal bond wire and said first control bond wire is between 0.1-0.7.

6. A bond wire arrangement according to claim 1 , wherein the distance between said signal bond wire and said first control bond wire is less than 200 microns.

7. A bond wire arrangement according to claim 1 , wherein said bond wire arrangement comprises a capacitor arranged in series with said resistive element.

8. A bond wire arrangement according to claim 1 , wherein a second control bond wire is arranged alongside said signal bond wire at a second distance so as to have a magnetic coupling with said signal bond wire, said second control bond wire being arranged at a side of the signal bond wire opposite from a side where said first control bond wire is arranged.

9. A bond wire arrangement according to claim 1 , wherein the different shapes comprise the signal bond wire and the first control bond wire having different heights.

10. A power amplifier circuit comprising:

a radio frequency (RF) match network that includes a bypass network with a bond wire arrangement, wherein the bond wire arrangement includes

a signal bond wire for operably connecting a first device to a second electronic device, and

a control bond wire being arranged alongside said signal bond wire at a distance so as to have a magnetic coupling with said signal bond wire, and having a first end coupled to ground, and a second end coupled to ground via a resistive element, wherein the signal bond wire has a first end physically connected to a first signal bonding pad and has a second end physically connected to a second signal bonding pad, and wherein the control bond wire first end is physically connected to a first control bonding pad and wherein the control bond wire second end is physically connected to a second control bonding pad, and wherein the resistive element comprises a semiconductor layer formed under the second control bonding pad.

11. A power amplifier circuit according to claim 10 , wherein the bypass network further comprises a bypass inductor arranged in series with a decoupling capacitor, said bypass inductor being embodied by the signal bond wire of the bond wire arrangement.

12. A power amplifier circuit according to claim 10 , wherein the RF match network comprises a shunt inductor and a DC blocking capacitor arranged in series with said shunt inductor so as to connect an output lead of the power amplifier circuit and ground.

13. A power amplifier circuit according to claim 10 wherein the first control bond wire and the signal bond wire have different shapes, the different shapes selected to result in a coupling factor of 0.1 to 0.7 between the signal bond wire and the control bond wire.

14. A RF circuit comprising:

a wire bond arrangement that includes

a signal bond wire for operably connecting a first device to a second device, the signal bond wire having a first end physically connected to a first signal bonding pad and having a second end physically connected to a second signal bonding pad, and

a control bond wire being arranged alongside said signal bond wire at a distance so as to have a magnetic coupling with said signal bond wire, and having a first end physically connected to a first control bonding pad that is coupled to ground, and a second end and physically connected to a second control bonding pad that is coupled to ground via a resistive element, wherein the control bond wire and the signal bond wire have different shapes, the different shapes selected to result in a coupling factor of 0.1 to 0.7 between the signal bond wire and the control bond wire, the coupling factor selected to reduce a quality factor (Qeq).

15. A RF circuit according to claim 14 , wherein said wire bond arrangement is arranged in a final stage of said RF circuit.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 22, 2018
From: VOLOKHINE, YOURI
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 044690/0735 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
Continuity (1)
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